Mitarbeiter

Prof. Dr.-Ing. Jürgen Beyerer

  • Karlsruher Institut für Technologie – KIT
    Institut für Anthropomatik und Robotik (IAR)
    Lehrstuhl für Interaktive Echtzeitsysteme (IES)
    Prof. Dr.- Ing. Jürgen Beyerer
    Vincenz-Prießnitz-Straße 3
    76131 Karlsruhe

Lebenslauf

Prof. Dr.-Ing. Jürgen Beyerer ist Inhaber des 2004 eingerichteten Lehrstuhls für Interaktive Echtzeitsysteme an der Fakultät für Informatik. Gleichzeitig ist er Leiter des Fraunhofer-Instituts für Optronik, Systemtechnik und Bildauswertung (IOSB)  in Karlsruhe (bis 2009: Fraunhofer IITB).

Prof. Beyerer studierte von 1984 bis 1989 Elektrotechnik an der Universität Karlsruhe und promovierte 1994 am Institut für Mess- und Regelungstechnik (MRT)  bei Prof. Franz Mesch mit einer Arbeit zur Texturanalyse, die 1995 mit dem Messtechnikpreis des AHMT (Arbeitskreis der Hochschullehrer für Messtechnik e.V.)  ausgezeichnet wurde. Anschließend baute er eine Forschungsgruppe zum Thema Automatische Sichtprüfung und Bildverarbeitung am gleichen Institut auf. 1999 habilitierte er sich für das Fach Messtechnik mit einer Arbeit zum Thema der Nutzung von Vorwissen in der Messtechnik. Von 1999 bis 2004 leitete er das Mannheimer Mittelstands-Unternehmen Hottinger Systems GmbH (heute: inspectomation GmbH ) und war stellvertretender Geschäftsführer des Schwesterunternehmens Hottinger Maschinenbau GmbH.

Lehrstuhl und Fraunhofer IOSB arbeiten inhaltlich eng zusammen. Damit lassen sich Synergieeffekte, die in der eher grundlagenorientierten Herangehensweise am Lehrstuhl und der anwendungsorientierten Ausrichtung des IOSB liegen, optimal erschließen. Daneben fördert eine enge Kooperation die Gewinnung erstklassiger Nachwuchswissenschaftler für das Fraunhofer IOSB.

Vorlesungen

Automatische Sichtprüfung und Bildverarbeitung
Mustererkennung

 

Publikationsliste 1499


Knowledge-Distillation-Based Label Smoothing for Fine-Grained Open-Set Vehicle Recognition
Wolf, S.; Loran, D.; Beyerer, J.
2024. 2024 IEEE/CVF Winter Conference on Applications of Computer Vision Workshops (WACVW), 330–340, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW60836.2024.00041
The role of an ontology-based knowledge backbone in a circular factory
Hofmann, C.; Staab, S.; Selzer, M.; Neumann, G.; Furmans, K.; Heizmann, M.; Beyerer, J.; Lanza, G.; Pfrommer, J.; Düser, T.; Klein, J.-F.
2024. at - Automatisierungstechnik, 72 (9), 875–883. doi:10.1515/auto-2024-0006
Synset Boulevard: A Synthetic Image Dataset for VMMR *
Sielemann, A.; Wolf, S.; Roschani, M.; Ziehn, J.; Beyerer, J.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), Yokohama, 13th-17th May 2024, 9146 – 9153, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10610650
Poison-Aware Open-Set Fungi Classification: Reducing the Risk of Poisonous Confusion
Wolf, S.; Thelen, P.; Beyerer, J.
2024. CLEF 2024 - CLEF 2024 Working Notes : Working Notes of the Conference and Labs of the Evaluation Forum (CLEF 2024) Grenoble, France, 9-12 September, 2024. Ed. : G. Faggioli, N. Ferro, P. Galuščáková, A. García Seco de Herrera, 2260 – 2266, CEUR-WS
Managing uncertainty in product and process design for the circular factory
Heizmann, M.; Beyerer, J.; Dietrich, S.; Hoffmann, L.; Kaiser, J.-P.; Lanza, G.; Roitberg, A.; Stiefelhagen, R.; Stricker, N.; Wexel, H.; Zanger, F.
2024. at - Automatisierungstechnik, 72 (9), 829–843. doi:10.1515/auto-2024-0009
SynthAct: Towards Generalizable Human Action Recognition based on Synthetic Data
Schneider, D.; Keller, M.; Zhong, Z.; Peng, K.; Roitberg, A.; Beyerer, J.; Stiefelhagen, R.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), 13038–13045, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10611486
RIXA - Explaining Artificial Intelligence in Natural Language
Becker, M.; Vishwesh, V.; Birnstill, P.; Schwall, F.; Wu, S.; Beyerer, J.
2024. 2023 IEEE International Conference on Data Mining Workshops (ICDMW), Shanghai, 1st-4th December 2023, 875–884, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00118
Explainable Artificial Intelligence for Interpretable Data Minimization
Becker, M.; Toprak, E.; Beyerer, J.
2023. 23rd IEEE International Conference on Data Mining Workshops : 1-4 December 2023, Shanghai, China : proceedings. Ed.: J. Wang, 885–893, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00119
Efficiently Modeling Lateral Vehicle Movement Including Its Temporal Interrelations Using a Two-Level Stochastic Model
Neis, N.; Beyerer, J.
2024. IEEE Open Journal of Intelligent Transportation Systems, 5, 566–580. doi:10.1109/OJITS.2024.3435078
DDS Security+: Enhancing the Data Distribution Service With TPM-based Remote Attestation
Wagner, P. G.; Birnstill, P.; Beyerer, J.
2024. Proceedings of the 19th International Conference on Availability, Reliability and Security, Art.-Nr.: 159, Association for Computing Machinery (ACM). doi:10.1145/3664476.3670442
Understanding, describing, and mitigating the flow of personal data in ROS 2 systems to comply with the GDPR and beyond
Zander, T.; Wohnig, J.; Beyerer, J.
2024. 2024 IEEE International Conference on Advanced Robotics and Its Social Impacts (ARSO), 146 – 152, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ARSO60199.2024.10557807
Sensitivity Analysis and Extended Evaluation of the Two-Level Stochastic Model for the Lateral Movement of Vehicles within their Lane
Neis, N.; Beyerer, J.
2024. 2024 10th International Conference on Automation, Robotics and Applications (ICARA), 472 – 478, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICARA60736.2024.10553024
6D Pose Estimation on Point Cloud Data through Prior Knowledge Integration: A Case Study in Autonomous Disassembly
Wu, C.; Fu, H.; Kaiser, J.-P.; Barczak, E. T.; Pfrommer, J.; Lanza, G.; Heizmann, M.; Beyerer, J.
2024. Procedia CIRP, 122, 193 – 198. doi:10.1016/j.procir.2024.01.028
Attention-based Part Assembly for 3D Volumetric Shape Modeling
Wu, C.; Zheng, J.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Vancouver, 17th-24th June 2023, 2717–2726, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW59228.2023.00272
Attention-Based Point Cloud Edge Sampling
Wu, C.; Zheng, J.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, 17th - 24th June 2023, 5333–5343, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPR52729.2023.00516
UPAR Challenge 2024: Pedestrian Attribute Recognition and Attribute-Based Person Retrieval - Dataset, Design, and Results
Cormier, M.; Specker, A.; Jacques, J. C. S. Junior; Moritz, L.; Metzler, J.; Moeslund, T. B.; Nasrollahi, K.; Escalera, S.; Beyerer, J.
2024. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 359–367, Institute of Electrical and Electronics Engineers (IEEE)
Security Fence Inspection at Airports Using Object Detection
Friederich, N.; Specker, A.; Beyerer, J.
2024. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 310–319, Institute of Electrical and Electronics Engineers (IEEE)
ReidTrack: Reid-only Multi-target Multi-camera Tracking
Specker, A.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 5442–5452, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW59228.2023.00575
GridSort: Image-based Optical Bulk Material Sorting Using Convolutional LSTMs
Reith-Braun, M.; Bauer, A.; Staab, M.; Pfaff, F.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.; Kruggel-Emden, H.; Hanebeck, U. D.
2023. IFAC-PapersOnLine, 56 (2), 4620 – 4626. doi:10.1016/j.ifacol.2023.10.971
SynMotor: A Benchmark Suite for Object Attribute Regression and Multi-Task Learning
Wu, C.; Qiu, L.; Zhou, K.; Pfrommer, J.; Beyerer, J.
2023. Proceedings of the 18th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2023) - Volume 4, Lissabon, 19th-21st February 2023, 529 – 540, SciTePress. doi:10.5220/0011718400003417
RIXA - Explaining Artificial Intelligence in Natural Language
Becker, M.; Schwall, F.; Vishwesh, V.; Wu, S.; Birnstill, P.; Beyerer, J.
2023. doi:10.5445/IR/1000167428
Explainable Artificial Intelligence for Interpretable Data Minimization
Becker, M.; Toprak, E.; Beyerer, J.
2023. doi:10.5445/IR/1000167427
Self-Supervised Generative-Contrastive Learning of Multi-Modal Euclidean Input for 3D Shape Latent Representations: A Dynamic Switching Approach
Wu, C.; Pfrommer, J.; Zhou, M.; Beyerer, J.
2024. IEEE Transactions on Multimedia, 26, 8432–8441. doi:10.1109/TMM.2023.3338079
Security Fence Inspection at Airports Using Object Detection
Friederich, N.; Specker, A.; Beyerer, J.
2023. arxiv. doi:10.48550/arXiv.2311.12064
Optimizing Fine-Grained Fungi Classification for Diverse Application-Oriented Open-Set Metrics
Wolf, S.; Beyerer, J.
2023. Working Notes of the Conference and Labs of the Evaluation Forum (CLEF 2023), 2159 – 2167, CEUR-WS
Towards Self-learning Industrial Process Behaviour from Payload Bytes for Anomaly Detection
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA), Sinaia, Romania, 12-15 September 2023, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETFA54631.2023.10275358
Principles of Forgetting in Domain-Incremental Semantic Segmentation in Adverse Weather Conditions
Kalb, T. M.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, Kanada, 18-22 June 2023, 19508 – 19518, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPR52729.2023.01869
Cybersecurity for industrial automation and control systems
Haas, C.; Bretthauer, G.; Beyerer, J.
2023. at - Automatisierungstechnik, 71 (9), 723–725. doi:10.1515/auto-2023-0141
Evaluation of an Automated Mapping from ICD-10 to SNOMED CT
Philipp, P.; Veloso, J.; Appenzeller, A.; Hartz, T.; Beyerer, J.
2022. 2022 International Conference on Computational Science and Computational Intelligence (CSCI), 1604 – 1609, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI58124.2022.00287
Counterfactual Root Cause Analysis via Anomaly Detection and Causal Graphs
Rehak, J.; Sommer, A.; Becker, M.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), Lemgo, Germany, 17-20 July 2023, 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/INDIN51400.2023.10218245
Past Information Aggregation for Multi-Person Tracking
Stadler, D.; Beyerer, J.
2023. 2023 IEEE International Conference on Image Processing (ICIP), Kuala Lumpur, Malaysia, 08-11 October 2023, 321–325, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP49359.2023.10223159
Addressing Bias in Fine-Grained Classification Datasets: A Strategy for Reliable Evaluation
Wolf, S.; Koch, J.; Sommer, L.; Beyerer, J.
2023. 2023 IEEE 13th International Conference on Pattern Recognition Systems (ICPRS), 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPRS58416.2023.10179055
Balanced Pedestrian Attribute Recognition for Improved Attribute-based Person Retrieval
Specker, A.; Beyerer, J.
2023. 2023 IEEE 13th International Conference on Pattern Recognition Systems (ICPRS), 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPRS58416.2023.10178990
Usability for Data Sovereignty - Evaluation of Privacy Risk Quantification Interfaces
Appenzeller, A.; Balduf, F.; Beyerer, J.
2023. Proceedings of the 16th International Conference on PErvasive Technologies Related to Assistive Environments, 206–214, Association for Computing Machinery (ACM). doi:10.1145/3594806.3594816
BYTEv2: Associating More Detection Boxes Under Occlusion for Improved Multi-person Tracking
Stadler, D.; Beyerer, J.
