Prof. Dr.-Ing. Jürgen Beyerer
- Office Hours:
nach Vereinbarung; bitte Sekretariat des Lehrstuhls kontaktieren
- Phone: +49 721 608-45911
- Fax: +49 721 608-45926
- juergen beyerer ∂ iosb fraunhofer de
Karlsruher Institut für Technologie – KIT
Institut für Anthropomatik und Robotik (IAR)
Lehrstuhl für Interaktive Echtzeitsysteme (IES)
Prof. Dr.- Ing. Jürgen Beyerer
Vincenz-Prießnitz-Straße 3
76131 Karlsruhe
Lebenslauf
Prof. Dr.-Ing. Jürgen Beyerer ist Inhaber des 2004 eingerichteten Lehrstuhls für Interaktive Echtzeitsysteme an der Fakultät für Informatik. Gleichzeitig ist er Leiter des Fraunhofer-Instituts für Optronik, Systemtechnik und Bildauswertung (IOSB) in Karlsruhe (bis 2009: Fraunhofer IITB).
Prof. Beyerer studierte von 1984 bis 1989 Elektrotechnik an der Universität Karlsruhe und promovierte 1994 am Institut für Mess- und Regelungstechnik (MRT) bei Prof. Franz Mesch mit einer Arbeit zur Texturanalyse, die 1995 mit dem Messtechnikpreis des AHMT (Arbeitskreis der Hochschullehrer für Messtechnik e.V.) ausgezeichnet wurde. Anschließend baute er eine Forschungsgruppe zum Thema Automatische Sichtprüfung und Bildverarbeitung am gleichen Institut auf. 1999 habilitierte er sich für das Fach Messtechnik mit einer Arbeit zum Thema der Nutzung von Vorwissen in der Messtechnik. Von 1999 bis 2004 leitete er das Mannheimer Mittelstands-Unternehmen Hottinger Systems GmbH (heute: inspectomation GmbH ) und war stellvertretender Geschäftsführer des Schwesterunternehmens Hottinger Maschinenbau GmbH.
Lehrstuhl und Fraunhofer IOSB arbeiten inhaltlich eng zusammen. Damit lassen sich Synergieeffekte, die in der eher grundlagenorientierten Herangehensweise am Lehrstuhl und der anwendungsorientierten Ausrichtung des IOSB liegen, optimal erschließen. Daneben fördert eine enge Kooperation die Gewinnung erstklassiger Nachwuchswissenschaftler für das Fraunhofer IOSB.
Publikationsliste 1499
Hofmann, C.; Staab, S.; Selzer, M.; Neumann, G.; Furmans, K.; Heizmann, M.; Beyerer, J.; Lanza, G.; Pfrommer, J.; Düser, T.; Klein, J.-F.
2024. at - Automatisierungstechnik, 72 (9), 875–883. doi:10.1515/auto-2024-0006
Sielemann, A.; Wolf, S.; Roschani, M.; Ziehn, J.; Beyerer, J.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), Yokohama, 13th-17th May 2024, 9146 – 9153, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10610650
Wolf, S.; Thelen, P.; Beyerer, J.
2024. CLEF 2024 - CLEF 2024 Working Notes : Working Notes of the Conference and Labs of the Evaluation Forum (CLEF 2024) Grenoble, France, 9-12 September, 2024. Ed. : G. Faggioli, N. Ferro, P. Galuščáková, A. García Seco de Herrera, 2260 – 2266, CEUR-WS
Heizmann, M.; Beyerer, J.; Dietrich, S.; Hoffmann, L.; Kaiser, J.-P.; Lanza, G.; Roitberg, A.; Stiefelhagen, R.; Stricker, N.; Wexel, H.; Zanger, F.
2024. at - Automatisierungstechnik, 72 (9), 829–843. doi:10.1515/auto-2024-0009
Schneider, D.; Keller, M.; Zhong, Z.; Peng, K.; Roitberg, A.; Beyerer, J.; Stiefelhagen, R.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), 13038–13045, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10611486
Becker, M.; Vishwesh, V.; Birnstill, P.; Schwall, F.; Wu, S.; Beyerer, J.
2024. 2023 IEEE International Conference on Data Mining Workshops (ICDMW), Shanghai, 1st-4th December 2023, 875–884, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00118
Becker, M.; Toprak, E.; Beyerer, J.
2023. 23rd IEEE International Conference on Data Mining Workshops : 1-4 December 2023, Shanghai, China : proceedings. Ed.: J. Wang, 885–893, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00119
Neis, N.; Beyerer, J.
2024. IEEE Open Journal of Intelligent Transportation Systems. doi:10.1109/OJITS.2024.3435078
Wagner, P. G.; Birnstill, P.; Beyerer, J.
2024. Proceedings of the 19th International Conference on Availability, Reliability and Security, Art.-Nr.: 159, Association for Computing Machinery (ACM). doi:10.1145/3664476.3670442
Zander, T.; Wohnig, J.; Beyerer, J.
2024. 2024 IEEE International Conference on Advanced Robotics and Its Social Impacts (ARSO), 146 – 152, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ARSO60199.2024.10557807
Neis, N.; Beyerer, J.