2023. Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges. Part I. Ed.: J.-J. Rousseau, 79–94, Springer. doi:10.1007/978-3-031-37660-3_6
POET: A Self-learning Framework for PROFINET Industrial Operations Behaviour
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. doi:10.48550/arXiv.2305.03175
POET: A Self-learning Framework for PROFINET Industrial Operations Behaviour
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. Tools for Design, Implementation and Verification of Emerging Information Technologies – 17th EAI International Conference, TridentCom 2022, Melbourne, Australia, November 23-25, 2022, Proceedings. Ed.: S. Yu, 3 – 19, Springer Nature Switzerland. doi:10.1007/978-3-031-33458-0_1
Simulation study and experimental validation of a neural network-based predictive tracking system for sensor-based sorting
Maier, G.; Reith-Braun, M.; Bauer, A.; Gruna, R.; Pfaff, F.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Beyerer, J.
2023. tm - Technisches Messen, 90 (7-8), 489–499. doi:10.1515/teme-2023-0033
An Improved Association Pipeline for Multi-Person Tracking
Stadler, D.; Beyerer, J.
2023. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops
Applying Differential Privacy to Medical Questionnaires
Appenzeller, A.; Terzer, N.; Philipp, P.; Beyerer, J.
2023. 2023 IEEE International Conference on Pervasive Computing and Communications Workshops and other Affiliated Events (PerCom Workshops), 608–613, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/PerComWorkshops56833.2023.10150373
Finding optimal decision boundaries for human intervention in one-class machine-learning models for industrial inspection
Zander, T.; Pan, Z.; Birnstill, P.; Beyerer, J.
2023. tm - Technisches Messen, 90 (7-8), 478–488. doi:10.1515/teme-2023-0010
Regression-based Age Prediction of Plastic Waste using Hyperspectral Imaging
Kronenwett, F.; Klingenberg, P.; Maier, G.; Längle, T.; Metzsch-Zilligen, E.; Beyerer, J.
2023. OCM 2023 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; T. Längle; M. Heizmann, 51 – 63, KIT Scientific Publishing
Detecting Tar Contaminated Samples in Road-rubble using Hyperspectral Imaging and Texture Analysis
Bäcker, P.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.
2023. OCM 2023 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; T. Längle; M. Heizmann, 11 – 21, KIT Scientific Publishing
Sensitivity enhanced glucose sensing by return-path Mueller matrix ellipsometry
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2023. OCM 2023, Optical Characterization of Materials. Conference Proceedings, 119 – 128, KIT Scientific Publishing
Cooperative automated driving for bottleneck scenarios in mixed traffic
Ziehn, J. R.; Baumann, M. V.; Beyerer, J.; Buck, H. S.; Deml, B.; Ehrhardt, S.; Frese, C.; Kleiser, D.; Lauer, M.; Roschani, M.; Ruf, M.; Stiller, C.; Vortisch, P.
2023. 35th IEEE Intelligent Vehicles Symposium (IV 2023), Anchorage, AK, USA, June 4-7, 2023
Causes of Catastrophic Forgetting in Class-Incremental Semantic Segmentation
Kalb, T. M.; Beyerer, J.
2022. doi:10.48550/arXiv.2209.08010
Causes of Catastrophic Forgetting in Class-Incremental Semantic Segmentation
Kalb, T. M.; Beyerer, J.
2023. Computer Vision – ACCV 2022 – 16th Asian Conference on Computer Vision, Macao, China, December 4–8, 2022, Proceedings, Part VII. Ed.: L. Wang, 361–377, Springer Nature Switzerland. doi:10.1007/978-3-031-26293-7_22
UPAR: Unified Pedestrian Attribute Recognition and Person Retrieval
Specker, A.; Cormier, M.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), Waikoloa, HI, USA, 02-07 January 2023, 981–990, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/wacv56688.2023.00104
Sim2real Transfer Learning for Point Cloud Segmentation: An Industrial Application Case on Autonomous Disassembly
Wu, C.; Bi, X.; Pfrommer, J.; Cebulla, A.; Mangold, S.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 4520–4529, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV56688.2023.00451
Anticipative Feature Fusion Transformer for Multi-Modal Action Anticipation
Zhong, Z.; Schneider, D.; Voit, M.; Stiefelhagen, R.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 6057–6066, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV56688.2023.00601
UPAR Challenge: Pedestrian Attribute Recognition and Attribute-based Person Retrieval - Dataset, Design, and Results
Cormier, M.; Specker, A.; Jacques, J. C. S. Junior; Florin, L.; Metzler, J.; Moeslund, T. B.; Nasrollahi, K.; Escalera, S.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision Workshops (WACVW). IEEE Winter Conference on Applications of Computer Vision Workshops (WACVW 2023) Waikoloa, HI, USA, 03.01.2023–07.01.2023, 166–175, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW58289.2023.00022
A Transformer-based Late-Fusion Mechanism for Fine-Grained Object Recognition in Videos
Koch, J.; Wolf, S.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision Workshops (WACVW). IEEE Winter Conference on Applications of Computer Vision Workshops (WACVW 2023) Waikoloa, HI, USA, 03.01.2023–07.01.2023, 100–109, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW58289.2023.00015
Retroreflex ellipsometry for isotropic three-phase systems with nonplanar surfaces
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2023. Thin Solid Films, 769, Art.-Nr.: 139732. doi:10.1016/j.tsf.2023.139732
Robotic systems for decontamination in hazardous environments : To boldly go where many still work today
Petereit, J.; Bretthauer, G.; Beyerer, J.
2022. at - Automatisierungstechnik, 70 (10), 823–825. doi:10.1515/auto-2022-0121
Secure Provisioning of OPC UA Applications Using the Asset Administration Shell
Meier, D.; Vogl, J.; Kohnhäuser, F.; Beyerer, J.
2023. 2022 IEEE 17th Conference on Industrial Electronics and Applications (ICIEA), 144–149, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIEA54703.2022.10005899
Machine learning based multiobject tracking for sensor based sorting
Maier, G.; Reith-Braun, M.; Bauer, A.; Gruna, R.; Pfaff, F.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Beyerer, J.
2022. Forum Bildverarbeitung 2022. Ed.: T. Längle, 115–126, KIT Scientific Publishing
Optimal human labelling for anomaly detection in industrial inspection
Zander, T.; Ziyan, P.; Birnstill, P.; Beyerer, J.
2022. Forum Bildverarbeitung 2022. Ed.: T. Längle, 49–59, KIT Scientific Publishing
Anticipative Feature Fusion Transformer for Multi-Modal Action Anticipation
Zhong, Z.; Schneider, D.; Voit, M.; Stiefelhagen, R.; Beyerer, J.
2023. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 6068–6077, Institute of Electrical and Electronics Engineers (IEEE)
Problem-Specific Optimized Multispectral Sensing for Improved Quantification of Plant Biochemical Constituents
Schumacher, P.; Gruna, R.; Langle, T.; Beyerer, J.
2022. 2022 12th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS), 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WHISPERS56178.2022.9955113
Privacy and Utility of Private Synthetic Data for Medical Data Analyses
Appenzeller, A.; Leitner, M.; Philipp, P.; Krempel, E.; Beyerer, J.
2022. Applied Sciences, 12 (23), Article no: 12320. doi:10.3390/app122312320
ROBDEKON - competence center for decontamination robotics [ROBDEKON - Kompetenzzentrum für Dekontaminationsrobotik]
Woock, P.; Petereit, J.; Frey, C.; Beyerer, J.
2022. at - Automatisierungstechnik, 70 (10), 827–837. doi:10.1515/auto-2022-0072
Toward Accurate Online Multi-target Multi-camera Tracking in Real-time
Specker, A.; Beyerer, J.
2022. 30th European Signal Processing Conference (EUSIPCO), 533–537
For the Sake of Privacy: Skeleton-Based Salient Behavior Recognition
Golda, T.; Thiemich, J.; Cormier, M.; Beyerer, J.
2022. 29th IEEE International Conference on Image Processing (ICIP), 16th -19th October, Bordeaux, France, 3983–3987, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP46576.2022.9897358
Few-Shot Supervised Prototype Alignment for Pedestrian Detection on Fisheye Images
Wiedemer, T.; Wolf, S.; Schumann, A.; Ma, K.; Beyerer, J.
2022. Proceedings 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW): New Orleans, Louisiana, 19–24 June 2022, 4141–4152, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW56347.2022.00459
Transformer-based Fine-Grained Fungi Classification in an Open-Set Scenario
Wolf, S.; Beyerer, J.
2022. CLEF 2022 Working Notes: Proceedings of the Working Notes of CLEF 2022 - Conference and Labs of the Evaluation Forum ; Bologna, Italy, September 5th to 8th, 2022. Ed.: G. Faggioli, 2219–2226, CEUR-WS.org
An Evaluation Of Design Choices For Pedestrian Attribute Recognition In Video
Specker, A.; Schumann, A.; Beyerer, J.
2020. 2020 IEEE International Conference on Image Processing (ICIP), 2331–2335, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP40778.2020.9191264
Improving Multi-Target Multi-Camera Tracking by Track Refinement and Completion
Specker, A.; Florin, L.; Cormier, M.; Beyerer, J.
2022. 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 3198–3208, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW56347.2022.00361
Deep Sensor Fusion with Pyramid Fusion Networks for 3D Semantic Segmentation
Schieber, H.; Duerr, F.; Schoen, T.; Beyerer, J.
2022. doi:10.48550/arXiv.2205.13629
Deep Sensor Fusion with Pyramid Fusion Networks for 3D Semantic Segmentation
Schieber, H.; Duerr, F.; Schoen, T.; Beyerer, J.
2022. 2022 IEEE Intelligent Vehicles Symposium (IV): 4–9 June 2022, Aachen, Germany, 375–381, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV51971.2022.9827113
Impacts of Data Anonymization on Semantic Segmentation
Zhou, J.; Beyerer, J.
2022. 2022 IEEE Intelligent Vehicles Symposium (IV): 4–9 June 2022, Aachen, Germany, 997–1004, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV51971.2022.9827262
Towards Heterogeneous Remote Attestation Protocols
Wagner, P. G.; Beyerer, J.
2022. Proceedings of the 19th International Conference on Security and Cryptography - SECRYPT. Vol. 1. Ed.: S. De Capitani di Vimercati, 586–591, SciTePress. doi:10.5220/0011289000003283
Modeling Clinical Practice Guidelines for Interactive Decision Support Exemplified by Primary Myelofibrosis and Immune Thrombocytopenia
Philipp, P.; Hempel, L.; Hempel, D.; Beyerer, J.
2021. 2021 International Conference on Computational Science and Computational Intelligence (CSCI): 15–17 December 2021, Las Vegas, NV, USA, 1163–1168, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI54926.2021.00244
Towards Private Medical Data Donations by Using Privacy Preserving Technologies
Appenzeller, A.; Terzer, N.; Krempel, E.; Beyerer, J.
2022. The15th International Conference on PErvasive Technologies Related to Assistive Environments, 446–454, Association for Computing Machinery (ACM). doi:10.1145/3529190.3534768
In memoriam Fernando Puente León
Heizmann, M.; Beyerer, J.
2022. tm - Technisches Messen, 89 (2), 83–84. doi:10.1515/teme-2021-0138
Wandlungsfähige Produktion für die Kreislaufwirtschaft
Beyerer, J.; Bretthauer, G.; Hofmann, C.; Lanza, G.
2022. at - Automatisierungstechnik, 70 (6), 501–503. doi:10.1515/auto-2022-0063
MotorFactory: A Blender Add-on for Large Dataset Generation of Small Electric Motors
Wu, C.; Zhou, K.; Kaiser, J.-P.; Mitschke, N.; Klein, J.-F.; Pfrommer, J.; Beyerer, J.; Lanza, G.; Heizmann, M.; Furmans, K.
2022. Procedia CIRP, 106, 138–143. doi:10.1016/j.procir.2022.02.168
Agiles Produktionssystem mittels lernender Roboter bei ungewissen Produktzuständen am Beispiel der Anlasser-Demontage = Concept of an agile production system based on learning robots applied to disassembly
Lanza, G.; Asfour, T.; Beyerer, J.; Deml, B.; Fleischer, J.; Heizmann, M.; Furmans, K.; Hofmann, C.; Cebulla, A.; Dreher, C.; Kaiser, J.-P.; Klein, J.-F.; Leven, F.; Mangold, S.; Mitschke, N.; Stricker, N.; Pfrommer, J.; Wu, C.; Wurster, M.; Zaremski, M.