2024. 2024 10th International Conference on Automation, Robotics and Applications (ICARA), 472 – 478, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICARA60736.2024.10553024
Wu, C.; Fu, H.; Kaiser, J.-P.; Barczak, E. T.; Pfrommer, J.; Lanza, G.; Heizmann, M.; Beyerer, J.
2024. Procedia CIRP, 122, 193 – 198. doi:10.1016/j.procir.2024.01.028
Wu, C.; Zheng, J.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Vancouver, 17th-24th June 2023, 2717–2726, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW59228.2023.00272
Wu, C.; Zheng, J.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, 17th - 24th June 2023, 5333–5343, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPR52729.2023.00516
Cormier, M.; Specker, A.; Jacques, J. C. S. Junior; Moritz, L.; Metzler, J.; Moeslund, T. B.; Nasrollahi, K.; Escalera, S.; Beyerer, J.
2024. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 359–367, Institute of Electrical and Electronics Engineers (IEEE)
Friederich, N.; Specker, A.; Beyerer, J.
2024. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 310–319, Institute of Electrical and Electronics Engineers (IEEE)
Specker, A.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 5442–5452, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW59228.2023.00575
Reith-Braun, M.; Bauer, A.; Staab, M.; Pfaff, F.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.; Kruggel-Emden, H.; Hanebeck, U. D.
2023. IFAC-PapersOnLine, 56 (2), 4620 – 4626. doi:10.1016/j.ifacol.2023.10.971
Wu, C.; Qiu, L.; Zhou, K.; Pfrommer, J.; Beyerer, J.
2023. Proceedings of the 18th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2023) - Volume 4, Lissabon, 19th-21st February 2023, 529 – 540, SciTePress. doi:10.5220/0011718400003417
Becker, M.; Schwall, F.; Vishwesh, V.; Wu, S.; Birnstill, P.; Beyerer, J.
2023. doi:10.5445/IR/1000167428
Becker, M.; Toprak, E.; Beyerer, J.
2023. doi:10.5445/IR/1000167427
Wu, C.; Pfrommer, J.; Zhou, M.; Beyerer, J.
2023. IEEE Transactions on Multimedia. doi:10.1109/TMM.2023.3338079
Friederich, N.; Specker, A.; Beyerer, J.
2023. arxiv. doi:10.48550/arXiv.2311.12064
Wolf, S.; Beyerer, J.
2023. Working Notes of the Conference and Labs of the Evaluation Forum (CLEF 2023), 2159 – 2167, CEUR-WS
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA), Sinaia, Romania, 12-15 September 2023, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETFA54631.2023.10275358
Kalb, T. M.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, Kanada, 18-22 June 2023, 19508 – 19518, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPR52729.2023.01869
Haas, C.; Bretthauer, G.; Beyerer, J.
2023. at - Automatisierungstechnik, 71 (9), 723–725. doi:10.1515/auto-2023-0141
Philipp, P.; Veloso, J.; Appenzeller, A.; Hartz, T.; Beyerer, J.
2022. 2022 International Conference on Computational Science and Computational Intelligence (CSCI), 1604 – 1609, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI58124.2022.00287
Rehak, J.; Sommer, A.; Becker, M.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), Lemgo, Germany, 17-20 July 2023, 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/INDIN51400.2023.10218245
Stadler, D.; Beyerer, J.
2023. 2023 IEEE International Conference on Image Processing (ICIP), Kuala Lumpur, Malaysia, 08-11 October 2023, 321–325, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP49359.2023.10223159
Wolf, S.; Koch, J.; Sommer, L.; Beyerer, J.
2023. 2023 IEEE 13th International Conference on Pattern Recognition Systems (ICPRS), 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPRS58416.2023.10179055
Specker, A.; Beyerer, J.
2023. 2023 IEEE 13th International Conference on Pattern Recognition Systems (ICPRS), 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPRS58416.2023.10178990
Appenzeller, A.; Balduf, F.; Beyerer, J.
2023. Proceedings of the 16th International Conference on PErvasive Technologies Related to Assistive Environments, 206–214, Association for Computing Machinery (ACM). doi:10.1145/3594806.3594816
Stadler, D.; Beyerer, J.
2023. Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges. Part I. Ed.: J.-J. Rousseau, 79–94, Springer. doi:10.1007/978-3-031-37660-3_6
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. doi:10.48550/arXiv.2305.03175
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. Tools for Design, Implementation and Verification of Emerging Information Technologies – 17th EAI International Conference, TridentCom 2022, Melbourne, Australia, November 23-25, 2022, Proceedings. Ed.: S. Yu, 3 – 19, Springer Nature Switzerland. doi:10.1007/978-3-031-33458-0_1
Maier, G.; Reith-Braun, M.; Bauer, A.; Gruna, R.; Pfaff, F.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Beyerer, J.
2023. tm - Technisches Messen, 90 (7-8), 489–499. doi:10.1515/teme-2023-0033
Stadler, D.; Beyerer, J.
2023. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops
Appenzeller, A.; Terzer, N.; Philipp, P.; Beyerer, J.