2022. at - Automatisierungstechnik, 70 (6), 504–516. doi:10.1515/auto-2021-0158
Quantifying Trustworthiness in Decentralized Trusted Applications
Wagner, P. G.; Beyerer, J.
2022. Proceedings of the 2022 ACM Workshop on Secure and Trustworthy Cyber-Physical Systems (Sat-CPS’22), 67–76, Association for Computing Machinery (ACM). doi:10.1145/3510547.3517930
Sovereign Digital Consent through Privacy Impact Quantification and Dynamic Consent
Appenzeller, A.; Hornung, M.; Kadow, T.; Krempel, E.; Beyerer, J.
2022. Technologies, 10 (1), Article no: 35. doi:10.3390/technologies10010035
Intelligente Bild- und Videoauswertung für die Sicherheit
Fraunhofer IOSB; Golda, T.; Cormier, M.; Beyerer, J.
2022. Handbuch Polizeimanagement – Polizeipolitik – Polizeiwissenschaft – Polizeipraxis. Ed.: D. Wehe, 1–21, Springer Fachmedien Wiesbaden. doi:10.1007/978-3-658-34394-1_87-1
Modelling Ambiguous Assignments for Multi-Person Tracking in Crowds
Stadler, D.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 133–142, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00019
Robustness estimation of simple lens systems by machine learning
Chen, C.-W.; Zhou, B.; Längle, T.; Beyerer, J.
2021. International Optical Design Conference: in Proceedings OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT) ; 27 June–1 July 2021, Washington, DC, United States, Art.-Nr.: 120781B, Optica Publishing Group (OSA). doi:10.1117/12.2603658
Where Are We With Human Pose Estimation in Real-World Surveillance?
Cormier, M.; Clepe, A.; Specker, A.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 591–601, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00065
Fast and Lightweight Online Person Search for Large-Scale Surveillance Systems
Specker, A.; Moritz, L.; Cormier, M.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 570–580, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00063
Wertstromkinematik – Produktionssysteme neu gedacht: Interdisziplinäres Forscherteam arbeitet an der Produktionstechnik der Zukunft (Teil 2)
Kimmig, A.; Schöck, M.; Mühlbeier, E.; Oexle, F.; Fleischer, J.; Bönsch, J.; Ovtcharova, J.; Hahn, J.; Grunwald, A.; Albers, A.; Rapp, S.; Hagenmeyer, V.; Scholz, S. G.; Schmidt, A.; Müller, T.; Becker, J.; Schade, F.; Beyerer, J.; Rehak, J.; Zwick, T.; Pauli, M.; Nuß, B.; Lanza, G.; Schild, L.; Overbeck, L.
2021. Zeitschrift für wirtschaftlichen Fabrikbetrieb, 116 (12), 935–939. doi:10.1515/zwf-2021-0207
Sensitivity enhanced roll-angle sensor by means of a quarter-waveplate
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2021. Technisches Messen, 88 (s1), s48–s52. doi:10.1515/teme-2021-0069
On the Performance of Crowd-Specific Detectors in Multi-Pedestrian Tracking
Stadler, D.; Beyerer, J.
2021. 2021 17th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–12, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS52988.2021.9663836
Multi-Pedestrian Tracking with Clusters
Stadler, D.; Beyerer, J.
2021. 17th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–10, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS52988.2021.9663829
Resolution enhancement of low-NA objectives in confocal fluorescence microscopy by diffractive lens arrays
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2021. Proceedings of the International Optical Design Conference 2021. Ed.: P.P. Clark, 126 – 131, SPIE. doi:10.1117/12.2603633
Double Head Predictor based Few-Shot Object Detection for Aerial Imagery
Wolf, S.; Meier, J.; Sommer, L.; Beyerer, J.
2021. IEEE/CVF International Conference on Computer Vision Workshops (ICCVW), Montreal, BC, Canada 11th -17th October 2021, 721–731, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICCVW54120.2021.00086
Nachruf für Prof. Dr. rer. nat. Hartwig Steusloff – * 15. Juli 1937, † 21. Juli 2021
Beyerer, J.
2021. Automatisierungstechnik, 69 (10), 917–918. doi:10.1515/auto-2021-0130
Confocal fluorescence microscopy with high-NA diffractive lens arrays
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2022. Applied Optics, 61 (3), A37-A42. doi:10.1364/AO.442084
Hardness Prediction for More Reliable Attribute-based Person Re-identification
Florin, L.; Specker, A.; Schumann, A.; Beyerer, J.
2021. 2021 IEEE 4th International Conference on Multimedia Information Processing and Retrieval (MIPR), 418–424, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MIPR51284.2021.00077
Continual learning for class- and domain-incremental semantic segmentation
Kalb, T.; Roschani, M.; Ruf, M.; Beyerer, J.
2021. 2021 IEEE Intelligent Vehicles Symposium (IV): 11-17 July 2021, online, 1345–1351, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV48863.2021.9575493
Do as we do: Multiple Person Video-To-Video Transfer
Cormier, M.; Moshkenan, H. M.; Lörch, F.; Metzler, J.; Beyerer, J.
2021. 2021 IEEE 4th International Conference on Multimedia Information Processing and Retrieval (MIPR), 84–90, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MIPR51284.2021.00020
A Step Towards Global Counterfactual Explanations: Approximating the Feature Space Through Hierarchical Division and Graph Search
Becker, M.; Burkart, N.; Birnstill, P.; Beyerer, J.
2021. Advances in Artificial Intelligence and Machine Learning, 1 (2), 90–110. doi:10.54364/aaiml.2021.1107
Interactive Labeling for Human Pose Estimation in Surveillance Videos
Cormier, M.; Ropke, F.; Golda, T.; Beyerer, J.
2021. 2021 IEEE/CVF International Conference on Computer Vision Workshops : ICCVW 2021 : 11-17 October 2021, virtual event : proceedings. Ed.: Tamara Berg, 1649–1658, IEEEXplore. doi:10.1109/ICCVW54120.2021.00190
Towards Lower Precision Quantization for Pedestrian Detection in Crowded Scenario
Cormier, M.; Seletkov, D.; Beyerer, J.
2021. IEEE EUROCON 2021 - 19th International Conference on Smart Technologies, Lviv, Ukraine, 6-8 July 2021, 254–258, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/EUROCON52738.2021.9535539
Fast Pedestrian Detection for Real-World Crowded Scenarios on Embedded GPU
Cormier, M.; Wolf, S.; Sommer, L.; Schumann, A.; Beyerer, J.
2021. IEEE EUROCON 2021 - 19th International Conference on Smart Technologies, Lviv, Ukraine, 6-8 July 2021, 40–44, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/EUROCON52738.2021.9535550
Improving Attribute-Based Person Retrieval By Using A Calibrated, Weighted, And Distribution-Based Distance Metric
Specker, A.; Beyerer, J.
2021. 2021 IEEE International Conference on Image Processing (ICIP), Anchorage, AK, USA, Anchorage, AK, USA, 19-22 Sept. 2021, 2378–2382, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP42928.2021.9506096
Temporal Extension for Encoder-Decoder-based Crowd Counting Approaches
Fraunhofer IOSB; Golda, T.; Kruger, F.; Beyerer, J.
2021. 2021 17th International Conference on Machine Vision and Applications (MVA), 1–5, Institute of Electrical and Electronics Engineers (IEEE). doi:10.23919/MVA51890.2021.9511351
Secure and privacy-respecting documentation for interactive manufacturing and quality assurance
Wagner, P. G.; Lengenfelder, C.; Holzbach, G.; Becker, M.; Birnstill, P.; Voit, M.; Bejhad, A.; Samorei, T.; Beyerer, J.
2021. Applied Sciences (Switzerland), 11 (16), Art.-Nr.: 7339. doi:10.3390/app11167339
Smart agriculture
Beyerer, J.; Bretthauer, G.; Längle, T.
2021. Automatisierungstechnik, 69 (4), 275–277. doi:10.1515/auto-2021-2049
An Occlusion-Aware Multi-Target Multi-Camera Tracking System
Specker, A.; Stadler, D.; Florin, L.; Beyerer, J.
2021. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, 4168–4177, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW53098.2021.00471
Improving Multiple Pedestrian Tracking by Track Management and Occlusion Handling
Stadler, D.; Beyerer, J.
2021. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 10958–10967, Institute of Electrical and Electronics Engineers (IEEE)
Lernende Systeme erkunden, schützen, retten
Beyerer, J.; Tchouchenkov, I.
2020. Galvanotechnik, 111 (9), 1384–1391
Light field illumination: Problem-specific lighting adjustment = Lichtfeldbeleuchtung: Problemspezifische Beleuchtungsanpassung
Kludt, C.; Längle, T.; Beyerer, J.
2021. Technisches Messen, 88 (6), 330–341. doi:10.1515/teme-2021-0021
Analytical determination of the complex refractive index and the incident angle of an optically isotropic substrate by ellipsometric parameters and reflectance
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2021. Applied optics, 60 (22), F33–F38. doi:10.1364/AO.423793
High-resolution confocal microscopy with low-NA objectives based on diffractive lens arrays
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2021. Applied optics, 60 (22), F1–F5. doi:10.1364/AO.423933
Motion-Based Visual Inspection of Optically Indiscernible Defects on the Example of Hazelnuts
Maier, G.; Shevchyk, A.; Flitter, M.; Gruna, R.; Längle, T.; Hanebeck, U. D.; Beyerer, J.
2021. Computers and Electronics in Agriculture, 185, 106147. doi:10.1016/j.compag.2021.106147
Accuracy Evaluation of a Lightweight Analytic Vehicle Dynamics Model for Maneuver Planning
Ziehn, J. R.; Ruf, M.; Roschani, M.; Beyerer, J.
2020. 5th International Conference on Robotics and Automation Engineering (ICRAE 2020) : November 20-22, 2020, Singapore, 197–205, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRAE50850.2020.9310898
Light Field Illumination: A Universal Lighting Approach for Visual Inspection
Kludt, C.; Dippon, L.; Langle, T.; Beyerer, J.
2020. Forum Bildverarbeitung 2018 : [29.-30. Novemver 2018 in Karlsruhe] / herausgegeben von T. Längle, F. Puente León und M. Heizmann, 25, KIT Scientific Publishing
Portable Trust Anchor for OPC UA Using Auto-Configuration
Meier, D.; Patzer, F.; Drexler, M.; Beyerer, J.
2020. 2020 IEEE 25th International Conference on Emerging Technologies and Factory Automation (ETFA) : Technical University of Vienna, Vienna, Austria, 08-011September 2020 : proceedings / organized by: IEEE Industrial Electronics Society (IES), 270–277. doi:10.1109/ETFA46521.2020.9211904
A cooperative HCI assembly station with dynamic projections
Lengenfelder, C.; Frese, C.; Zube, A.; Voit, M.; Beyerer, J.
2020. 52nd International Symposium on Robotics : 9-10 December 2020, Online-Event, Germany, 1–8, VDE Verlag
Direct-imaging DOEs for high-NA multi-spot confocal surface measurement Direct-imaging DOEs für konfokale Multi-Spot-Oberflächenmessung mit hoher NA
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2021. Technisches Messen, 88 (5), 319–325. doi:10.1515/teme-2020-0103
Detection of pyrrolizidine alkaloid containing herbs using hyperspectral imaging in the short-wave infrared
Krause, J.; Tron, N.; Maier, G.; Krähmer, A.; Gruna, R.; Längle, T.; Beyerer, J.
2021. OCM 2021 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; T. Längle, 45–55, Karlsruher Institut für Technologie (KIT)
In memoriam Professor Dr.-Ing. Fernando Puente León
Mesch, F.; Beyerer, J.
2020. Technisches Messen, 87 (10), 597–598. doi:10.1515/teme-2020-0067
Realtime Global optimization of a Fail-Safe Emergency Stop Maneuver for Arbitrary Electrical/ Electronical Failures in Automated Driving
Duerr, F.; Ziehn, J.; Kohlhaas, R.; Roschani, M.; Ruf, M.; Beyerer, J.
2020. 2020 IEEE 23rd International Conference on Intelligent Transportation Systems (ITSC), 20-23 September 2020, online, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ITSC45102.2020.9294578
Iterative Deep Fusion for 3D Semantic Segmentation
Duerr, F.; Weigel, H.; Maehlisch, M.; Beyerer, J.
2020. Proceedings: The Fourth IEEE International Conference on Robotic Computing ; 9-11 November 2020, Virtual Conference, 391–397, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IRC.2020.00067
Defect Annotation on Objects Using a Laser Remote Conrol
Lengenfelder, C.; Holzbach, G.; Voit, M.; Beyerer, J.
2020. HCI International 2020 - Posters – 22nd International Conference, HCII 2020, Copenhagen, Denmark, July 19–24, 2020, Proceedings, Part I. Ed.: C. Stephanidis, 535–542, Springer International Publishing. doi:10.1007/978-3-030-50726-8_70
Imaging vehicle-to-vehicle communication using visible light
Ziehn, J. R.; Roschani, M.; Ruf, M.; Bruestle, D.; Beyerer, J.; Helmer, M.
2020. Advanced Optical Technologies, 9 (6), 339–348. doi:10.1515/aot-2020-0038
Toward Mass Video Data Analysis: Interactive and Immersive 4D Scene Reconstruction
Kraus, M.; Pollok, T.; Miller, M.; Kilian, T.; Moritz, T.; Schweitzer, D.; Beyerer, J.; Keim, D.; Qu, C.; Jentner, W.
2020. Sensors, 20 (18), Art. Nr.: 5426. doi:10.3390/s20185426
Object Detection in 3D Point Clouds via Local Correlation-Aware Point Embedding
Fraunhofer IOSB; Wu, C.; Pfrommer, J.; Beyerer, J.; Li, K.; Neubert, B.
2021. 2020 Joint 9th International Conference on Informatics, Electronics & Vision (ICIEV) and 2020 4th International Conference on Imaging, Vision & Pattern Recognition (icIVPR), Kitakyushu, Japan, 26-29 Aug. 2020, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIEVicIVPR48672.2020.9306522
From Visual Spectrum to Millimeter Wave: A Broad Spectrum of Solutions for Food Inspection
Becker, F.; Schwabig, C.; Krause, J.; Leuchs, S.; Krebs, C.; Gruna, R.; Kuter, A.; Langle, T.; Nuessler, D.; Beyerer, J.
2020. IEEE antennas & propagation magazine, 62 (5), 55–63. doi:10.1109/MAP.2020.3003225
Multi-user authorization for simultaneous collaborative situation analysis workspaces using XACML
Appenzeller, A.; Krempel, E.; Birnstill, P.; Beyerer, J.
2020. Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies IV, 21-25 September 2020 (Teilkonferenz von SPIE Security + Defence Digital Forum 2020). Ed.: H. Bouma, Art.-Nr.: 1154207, SPIE. doi:10.1117/12.2570824
Towards the modelling of complex communication networks in AutomationML
Patzer, F.; Sarkar, A.; Birnstill, P.; Schleipen, M.; Beyerer, J.
2017. 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Limassol, Cyprus, 12-15 Sept. 2017, 1–8, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETFA.2017.8247571
Helper-in-the-Middle: Supporting Web Application Scanners Targeting Industrial Control Systems
Borcherding, A.; Pfrang, S.; Haas, C.; Weiche, A.; Beyerer, J.
2020. SECRYPT 2020 : proceedings of the 17th International Conference on Security and Cryptography : July 8-10, 2020 (SECRYPT is part of ICETE, the 17th International Joint Conference on e-Business and Telecommunications). Vol. 3. Ed.: P. Samarati, 27–38, SciTePress. doi:10.5220/0009517800270038
A multitask model for person re-identification and attribute recognition using semantic regions
Specker, A.; Schumann, A.; Beyerer, J.
2020. Artificial Intelligence and Machine Learning in Defense Applications II. Ed.: J. Dijk, 115430I, SPIE. doi:10.1117/12.2573981
Interactive Decision Support: A Framework to Improve Diagnostic Processes of Cancerous Diseases Using Bayesian Networks
Philipp, P.; Robert, S.; Beyerer, J.
2018. Proceedings of the 8th IEEE Conference on Cognitive and Computational Aspects of Situation Management (CogSIMA 2018), Boston, MA, June 11-14, 2018. Ed.: O.E. Gundersen, 15–21, IEEE Computer Society. doi:10.1109/COGSIMA.2018.8423989
Modeling of Clinical Practice Guidelines for an Interactive Decision Support Using Ontologies
Philipp, P.; Bommersheim, M.; Robert, S.; Hempel, D.; Beyerer, J.
2018. HIMS ’18 : proceedings of the 2018 International Conference on Health Informatics & Medical Systems : publication of the 2018 World Congress in Computer Science, Computer Engineering, & Applied Computing (CSCE ’18), July 30-August 02, 2018, Las Vegas, Nevada, USA. Ed: H. R. Arabnia, 83–89, CSREA Press
Towards a surgical phase detection using Markov Logic Networks
Philipp, P.; Bleier, J.; Fischer, Y.; Beyerer, J.
2017. CAOS 2017, 17th Annual Meeting of the International Society for Computer Assisted Orthopaedic Surgery. Papers. Online resource : June 14-17, 2017, Aachen, Germany 2017. Ed.: K. Radermacher, 288–294
Modeling of Clinical Practice Guidelines for Interactive Assistance in Diagnostic Processes
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.
2015. HIMS 2015 : proceedings of the 2015 International Conference on Health Informatics and Medical Systems : WORLDCOMP’15, July 27-30, 2015, Las Vegas, Nevada, USA. Ed.: H. R. Arabnia, 3–9, CSREA Press
Establishing Secure Communication Channels Using Remote Attestation with TPM 2.0
Wagner, P. G.; Birnstill, P.; Beyerer, J.
2020. Security and Trust Management. Ed.: K. Markantonakis, 73–89, Springer Nature. doi:10.1007/978-3-030-59817-4_5
An Evaluation Of Design Choices For Pedestrian Attribute Recognition In Video
Specker, A.; Schumann, A.; Beyerer, J.
2020. IEEE International Conference on Image Processing (ICIP), 2331–2335, Institute of Electrical and Electronics Engineers (IEEE)
Image domain adaption of simulated data for human pose estimation
Golda, T.; Blattmann, A.; Metzler, J.; Beyerer, J.
2020. J. Dijk (Ed.), Artificial Intelligence and Machine Learning in Defense Applications II, 19, SPIE. doi:10.1117/12.2573888
Message from general chairs
Beyerer, J.; Stiefelhagen, R.
2015. 2015 12th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–4, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2015.7301719
Direct-imaging DOEs for high-NA multi-spot confocal microscopy = Direct-imaging DOEs für konfokale Multi-Spot-Mikroskopie mit hoher NA
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2020. Technisches Messen, 87 (SH), S40-S43. doi:10.1515/teme-2020-0017
Context-Aware Software-Defined Networking for Automated Incident Response in Industrial Networks
Patzer, F.; Lüdtke, P.; Meshram, A.; Beyerer, J.
2020. 5th International Conference on Information Systems Security and Privacy, ICISSP 2019; Prague; Czech Republic; 23 February 2019 through 25 February 2019, 137–161, Springer-Verlag. doi:10.1007/978-3-030-49443-8_7
Mirrors
Beyerer, J.; Eichhorn, M.
2020. Computer Vision: A Reference Guide, 1–5, Springer. doi:10.1007/978-3-030-03243-2_100-1
Wenn der Roboter zur Hilfe eilt
Beyerer, J.
2020, April 2
Context Aware 3D Image Processing and Acquisition : A Service-Oriented System in Scope of I4.0 Applications = Kontextbezogene Verarbeitung und Erfassung von 3D-Daten : Ein serviceorientiertes System im Rahmen von I4.0-Anwendungen
Bhatti, F.; Engel, G.; Engelsberger, M.; Ziebert, M.; Zeller, N.; Beyerer, J.; Greiner, T.; Heizmann, M.; Quint, F.
2019. atp Magazin, 61 (3), 76–86. doi:10.17560/atp.v61i3.2378
Lernende Systeme in menschenfeindlichen Umgebungen - Künstliche Intelligenz zur Unterstützung und zum Schutz des Menschen
Beyerer, J.; Tchouchenkov, I.
2019. Betriebliche Prävention, 2019 (10), 378–384
Zum Schutz des Menschen: Lernende Systeme in menschenfeindlichen Umgebungen
Beyerer, J.; Tchouchenkov, I.
2019. Sicherheitsingenieur, 2019 (12), 378–384
Modeling of Medical Treatment Processes for an Interactive Assistance Based on the Translation of UML Activities into PROforma
Philipp, P.; Becker, S.; Robert, S.; Hempel, D.; Beyerer, J.
2019. 6th Annual International Conference on Computational Science and Computational Intelligence, CSCI 2019; Las Vegas, 5th December 2019 - 7th December 2019, 972–976, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI49370.2019.00184
Analysis of control flow graphs using graph convolutional neural networks
Philipp, P.; Georgi, R. X. M.; Beyerer, J.; Robert, S.
2019. 6th Intl. Conference on Soft Computing & Machine Intelligence : (ISCMI 2019) : November 19-20, 2019, Johannesburg, South Africa, 73–77, Institute of Electrical and Electronics Engineers (IEEE)
CNN-based Image Denoising for Outdoor Active Stereo
Qu, C.; Moiseikin, M.; Voth, S.; Beyerer, J.
2019. Proceedings of the 16th International Conference on Machine Vision Applications : May 27-31, 2019, National Olympics Memorial Youth Center, Tokyo, Japan, 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.23919/MVA.2019.8757894
Patch-based facial texture super-resolution by fitting 3D face models
Qu, C.; Monari, E.; Schuchert, T.; Beyerer, J.
2019. Machine vision and applications, 30 (4), 557–586
General Fail-Safe Emergency Stopping for Highly-Automated Vehicles
Beyerer, J.
2019. Automatisiertes Fahren, Tagung, München, 21. – 22. November 2019
Production quality control through a user-oriented and characteristic-based quality visualization model
Gewohn, M.; Usländer, T.; Beyerer, J.
2019. Procedia CIRP, 79, 511–516. doi:10.1016/j.procir.2019.02.105
Automatic visual inspection based on trajectory data
Maier, G.; Murdter, N.; Gruna, R.; Langle, T.; Beyerer, J.
2019. OCM 2019 : 4th International Conference on Optical Characterization of Materials : March 13th - 14th, 2019 : Karlsruhe, Germany / edited by Jürgen Beyerer, Fernando Puente Léon, Thomas Längle, 87–97, KIT Scientific Publishing
The Industrie 4.0 Asset Administration Shell as Information Source for Security Analysis
Patzer, F.; Volz, F.; Usländer, T.; Blöcher, I.; Beyerer, J.
2019. 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) : Paraninfo Building, University of Zaragoza, Zaragoza, Spain, 10-13 September, 2019 : proceedings, 420–427, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETFA.2019.8869059
IT-Sicherheit im Wettstreit um die erste autonome Fahrzeugflotte
Zander, T.; Birnstill, P.; Kaiser, F.; Wiens, M.; Beyerer, J.; Schultmann, F.
2020. Technikfolgenabschätzung, Theorie und Praxis, 29 (1), 16–22. doi:10.14512/tatup.29.1.16
Mueller matrix cone and its application to filtering
Zander, T.; Beyerer, J.
2020. OSA continuum, 3 (6), 1376–1384. doi:10.1364/OSAC.383317
Modern non-destructive testing
Beyerer, J.; Hanke, R.
2020. Technisches Messen, 87 (6). doi:10.1515/teme-2020-0033
Analytic solutions for calculating the surface inclination of isotropic media and bare substrates by using reflection-based generalized ellipsometry
Negara, C.; Längle, T.; Beyerer, J.
2020. Journal of vacuum science & technology / B, 38 (3), 034012. doi:10.1116/1.5144506
Imaging ellipsometry for curved surfaces
Negara, C.; Längle, T.; Beyerer, J.
2020. Journal of vacuum science & technology / B, 38 (1), Art.Nr.: 014016. doi:10.1116/1.5129654
Retroreflex ellipsometry for isotropic substrates with nonplanar surfaces
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2019. Journal of vacuum science & technology / B, 38 (1), 014005. doi:10.1116/1.5121854
Ellipsometric inline inspection of dielectric substrates with nonplanar surfaces
Hartrumpf, M.; Chen, C.-W.; Längle, T.; Beyerer, J.
2020. Technisches Messen, 87 (6), 6. doi:10.1515/teme-2019-0097
An Interactive Framework for Cross-modal Attribute-based Person Retrieval
Specker, A.; Schumann, A.; Beyerer, J.
2019. 16th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 2019, Taipei, Taiwan, 18-21 Sept. 2019, 8909832, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2019.8909832
Cognitive Systems and Robotics : Intelligent data utilization for autonomous systems
Bauckhage, C.; Bauernhansl, T.; Beyerer, J.; Garcke, J.
2019. Digital Transformation. Ed.: R. Neugebauer, 231–251, Vieweg Verlag. doi:10.1007/978-3-662-58134-6_14
The MTA Dataset for Multi-Target Multi-Camera Pedestrian Tracking by Weighted Distance Aggregation
Kohl, P.; Specker, A.; Schumann, A.; Beyerer, J.
2020. 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020, Virtual, Online, United States, 14 - 19 June 2020, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW50498.2020.00529
Human Pose Estimation for Real-World Crowded Scenarios
Golda, T.; Kalb, T. M.; Schumann, A.; Beyerer, J.
2019. 2019 16th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–8, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2019.8909823
Application of Area-Scan Sensors in Sensor-Based Sorting
Maier, G.; Pfaff, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2018. 8th Sensor-Based Sorting & Control, SBSC 2018 : Aachen, 6-7 March 2018. Ed.: T. Pretz, 73–82, Shaker Verlag
Comprehensive Evaluation of Deep Learning based Detection Methods for Vehicle Detection in Aerial Imagery
Acatay, O.; Sommer, L.; Schumann, A.; Beyerer, J.
2018. 15th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2018.8639127
Onthology-based Masking Loss for Improved Generalization in Remote Sensing Semantic Image Retrieval
Schumann, A.; Sommer, L.; Vogler, M.; Beyerer, J.
2018. 2018 15th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–6, Institute of Electrical and Electronics Engineers (IEEE)
Ensemble of Two-Stage Regression Based Detectors for Accurate Vehicle Detection in Traffic Surveillance Data
Sommer, L.; Acatay, O.; Schumann, A.; Beyerer, J.
2018. 15th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–6, Institute of Electrical and Electronics Engineers (IEEE)
A systematic evaluation of recent deep learning architectures for fine-grained vehicle classification
Valev, K.; Schumann, A.; Sommer, L.; Beyerer, J.
2018. Pattern Recognition and Tracking XXIX : 18-19 April 2018, Orlando, Florida, United States. Ed.: Mohammad S. Alam, Art.Nr.: 1064902, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2305062
UAV-Net: A Fast Aerial Vehicle Detector for Mobile Platforms
Ringwald, T.; Sommer, L.; Schumann, A.; Beyerer, J.; Stiefelhagen, R.
2019. 32nd IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW, Long Beach, United States, 16th - 20th June 2019, 544–552, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW.2019.00080
Semantic labeling based vehicle detection in aerial imagery
Nie, K.; Sommer, L.; Schumann, A.; Beyerer, J.
2018. 2018 IEEE Winter Conference on Applications of Computer Vision - WACV 2018: 12-15 March 2018, Lake Tahoe, Nevada / general chairs: Gérard Medioni, Anthony Hoogs, Scott McCloskey, 626–634, Institute of Electrical and Electronics Engineers (IEEE)
Multi feature deconvolutional faster r-cnn for precise vehicle detection in aerial imagery
Sommer, L.; Schumann, A.; Schuchert, T.; Beyerer, J.
2018. 2018 IEEE Winter Conference on Applications of Computer Vision - WACV 2018 : proceedings : 12-15 March 2017, Lake Tahoe, Nevada, 635–642, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2018.00075
Attribute-based Person Retrieval and Search in Video Sequences
Schumann, A.; Specker, A.; Beyerer, J.
2018. 2018 15th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2018.8639114
Experimental Evaluation of a Novel Sensor-Based Sorting Approach Featuring Predictive Real-Time Multiobject Tracking
Maier, G.; Pfaff, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Beyerer, J.
2021. IEEE transactions on industrial electronics, 68 (2), 1548–1559. doi:10.1109/TIE.2020.2970643
Predictive Analysis of Business Processes Using Neural Networks with Attention Mechanism
Philipp, P.; Jacob, R.; Robert, S.; Beyerer, J.
2020. The 2nd International Conference on Artificial Intelligence in Information and Communication : ICAIIC 2020 : February 19-21, 2020, Fukuoka, Japan, 225–230, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICAIIC48513.2020.9065057
Comprehensive Analysis of Deep Learning-Based Vehicle Detection in Aerial Images
Sommer, L.; Schuchert, T.; Beyerer, J.
2019. IEEE transactions on circuits and systems for video technology, 29 (9), 2733–2747. doi:10.1109/TCSVT.2018.2874396
A meta model for a comprehensive description of network protocols improving security tests
Pfrang, S.; Meier, D.; Fleig, A.; Beyerer, J.
2020. Proceedings of the 6th International Conference on Information Systems Security and Privacy. Ed.: S. Furnell, 671–682, SciTePress
Predictive tracking with improved motion models for optical belt sorting
Pfaff, F.; Pieper, C.; Maier, G.; Noack, B.; Gruna, R.; Kruggel-Emden, H.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Längle, T.; Beyerer, J.
2020. Automatisierungstechnik, 68 (4), 239–255. doi:10.1515/auto-2019-0134
Characterizing material flow in sensor-based sorting systems using an instrumented particle
Maier, G.; Pfaff, F.; Bittner, A.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Hanebeck, U. D.; Längle, T.; Beyerer, J.
2020. Automatisierungstechnik, 68 (4, SI), 256–264. doi:10.1515/auto-2019-0128
Real-time multitarget tracking for sensor-based sorting – A new implementation of the auction algorithm for graphics processing units
Maier, G.; Pfaff, F.; Wagner, M.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2019. Journal of real-time image processing, 16 (6), 2261–2272. doi:10.1007/s11554-017-0735-y
Suggesting gaze-based selection for surveillance applications
Hild, J.; Peinsipp-Byma, E.; Voit, M.; Beyerer, J.
2019. 2019 16th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 18-21 September 2019, Taipei, Taiwan, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2019.8909833
Kalibrierfreie 3D-Rekonstruktion von gekrümmten Oberflächen mittels orthographischer Projektion unter Verwendung von Reflexionsmarkern [Calibration-free 3D reconstruction of specular surfaces with orthogonal projections by using reflection markers]
Negara, C.; Längle, T.; Beyerer, J.
2019. Technisches Messen, 86 (7-8), 373–383. doi:10.1515/teme-2019-0026
ROBDEKON: Robotic Systems for Decontamination in Hazardous Environments
Petereit, J.; Beyerer, J.; Asfour, T.; Gentes, S.; Hein, B.; Hanebeck, U. D.; Kirchner, F.; Dillmann, R.; Gotting, H. H.; Weiser, M.; Gustmann, M.; Egloffstein, T.
2019. IEEE International Symposium on Safety, Security, and Rescue Robotics (SSRR 2019), Würzburg, September 2-4, 2019, 249–255, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SSRR.2019.8848969
Application of DOE in confocal microscopy for surface measurement
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2019. Photonics and Education in Measurement Science 2019. Ed.: M. Rosenberger, Art.-Nr.: 1114411, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2531610
Simplified Stokes polarimeter based on division-of-amplitude
Negara, C.; Li, Z.; Längle, T.; Beyerer, J.
2019. Photonics and Education in Measurement Science 2019. Ed.: M. Rosenberger, Art.-Nr.: 111441B, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2532399
Application and Evaluation of Meta-Model Assisted Optimisation Strategies for Gripper-Assisted Fabric Draping in Composite Manufacturing
Zimmerling, C.; Pfrommer, J.; Liu, J.; Beyerer, J.; Henning, F.; Kärger, L.
2018. 18th European Conference on Composite Materials (ECCM 2018), Athen, GR, June 24-28, 2018
Challenges of Using Trusted Computing for Collaborative Data Processing
Wagner, P. G.; Birnstill, P.; Beyerer, J.
2019. Security and Trust Management – 15th International Workshop, STM 2019, Luxembourg City, Luxembourg, September 26–27, 2019, Proceedings. Ed.: S. Mauw, 107–123, Springer. doi:10.1007/978-3-030-31511-5_7
Probabilistic Estimation of Human Interaction Needs in Context of a Robotic Assistance in Geriatrics
Philipp, P.; Bommersheim, M.; Robert, S.; Beyerer, J.
2019. Current directions in biomedical engineering, 5 (1), 433–435. doi:10.1515/cdbme-2019-0109
Measurement of ellipsometric data and surface orientations by modulated circular polarized light / Messung von ellipsometrischen Daten und Oberflächenorientierungen durch moduliertes zirkular polarisiertes Licht
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2019. Technisches Messen, 86 (s1), 32–36. doi:10.1515/teme-2019-0047
World Modeling for Autonomous Systems
Belkin, A.; Kuwertz, A.; Fischer, Y.; Beyerer, J.
2012. Innovative Information Systems Modelling Techniques. Ed.: C. Kalloniatis, 137–158, InTech. doi:10.5772/38190
Gaussian process based dynamic facial emotion tracking
Dunau, P.; Huber, M. F.; Beyerer, J.
2019. 2019 IEEE International Conference on Industrial Cyber Physical Systems, ICPS 2019; Howards Plaza HotelTaipei; Taiwan; 6 May 2019 through 9 May 2019, 248–253, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPHYS.2019.8780338
Detecting illegal diving and other suspicious activities in the North Sea: Tale of a successful trial
Anneken, M.; De Rosa, F.; Kroker, A.; Jousselme, A.-L.; Robert, S.; Beyerer, J.
2019. Proceedings of the International Radar Symposium, Ulm, June 26-28, 2019. Ed.: P. Knott, Article No.8768132, IEEE Computer Society. doi:10.23919/IRS.2019.8768132
Area scanning method for 3D surface profilometry based on an adaptive confocal microscope
Luo, D.; Taphanel, M.; Claus, D.; Boettcher, T.; Osten, W.; Längle, T.; Beyerer, J.
2020. Optics and lasers in engineering, 124, Art.-Nr.: 105819. doi:10.1016/j.optlaseng.2019.105819
Automated security testing for web applications on industrial automation and control systems
Pfrang, S.; Borcherding, A.; Meier, D.; Beyerer, J.
2019. Automatisierungstechnik, 67 (5), 383–401. doi:10.1515/auto-2019-0021
Editorial
Müller-Quade, J.; Beyerer, J.; Broadnax, B.
2019. Automatisierungstechnik, 67 (5), 359–360. doi:10.1515/auto-2019-0044
Uncertainty quantification of nonlinear distributed parameter systems using generalized polynomial chaos
Janya-Anurak, C.; Bernard, T.; Beyerer, J.
2019. Automatisierungstechnik, 67 (4), 283–303. doi:10.1515/auto-2017-0116
Comparison of angle and size features with deep learning for emotion recognition
Dunau, P.; Huber, M. F.; Beyerer, J.
2019. Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications: 23rd Iberoamerican Congress, CIARP 2018, Madrid, Spain, November 19-22, 2018, Proceedings. Ed.: R. Vera-Rodriguez, 602–610, Springer. doi:10.1007/978-3-030-13469-3_70
Search Area Reduction Fast-RCNN for Fast Vehicle Detection in Large Aerial Imagery
Sommer, L.; Schmidt, N.; Schumann, A.; Beyerer, J.
2018. 2018 IEEE International Conference on Image Processing: Proceedings, 3054–3058, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP.2018.8451189
Identity Management and Protection Motivated by the General Data Protection Regulation of the European Union-A Conceptual Framework Based on State-of-the-Art Software Technologies
Birnstill, P.; Krempel, E.; Wagner, P. G.; Beyerer, J.
2018. Technologies, 6 (4), 115/1–14. doi:10.3390/technologies6040115
Building Blocks for Identity Management and Protection for Smart Environments and Interactive Assistance Systems
Birnstill, P.; Beyerer, J.
2018. Proceedings of the 11th PErvasive Technologies Related to Assistive Environments Conference, (PETRA), Corfu, Greece, June 26-29, 2018, 292–296, Association for Computing Machinery (ACM). doi:10.1145/3197768.3201563
Distributed Usage Control Enforcement through Trusted Platform Modules and SGX Enclaves
Wagner, P. G.; Birnstill, P.; Beyerer, J.
2018. Proceedings of the 23nd ACM on Symposium on Access Control Models and Technologies, SACMAT 2018, Indianapolis, IN, USA, June 13-15, 2018, 85–91, Association for Computing Machinery (ACM). doi:10.1145/3205977.3205990
The EU General Data Protection Regulation and its Effects on Designing Assistive Environments
Krempel, E.; Beyerer, J.
2018. Proceedings of the 11th PErvasive Technologies Related to Assistive Environments Conference, PETRA 2018, Corfu, Greece, June 26-29, 2018, 327–330, Association for Computing Machinery (ACM). doi:10.1145/3197768.3201567
Preface
Beyerer, J.; Puente Léon, F.; Längle, T.
2019. OCM 2019 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; F. Puente León, T. Längle, i-ii, KIT Scientific Publishing. doi:10.5445/IR/1000092320
Reduced feature set for emotion recognition based on angle and size information
Dunau, P.; Bonny, M.; Huber, M. F.; Beyerer, J.
2019. 15th International Conference on Intelligent Autonomous Systems, IAS 2018; Baden-Baden; Germany; 11 June 2018 through 15 June 2018. Ed.: R. Dillmann, 585–596, Springer. doi:10.1007/978-3-030-01370-7_46
Numerical modelling of an optical belt sorter using a DEM–CFD approach coupled with particle tracking and comparison with experiments
Pieper, C.; Pfaff, F.; Maier, G.; Kruggel-Emden, H.; Wirtz, S.; Noack, B.; Gruna, R.; Scherer, V.; Hanebeck, U. D.; Längle, T.; Beyerer, J.
2018. Powder technology, 340, 181–193. doi:10.1016/j.powtec.2018.09.003
Inspection Planning for Optimized Coverage of Geometrically Complex Surfaces
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Worn, H.
2018. 2018 Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2018; Brescia; Italy; 16 April 2018 through 18 April 2018, 52–57, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/METROI4.2018.8428313
CNN-based thermal infrared person detection by domain adaptation
Beyerer, J.; Ruf, M.; Herrmann, C.
2018. Autonomous Systems : Sensors, Vehicles, Security and the Internet of Everything, Orlando, FL, April 15-19, 2018. Ed.: M.C. Dudzik, Article No. 1064308, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2304400
Distant pulse oximetry based on skin region extraction and multi-spectral measurement
Herrmann, C.; Metzler, J.; Willersinn, D.; Beyerer, J.
2018. Medical Imaging 2018 : Image-Guided Procedures, Robotic Interventions, and Modeling, Houston, TX, February 10–15, 2018. Ed.: B. Fei, Article No. 105762O, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2293623
Optimisation of manufacturing process parameters using deep neural networks as surrogate models
Pfrommer, J.; Zimmerling, C.; Liu, J.; Kärger, L.; Henning, F.; Beyerer, J.
2018. 51st CIRP Conference on Manufacturing Systems, CIRP CMS 2018; Stockholm Waterfront Congress CentreStockholm; Sweden; 16 May 2018 through 18 May 2018. Ed.: T. Kjellberg, 426–431, Elsevier. doi:10.1016/j.procir.2018.03.046
Predicting observer’s task from eye movement patterns during motion image analysis
Hild, J.; Kühnle, C.; Voit, M.; Beyerer, J.
2018. 10th ACM Symposium on Eye Tracking Research and Applications, ETRA 2018; Warsaw; Poland; 14 June 2018 through 17 June 2018. Ed.: S.N. Spencer, Art.Nr. a58, Association for Computing Machinery (ACM). doi:10.1145/3204493.3204575
Systematic evaluation of deep learning based detection frameworks for aerial imagery
Sommer, L.; Steinmann, L.; Schumann, A.; Beyerer, J.
2018. Automatic Target Recognition XXVIII : 16-17 April 2018, Orlando, Florida, United States. Ed.: F. A. Sadjadi, 1064803, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2304768
Towards large-scale image retrieval with a disk-only index
Manger, D.; Willersinn, D.; Beyerer, J.
2018. 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2018; Funchal, Madeira; Portugal; 27 January 2018 through 29 January 2018. Ed.: J. Braz, 367–372, SciTePress
Open set logo detection and retrieval
Tüzko, A.; Herrmann, C.; Manger, D.; Beyerer, J.
2018. 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2018; Funchal, Madeira; Portugal; 27 January 2018 through 29 January 2018. Ed.: J. Braz, 284–292, SciTePress
Motion-based material characterization in sensor-based sorting
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2018. Technisches Messen, 85 (3), 202–210. doi:10.1515/teme-2017-0063
Towards light transport matrix processing for transparent object inspection
Meyer, J.; Längle, T.; Beyerer, J.
2018. Proceedings of the Computing Conference 2017, London, UK, 18th - 20th July 2017, 244–248, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SAI.2017.8252110
Unconstrained Face Detection and Open-Set Face Recognition Challenge
Günther, M.; Hu, P.; Herrmann, C.; Chan, C. H.; Jiang, M.; Yang, S.; Dhamija, A. R.; Ramanan, D.; Beyerer, J.; Kittler, J.; Jazaery, M. A.; Nouyed, M. I.; Guo, G.; Stankiewicz, C.; Boult, T. E.
2018. Proceedings of the IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, Colorado, 1st - 4th October 2017, 697–706, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/BTAS.2017.8272759
Improving material characterization in sensor-based sorting by utilizing motion information
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2017. OCM 2017 - Optical Characterization of Materials - conference proceedings. Hrsg.: J. Beyerer; F. Puente León; T. Längle, 109–119, KIT Scientific Publishing. doi:10.5445/IR/1000082558
Towards many-class classification of materials based on their spectral fingerprints
Richter, M.; Beyerer, J.
2015. OCM 2015 - Optical Characterization of Materials - conference proceedings. Hrsg.: J. Beyerer, F. Puente León, T. Längle, 103–112, KIT Scientific Publishing. doi:10.5445/IR/1000082544
Improving multitarget tracking using orientation estimates for sorting bulk materials
Pfaff, F.; Kurz, G.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Langle, T.; Beyerer, J.
2017. Proceedings of the International Conference on Multisensor Fusion and Integration for Intelligent Systems, MFI 2017, Daegu, South Korea, 16th - 18th November 2017, 553–558, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2017.8170379
Numerical modelling of the separation of complex shaped particles in an optical belt sorter using a dem-cfd approach and comparison with experiments
Pieper, C.; Wirtz, S.; Scherer, V.; Maier, G.; Gruna, R.; Langle, T.; Beyerer, J.; Pfaff, F.; Noack, B.; Hanebeck, U. D.; Kruggel-Emden, H.
2017. 5th International Conference on Particle-Based Methods - Fundamentals and Applications, PARTICLES 2017, Hannover, Germany, 26th - 28th September 2017, 373–384, International Centre for Numerical Methods in Engineering (CIMNE)
Zum 80sten Geburtstag von Prof. Dr. rer. nat. Hartwig Steusloff [On the 80th Birthday of Prof. Dr. rer. nat. Hartwig Steusloff]
Beyerer, J.; Bonn, G.
2017. Automatisierungstechnik, 65 (7), 524–525. doi:10.1515/auto-2017-0063
Moving object detection in top-view aerial videos improved by image stacking
Teutsch, M.; Krüger, W.; Beyerer, J.
2017. Optical engineering, 56 (8), Art. Nr.: 083102. doi:10.1117/1.OE.56.8.083102
Situation Detection for an Interactive Assistance in Surgical Interventions Based on Random Forests
Schreiter, L.; Philipp, P.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Beyerer, J.; Wörn, H.
2016. International journal of computer assisted radiology and surgery, 11 (Supplement 1), 115–116
Situation Detection for an Interactive Assistance in Surgical Interventions Based on Dynamic Bayesian Networks
Philipp, P.; Schreiter, L.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Wörn, H.; Beyerer, J.
2016. Proceedings of the 6th Joint Workshop On New Technologies for Computer/Robot Assisted Surgery, CRAS 2016, Pisa, Italy, 12th - 14th September 2016
Drone-vs-Bird detection challenge at IEEE AVSS2017
Coluccia, A.; Ghenescu, M.; Piatrik, T.; Cubber, G. D.; Schumann, A.; Sommer, L.; Klatte, J.; Schuchert, T.; Beyerer, J.; Farhadi, M.; Amandi, R.; Aker, C.; Kalkan, S.; Saqib, M.; Daud, S.; Makkah, K.; Blumenstein, M.
2017. 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078464, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078464
Semantic labeling for improved vehicle detection in aerial imagery
Sommer, L.; Nie, K.; Schumann, A.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078510, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078510
Flying object detection for automatic UAV recognition
Sommer, L.; Schumann, A.; Müller, T.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078557, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078557
Deep cross-domain flying object classification for robust UAV detection
Schumann, A.; Sommer, L.; Klatte, J.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078558, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078558
A Non-Invasive Cyberrisk in Cooperative Driving
Bapp, F.; Becker, J.; Beyerer, J.; Doll, J.; Filsinger, M.; Frese, C.; Hubschneider, C.; Lauber, A.; Müller-Quade, J.; Pauli, M.; Roschani, M.; Salscheider, O.; Rosenhahn, B.; Ruf, M.; Stiller, C.; Willersinn, D.; Ziehn, J. R.
2017. TÜV-Tagung Fahrerassistenz, 2017, München, 8 S
A versatile hardware and software toolset for computer aided inspection planning of machine vision applications
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikajii, M.; Beyerer, J.; Dachsbacher, C.
2018. 38th International Conference on Information Systems Architecture and Technology, ISAT 2017; Szklarska Poreba; Poland; 17 September 2017 through 19 September 2017. Ed.: L. Borzemski, 326–335, Springer. doi:10.1007/978-3-319-67220-5_30
Performance Characterization in Automated Optical Inspection using CAD Models and Graphical Simulations
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2016. XXX. Messtechnisches Symposium, Hannover, 15. - 16. September 2016, 141–150, Oldenbourg Verlag. doi:10.1515/9783110494297-019
Image formation simulation for computer-aided inspection planning of machine vision systems
Irgenfried, S.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2017. Automated Visual Inspection and Machine Vision II - SPIE Optical Metrology, Munich, Germany, 25 - 29 June 2017. Ed.: J. Beyerer, 1033406, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2269166
Compressive shape from focus based on a linear measurement model = Komprimierte Tiefenmessung mit variablem Fokus auf Basis eines linearen Messmodells
Luo, D.; Längle, T.; Beyerer, J.
2017. Technisches Messen, 84 (7-8), 452–459. doi:10.1515/teme-2017-0007
Expert-based probabilistic modeling of workflows in context of surgical interventions
Philipp, P.; Beyerer, J.; Fischer, Y.
2017. 2017 IEEE Conference on Cognitive and Computational Aspects of Situation Management (CogSIMA), Savannah, Georgia, USA, 27-31 March 2017, Art. Nr. 7929589, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/COGSIMA.2017.7929589
Real-time motion prediction using the chromatic offset of line scan cameras
Pfaff, F.; Maier, G.; Aristov, M.; Noack, B.; Gruna, R.; Hanebeck, U. D.; Längle, T.; Beyerer, J.; Pieper, C.; Kruggel-Emden, H.; Wirtz, S.; Scherer, V.
2017. Automatisierungstechnik, 65 (6), 369–380. doi:10.1515/auto-2017-0009
CAD-basierter Workflow für den semi-automatischen Entwurf optischer Inspektionssysteme [CAD based workflow for semi-automatic design of optical inspection systems]
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.
2017. Automatisierungstechnik, 65 (6), 426–439. doi:10.1515/auto-2017-0044
A quantitative risk model for a uniform description of safety and security
Beyerer, J.; Geisler, J.
2015. Proceedings of the 10th Future Security - Security Research Conference "Future Security", Berlin, 10, 2015, 317–324, Fraunhofer Verlag
A Framework for a Uniform Quantitative Description of Risk with Respect to Safety and Security
Beyerer, J.; Geisler, J.
2016. European Journal for Security Research, 1 (2), 135–150. doi:10.1007/s41125-016-0008-y
Residual vs. Inception vs. classical networks for low-resolution face recognition
Herrmann, C.; Willersinn, D.; Beyerer, J.
2017. Image Analysis : Proceedings of the 20th Scandinavian Conference, SCIA 2017, Part II, Tromso, Norway, 12th - 14th June 2017, 377–388, Springer. doi:10.1007/978-3-319-59129-2_32
General Cramér-von Mises, a Helpful Ally for Transparent Object Inspection Using Deflection Maps?
Meyer, J.; Längle, T.; Beyerer, J.
2017. Image Analysis : Proceedings of the 20th Scandinavian Conference (SCIA 2017) Part I, Tromso, Norway, 12-14 June 2017. Ed.: P. Sharma, 526–537, Springer. doi:10.1007/978-3-319-59126-1_44
Probabilistic surface inference for industrial inspection planning
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2017. 17th IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, United States, 24. - 31. March, 2017, 1008–1016, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.117
Robust 3D Patch-Based Face Hallucination
Qu, C.; Herrmann, C.; Monari, E.; Schuchert, T.; Beyerer, J.
2017. WACV : Proceedings of the 2017 IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, USA, 24-31 March 2017, 1105–1114, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.128
Automatische Sichtprüfung-Grundlagen, Methoden und Praxis der Bildgewinnung und Bildauswertung
Beyerer, J.; Puente León, F.; Frese, C.
2016. Springer-Verlag. doi:10.1007/978-3-662-47786-1
Machine vision: Automated visual inspection: Theory, practice and applications
Beyerer, J.; Puente León, F.; Frese, C.
2016. Springer-Verlag. doi:10.1007/978-3-662-47794-6
Ortsaufgelöste optische Bestimmung von Materialanteilen in Mischungen
Bauer, S.; Krippner, W.; Luo, D.; Taphanel, M.; Abdo, M.; Badilita, V.; Längle, T.; Beyerer, J.; Korvink, J.; Puente León, F.
2016. XXX. Messtechnisches Symposium, Hannover, 15. – 16. September 2016, Hrsg.: S. Zimmermann, 69–76, Oldenbourg Verlag
A Phenomenological Approach to Integrating Gaussian Beam Properties and Speckle into a Physically-Based Renderer
Bergmann, S.; Mohammadikaji, M.; Irgenfried, S.; Wörn, H.; Beyerer, J.; Dachsbacher, C.
2016. VMV 2016 : 21th International Symposium on Vision, Modeling and Visualization, Bayreuth, Germany, 10-12 October 2016. Ed.: M. Hullin, 179–186, Eurographics Association. doi:10.2312/vmv.20161357
Privacy-Dashcam - Datenschutzfreundliche Dashcams durch Erzwingen externer Anonymisierung
Wagner, P.; Birnstill, P.; Krempel, E.; Bretthauer, S.; Beyerer, J.
2016. Informatik 2016 - Tagung vom 26.-30. September 2016 in Klagenfurt. Hrsg.: H. C. Mayr, 427–440, Gesellschaft für Informatik (GI)
Knowing when you don’t: Bag of visual words with reject option for automatic visual inspection of bulk materials
Richter, M.; Langle, T.; Beyerer, J.
2017. 23rd International Conference on Pattern Recognition, ICPR 2016, Cancun, Mexico, 4th - 8th December 2016, 3079–3084, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPR.2016.7900107
How is Positive-Sum Privacy Feasible?
Bier, C.; Birnstill, P.; Krempel, E.; Vagts, H.; Beyerer, J.
2012. Future Security : 7th Security Research Conference, Bonn, Germany, September 4-6, 2012. Ed.: N. Aschenbruck, 265–268, Springer-Verlag. doi:10.1007/978-3-642-33161-9_39
Enhancing Privacy by Design From a Developer’s Perspective
Bier, C.; Birnstill, P.; Krempel, E.; Vagts, H.; Beyerer, J.
2014. Privacy technologies and policy : revised selected papers - First Annual Privacy Forum (APF), Limassol, Cyprus, October 10 - 11, 2012. Ed.: B. Preneel, 73–85, Springer-Verlag
Programmable light source based on an echellogram of a supercontinuum laser
Luo, D.; Taphanel, M.; Längle, T.; Beyerer, J.
2017. Applied optics, 56 (8), 2359–2367. doi:10.1364/AO.56.002359
Optical unmixing using programmable spectral source based on DMD
Luo, D.; Bauer, S.; Taphanel, M.; Längle, T.; Puente León, F.; Beyerer, J.
2016. Next-Generation Spectroscopic Technologies IX; Baltimore; United States; 18 April 2016 through 19 April 2016, Art. Nr.: 98550P, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2228303
Fast multitarget tracking via strategy switching for sensor-based sorting
Maier, G.; Pfaff, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Langle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2016. 2016 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI), Baden-Baden, Germany, 19–21 September 2016, 505–510, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2016.7849538
Simulation-based evaluation of predictive tracking for sorting bulk materials
Pfaff, F.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Langle, T.; Beyerer, J.
2016. 2016 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI), Baden-Baden, Germany, 19–21 September 2016, 511–516, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2016.7849539
Low-resolution video face recognition with face normalization and feature adaptation
Herrmann, C.; Qu, C.; Beyerer, J.
2016. 4th IEEE International Conference on Signal and Image Processing Applications, ICSIPA 2015; Pullman BangsarKuala Lumpur; Malaysia; 19 October 2015 through 21 October 2015, 89–94, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICSIPA.2015.7412169
Framework for an Interactive Assistance in Diagnostic Processes Based on the Translation of UML Activities into Petri Nets
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.
2016. Proceedings - 2015 International Conference on Computational Science and Computational Intelligence, CSCI 2015; Las Vegas; United States; 7 December 2015 through 9 December 2015, 732–737, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI.2015.110
A survey on moving object detection for wide area motion imagery
Sommer, L. W.; Teutsch, M.; Schuchert, T.; Beyerer, J.
2016. IEEE Winter Conference on Applications of Computer Vision, WACV 2016; Lake Placid; United States; 7 March 2016 through 10 March 2016, Art. Nr.: 7477573, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2016.7477573
Lightweight, non-invasive collection of steering wheel angles and pedal positions
Ruf, M.; Ziehn, J. R.; German, L.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.
2017. Proceedings of the 2016 International Conference on Instrumentation, Control and Automation, Bandung, West Java, RI, August 29-31, 2016, 189–196, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICA.2016.7811499
A tractable interaction model for trajectory planning in automated driving
Ziehn, J. R.; Ruf, M.; Willersinn, D.; Rosenhahn, B.; Beyerer, J.; Gotzig, H.
2016. 2016 IEEE 19th International Conference on Intelligent Transportation Systems (ITSC), Windsor Oceanico Hotel, Rio de Janeiro, Brazil, 1. -4. November, 2016, 1410–1417, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ITSC.2016.7795742
Real-Time person detection in low-resolution thermal infrared imagery with MSER and CNNs
Herrmann, C.; Müller, T.; Willersinn, D.; Beyerer, J.
2016. Electro-Optical and Infrared Systems: Technology and Applications XIII. Ed.: D.A. Huckridge, 99870I, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2240940
Generating object proposals for improved object detection in aerial images
Sommer, L. W.; Schuchert, T.; Beyerer, J.
2016. Electro-Optical Remote Sensing X, Edingburgh, UK, September 26,2016. Ed.: G. Kamerman, Article: 99880N, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2241527
Low-Quality Video Face Recognition with Deep Networks and Polygonal Chain Distance
Herrmann, C.; Willersinn, D.; Beyerer, J.
2016. International Conference on Digital Image Computing: Techniques and Applications (DICTA), November 30 - December 2, 2016, 7797061, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/DICTA.2016.7797061
Acquiring and processing light deflection maps for transparent object inspection
Meyer, J.; Langle, T.; Beyerer, J.
2016. 2nd International Conference on Frontiers of Signal Processing (ICFSP), Warsaw, PL, October 15-17, 2016, 104–109, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICFSP.2016.7802965
About acquiring and processing light transport matrices for transparent object inspection
Meyer, J.; Längle, T.; Beyerer, J.
2016. Technisches Messen, 83 (12), 731–738. doi:10.1515/teme-2016-0042
Capturing ground truth super-resolution data
Qu, C.; Luo, D.; Monari, E.; Schuchert, T.; Beyerer, J.
2016. IEEE International Conference on Image Processing (ICIP), Phoenix, AZ, USA, 25–28 September 2016, 2812–2816, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP.2016.7532872
Numerical investigation of optical sorting using the discrete element method
Pieper, C.; Kruggel-Emden, H.; Wirtz, S.; Scherer, V.; Pfaff, F.; Noack, B.; Hanebeck, U. D.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.
2017. 7th International Conference on Discrete Element Methods, DEM7 2016, Dalian, China, 2016, 1 - 4 August, 1105–1113, Springer. doi:10.1007/978-981-10-1926-5_115
Improving optical sorting of bulk materials using sophisticated motion models
Pfaff, F.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Längle, T.; Beyerer, J.
2016. Technisches Messen, 83 (2), 77–84. doi:10.1515/teme-2015-0108
Low-resolution Convolutional Neural Networks for video face recognition
Herrmann, C.; Willersinn, D.; Beyerer, J.
2016. 13th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Colorado Springs, CO, USA, 23–26 August 2016, 221–227, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2016.7738017
Compressive shape from focus based on a linear measurement model
Luo, D.; Längle, T.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 185–195, KIT Scientific Publishing
Extended photometric stereo model
Stephan, T.; Dürrwang, J.; Burke, J.; Werling, S.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, KIT Scientific Publishing
Erfassung und Verarbeitung von Lichttransportmatrizen zur automatischen Sichtprüfung transparenter Objekte = Acquisition and processing of light transport matrices for automated transparent object inspection
Meyer, J.; Längle, T.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 75–86, KIT Scientific Publishing
Combining synthetic image acquisition and machine learning: accelerated design and deployment of sorting systems
Retzlaff, M.-G.; Richter, M.; Thomas Längle; Beyerer, J.; Dachsbacher, C.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 49–61, KIT Scientific Publishing
Quantitative Assessment of Anomaly Detection Algorithms in Annotated Datasets from the Maritime Domain
Anneken, M.; Fischer, Y.; Beyerer, J.
2016. Intelligent Systems and Applications. Extended and Selected Results from the SAI Intelligent Systems Conference (IntelliSys), London, UK, 10-11 November 2015. Ed.: Y. Bi, 89–107, Springer-Verlag. doi:10.1007/978-3-319-33386-1_5
Motion segmentation and appearance change detection based 2D hand tracking
Hammer, J. H.; Voit, M.; Beyerer, J.
2016. 19th International Conference on Information Fusion (FUSION), Heidelberg, Germany, 5-8 July 2016, 1743–1750, Institute of Electrical and Electronics Engineers (IEEE)
Iris tracking using extended object tracking
Dunau, P.; Beyerer, J.
2016. 19th International Conference on Information Fusion (FUSION), Heidelberg, Germany, 5-8 July 2016, 1735–1742, Institute of Electrical and Electronics Engineers (IEEE)
Interacting with target tracking algorithms in a gaze-enhanced motion video analysis system
Hild, J.; Krüger, W.; Heinze, N.; Peinsipp-Byma, E.; Beyerer, J.
2016. Geospatial Informatics, Fusion, and Motion Video Analytics VI, Baltimore, MD, April 19-21, 2016. Ed.: M.F. Pellechia, 98410K/1–9, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2223726
An efficient heuristical Bayesian optimization approach for a multispectral camera
Taphanel, M.; Beyerer, J.
2015. Technisches Messen, 82 (2), 94–101. doi:10.1515/teme-2014-0006
Numerical modeling of an automated optical belt sorter using the Discrete Element Method
Pieper, C.; Maier, G.; Pfaff, F.; Kruggel-Emden, H.; Wirtz, S.; Gruna, R.; Noack, B.; Scherer, V.; Längle, T.; Beyerer, J.; Hanebeck, U. D.
2016. Powder technology, 301, 805–814. doi:10.1016/j.powtec.2016.07.018
Extending adaptive world modeling by identifying and handling insufficient knowledge models
Kuwertz, A.; Beyerer, J.
2016. Journal of applied logic, 19 (2), 102–127. doi:10.1016/j.jal.2016.05.005
Industrie 4.0 : (Editorial)
Beyerer, J.; Jasperneite, J.; Sauer, O.
2015. Automatisierungstechnik, 63 (10), 751–752. doi:10.1515/auto-2015-0068
Large scale classification of spectral signatures
Richter, M.; Laengle, T.; Beyerer, J.
2015. Technisches Messen, 82 (12), 663–671. doi:10.1515/teme-2015-0040
Framework for an Interactive Assistance in Diagnostic Processes Based on Probabilistic Modeling of Clinical Practice Guidelines
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.
2016. Emerging Trends in Applications and Infrastructures for Computational Biology, Bioinformatics, and Systems Biology: Systems and Applications. Ed.: Q.-N. Tran, 371–390, Morgan Kaufmann Publishers. doi:10.1016/B978-0-12-804203-8.00026-2
Moving target acquisition by gaze pointing and button press using hand or foot
Hild, J.; Petersen, P.; Beyerer, J.
2016. Ninth Biennial ACM Symposium on Eye Tracking Research & Applications (ETRA ’16), 257–260, Association for Computing Machinery (ACM). doi:10.1145/2857491.2857535
Gaze-based moving target acquisition in real-time full motion video
Hild, J.; Kühnle, C.; Beyerer, J.
2016. Ninth Biennial ACM Symposium on Eye Tracking Research & Applications, ETRA 2016; Charleston; United States; 14 - 17 March 2016. Vol. 14, 241–244, Association for Computing Machinery (ACM). doi:10.1145/2857491.2857525
Scanning infrared deflectometry for the inspection of diffusely reflecting surfaces = Scannende Infrarotdeflektometrie für die Inspektion diffus spiegelnder Oberflächen
Höfer, S.; Beyerer, J.
2016. tm - Technisches Messen, 83 (6), 374–385. doi:10.1515/teme-2016-0004
Anomaly detection using B-spline control points as feature space in annotated trajectory data from the maritime domain
Anneken, M.; Fischer, Y.; Beyerer, J.
2016. ICAART 2016 - Proceedings of the 8th International Conference on Agents and Artificial Intelligence, Rome; Italy; 24 February 2016 through 26 February 2016, Vol.2. Ed.: J.Filipe, 250–257, SciTePress. doi:10.5220/0005655302500257
TrackSort: Predictive Tracking for Sorting Uncooperative Bulk Materials
Pfaff, F.; Baum, M.; Noack, B.; Hanebeck, U. D.; Gruna, R.; Längle, T.; Beyerer, J.
2015. Proceedings of the 2015 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI 2015), 14-16 Sept. 2015, San Diego, CA, USA, 7–12, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2015.7295737
Sichtbarkeit von Dellen und Beulen auf spiegelnden Oberflächen
Ziebarth, M.; Heizmann, M.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 153–165, KIT Scientific Publishing
Segmentierung unterschiedlich stark ausgeprägter Welligkeiten auf lackierten Oberflächen
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 129–140, KIT Scientific Publishing
Parameter-learning for color sorting of bulk materials using genetic algorithms
Richter, M.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 107–118, KIT Scientific Publishing
Multimodale Interaktion
Beyerer, J.; Peinsipp-Byma, E.; Stiefelhagen, R.
2013. at-Automatisierungstechnik, 61 (11), 727–728. doi:10.1524/auto.2013.9011
Fast Face Recognition by Using an Inverted Index
Herrmann, C.; Beyerer, J.
2015. Image Processing: Machine Vision Applications VIII; 10 February 2015 through 11 February 2015, San Francisco, California, United States. Ed.: E. Y. Lam, Art.Nr. 940507, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2078988
Towards Web-based Semantic Knowledge Completion for Adaptive World Modeling in Cognitive Systems
Kuwertz, A.; Goldbeck, C.; Hug, R.; Beyerer, J.
2015. Proceedings of the UKSIM-AMSS; 17th International Conference on Modelling and Simulation (UKSim2015) 2015, 25 - 27 March 2015, Cambridge, UK. Ed.: D. Al-Dabass, 165–170, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/UKSim.2015.66
Approaches to Acoustic and Visual Underwater Sensing
Woock, P.; Stephan, T.; Beyerer, J.
2015. at - Automatisierungstechnik, 63 (5), 334–343
Visual words for automated visual inspection of bulk materials
Richter, M.; Längle, T.; Beyerer, J.
2015. Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015, 18-22 May 2015, Tokyo, Japan, 210–213, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MVA.2015.7153169
Face Retrieval on Large-Scale Video Data
Herrmann, C.; Beyerer, J.
2015. 12th Conference on Computer and Robot Vision (CRV), 2015, 3 June 2015 through 5 June 2015, Halifax, Canada, 192–199, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CRV.2015.32
Multiplex acquisition approach for high speed 3D measurements with a chromatic confocal microscope
Taphanel, M.; Zink, R.; Längle, T.; Beyerer, J.
2015. Optical Measurement Systems for Industrial Inspection IX, 22 - 25 June 2015, Munich, Germany. Ed.: P. Lehmann, 95250Y, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2184560
Seafloor heightmap generation using 1D Kernel Reconstructions
Woock, P.; Beyerer, J.
2015. Proceedings of the 3rd Underwater Acoustics Conference and Exhibition, UACE 2015: 21-26 June 2015, Platanias, Crete, Greece, 717–725
Integrating Microscopic Analysis into Existing Quality Assurance Processes
Frühberger, P.; Stephan, T.; Beyerer, J.
2015. 2nd International Multidisciplinary Microscopy and Microanalysis Congress : Proceedings of InterM, October 16-19, 2014. Ed.: E.K. Polychroniadis, 57–64, Springer International Publishing. doi:10.1007/978-3-319-16919-4_8
Plug&Produce by Modelling Skills and Service-Oriented Orchestration of Reconfigurable Manufacturing Systems = Plug & Produce mittels der Modellierung von Fähigkeiten und der service-orientierten Orchestrierung rekonfigurierbarer Produktionssysteme
Pfrommer, J.; Stogl, D.; Aleksandrov, K.; Escaida Navarro, S.; Hein, B.; Beyerer, J.
2015. at - Automatisierungstechnik, 63 (10), 790–800. doi:10.1515/auto-2014-1157
Modeling of Expert Knowledge for Maritime Situation Assessment
Fischer, Y.; Beyerer, J.
2013. International Journal on Advances in Systems and Measurement, 8 (3-4), 245–259
Segmentierung unterschiedlich stark ausgeprägter Welligkeiten auf lackierten Oberflächen
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.
2014. tm - Technisches Messen, 81 (12), 644–651. doi:10.1515/teme-2014-1055
Data-Driven Methods for the Detection of Causal Structures in Process Technology
Kühnert, C.; Beyerer, J.
2014. Machines, 2 (4), 255–274. doi:10.3390/machines2040255
An approach to color-based sorting of bulk materials with automated estimation of system parameters
Richter, M.; Längle, T.; Beyerer, J.
2015. tm -Technisches Messen, 82 (3), 135–144. doi:10.1515/teme-2014-0042
Paper O. Bayesian Active Object Recognition via Gaussian Process Regression. Edited version of the paper: M. F. Huber, T. Dencker, M. Roschani, and J. Beyerer. Bayesian Active Object Recognition via Gaussian Process Regression. In Proceedings of the 15th International Conference on Information Fusion (Fusion), pages 1718-1725, Singapore, July 2012
Huber, M. F.; Dencker, T.; Roschani, M.; Beyerer, J.
2015. Nonlinear Gaussian Filtering : Theory, Algorithms, and Applications. Ed.: M. Huber, 530–551, Karlsruher Institut für Technologie (KIT)
AutomationML to describe skills of production plants based on the PPR concept
Schleipen, M.; Pfrommer, J.; Stogl, D.; Hein, B.; Aleksandrov, K.; Escaida Navarro, S.; Beyerer, J.
2014. 3rd AutomationML User Conference, Blumberg, October 7-8, 2014
Begrifflichkeiten um Industrie 4.0 - Ordnung im Sprachwirrwarr
Pfrommer, J.; Schleipen, M.; Usländer, T.; Epple, U.; Heidel, R.; Urbas, L.; Sauer, O.; Beyerer, J.
2014. 13. Fachtagung Entwurf komplexer Automatisierungssysteme (EKA’14), Magdeburg, 14.-15. Mai 2014. Hrsg.: U. Jumar, CD-ROM, Universität Magdeburg
TAM-VS: A Technology Acceptance Model for Video Surveillance
Krempel, E.; Beyerer, J.
2014. Privacy Technologies and Policy - 2nd Annual Privacy Forum (APF’14), Athens, Greece, May 20-21, 2014. Ed.: B. Preneel, 86–100, Springer US. doi:10.1007/978-3-319-06749-0_6
Comparing mouse and MAGIC pointing for moving target acquisition
Hild, J.; Gill, D.; Beyerer, J.
2014. 8th ACM Symposium on Eye Tracking Research & Applications (ETRA’14), Safety Harbor, Florida/USA, March 26-28, 2014, 131–134, Association for Computing Machinery (ACM). doi:10.1145/2578153.2578172
Privacy-aware smart video surveillance revisited
Fischer, Y.; Krempel, E.; Birnstill, P.; Unmüßig, G.; Monari, E.; Moßgraber, J.; Schenk, M.; Beyerer, J.
2014. 9th Security Research Conference ’Future Security’, Berlin, September 16-18, 2014. Ed.: K. Thoma, 91–99, Fraunhofer Verlag
Modeling and recognizing situations of interest in surveillance applications
Fischer, Y.; Reiswich, A.; Beyerer, J.
2014. IEEE International Inter-Disciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support (CogSIMA’14), San Antonio, Texas/USA, March 3-6, 2014, 209–215, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CogSIMA.2014.6816564
Innovative Informationstechnik revolutioniert die Industrie: Aus der Fraunhofer-Forschung
Bauernhansl, T.; Beyerer, J.; Ten Hompel, M.
2014. Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung e.V. - Jahresbericht 2013, 58–69, Fraunhofer Verlag
Maximizing face recognition performance for video data under time constraints by using a cascade
Herrmann, C.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 181–186, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918665
Dealing with poorly mapped entities in adaptive object-oriented world modeling
Kuwertz, A.; Beyerer, J.
2014. IEEE International Interdisciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support (CogSIMA’14), San Antonio, Texas/USA, March 3-6, 2014, 83–89, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CogSIMA.2014.6816545
Optical filter selection for automatic visual inspection
Richter, M.; Beyerer, J.
2014. IEEE Winter Conference on Applications of Computer Vision (WACV’14), Steamboat Springs, Colorado/USA, March 24-26, 2014, 123–128, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2014.6836110
Situation prediction and reaction control (SPARC): Patent pending
Ruf, M.; Ziehn, J. R.; Rosenhahn, B.; Beyerer, J.; Willersinn, D.; Gotzig, H.
2014. 9. Workshop Fahrerassistenzsysteme (FAS’14), Walting im Altmühltal, 26.-28. März 2014, 55–66, Fraunhofer Verlag
Realistic heatmap visualization for interactive analysis of 3D gaze data
Maurus, M.; Hammer, J. H.; Beyerer, J.
2014. Conference on Eye Tracking Research and Applications (ETRA’14), Safety Harbor, Florida/USA, March 26-28, 2014, 295–298, Association for Computing Machinery (ACM). doi:10.1145/2578153.2578204
Low Resolution Person Detection with a Moving Thermal Infrared Camera by Hot Spot Classification
Teutsch, M.; Mueller, T.; Huber, M.; Beyerer, J.
2014. IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW’14), Columbus, Ohio/USA, June 23-28, 2014, 209–216, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW.2014.40
Evaluation of an Analytic Model for Car Dynamics
Ruf, M.; Ziehn, J. R.; Rosenhahn, B.; Beyerer, J.; Willersinn, D.; Grotzig, H.
2014. International Conference on Mechatronics and Control (ICMC’14), Jinzhou, China, July 3-5, 2014
Evaluation of object segmentation to improve moving vehicle detection in aerial videos
Teutsch, M.; Kruger, W.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 265–270, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918679
Introducing CAM - Constant Action Movie
Stephan, T.; Richter, M.; Beyerer, J.
2014. 9. Sicherheitsforschungskonferenz ’Future Security’, Berlin, 16.-18. September 2014
Microscopic Analysis Using Gaze-Based Interaction
Frühberger, P.; Klaus, E.; Beyerer, J.
2014. International Multidisciplinary Microscopy Congress - Proceedings of InterM, Antalya, Turkey, October 1013, 2013. Ed.: E.K. Polychroniadis, 195–200, Springer-Verlag. doi:10.1007/978-3-319-04639-6_27
Fast, robust and automatic 3D face model reconstruction from videos
Chengchao, Q.; Monari, E.; Schuchert, T.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 113–118, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918653