2023. 2023 IEEE International Conference on Pervasive Computing and Communications Workshops and other Affiliated Events (PerCom Workshops), 608–613, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/PerComWorkshops56833.2023.10150373
Zander, T.; Pan, Z.; Birnstill, P.; Beyerer, J.
2023. tm - Technisches Messen, 90 (7-8), 478–488. doi:10.1515/teme-2023-0010
Kronenwett, F.; Klingenberg, P.; Maier, G.; Längle, T.; Metzsch-Zilligen, E.; Beyerer, J.
2023. OCM 2023 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; T. Längle; M. Heizmann, 51 – 63, KIT Scientific Publishing
Bäcker, P.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.
2023. OCM 2023 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; T. Längle; M. Heizmann, 11 – 21, KIT Scientific Publishing
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2023. OCM 2023, Optical Characterization of Materials. Conference Proceedings, 119 – 128, KIT Scientific Publishing
Ziehn, J. R.; Baumann, M. V.; Beyerer, J.; Buck, H. S.; Deml, B.; Ehrhardt, S.; Frese, C.; Kleiser, D.; Lauer, M.; Roschani, M.; Ruf, M.; Stiller, C.; Vortisch, P.
2023. 35th IEEE Intelligent Vehicles Symposium (IV 2023), Anchorage, AK, USA, June 4-7, 2023
Kalb, T. M.; Beyerer, J.
2022. doi:10.48550/arXiv.2209.08010
Kalb, T. M.; Beyerer, J.
2023. Computer Vision – ACCV 2022 – 16th Asian Conference on Computer Vision, Macao, China, December 4–8, 2022, Proceedings, Part VII. Ed.: L. Wang, 361–377, Springer Nature Switzerland. doi:10.1007/978-3-031-26293-7_22
Specker, A.; Cormier, M.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), Waikoloa, HI, USA, 02-07 January 2023, 981–990, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/wacv56688.2023.00104
Wu, C.; Bi, X.; Pfrommer, J.; Cebulla, A.; Mangold, S.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 4520–4529, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV56688.2023.00451
Zhong, Z.; Schneider, D.; Voit, M.; Stiefelhagen, R.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 6057–6066, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV56688.2023.00601
Cormier, M.; Specker, A.; Jacques, J. C. S. Junior; Florin, L.; Metzler, J.; Moeslund, T. B.; Nasrollahi, K.; Escalera, S.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision Workshops (WACVW). IEEE Winter Conference on Applications of Computer Vision Workshops (WACVW 2023) Waikoloa, HI, USA, 03.01.2023–07.01.2023, 166–175, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW58289.2023.00022
Koch, J.; Wolf, S.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision Workshops (WACVW). IEEE Winter Conference on Applications of Computer Vision Workshops (WACVW 2023) Waikoloa, HI, USA, 03.01.2023–07.01.2023, 100–109, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW58289.2023.00015
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2023. Thin Solid Films, 769, Art.-Nr.: 139732. doi:10.1016/j.tsf.2023.139732
Petereit, J.; Bretthauer, G.; Beyerer, J.
2022. at - Automatisierungstechnik, 70 (10), 823–825. doi:10.1515/auto-2022-0121
Meier, D.; Vogl, J.; Kohnhäuser, F.; Beyerer, J.
2023. 2022 IEEE 17th Conference on Industrial Electronics and Applications (ICIEA), 144–149, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIEA54703.2022.10005899
Maier, G.; Reith-Braun, M.; Bauer, A.; Gruna, R.; Pfaff, F.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Beyerer, J.
2022. Forum Bildverarbeitung 2022. Ed.: T. Längle, 115–126, KIT Scientific Publishing
Zander, T.; Ziyan, P.; Birnstill, P.; Beyerer, J.
2022. Forum Bildverarbeitung 2022. Ed.: T. Längle, 49–59, KIT Scientific Publishing
Zhong, Z.; Schneider, D.; Voit, M.; Stiefelhagen, R.; Beyerer, J.
2023. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 6068–6077, Institute of Electrical and Electronics Engineers (IEEE)
Schumacher, P.; Gruna, R.; Langle, T.; Beyerer, J.
2022. 2022 12th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS), 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WHISPERS56178.2022.9955113
Appenzeller, A.; Leitner, M.; Philipp, P.; Krempel, E.; Beyerer, J.
2022. Applied Sciences, 12 (23), Article no: 12320. doi:10.3390/app122312320
Woock, P.; Petereit, J.; Frey, C.; Beyerer, J.
2022. at - Automatisierungstechnik, 70 (10), 827–837. doi:10.1515/auto-2022-0072
Specker, A.; Beyerer, J.
2022. 30th European Signal Processing Conference (EUSIPCO), 533–537
Golda, T.; Thiemich, J.; Cormier, M.; Beyerer, J.
2022. 29th IEEE International Conference on Image Processing (ICIP), 16th -19th October, Bordeaux, France, 3983–3987, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP46576.2022.9897358
Wiedemer, T.; Wolf, S.; Schumann, A.; Ma, K.; Beyerer, J.
2022. Proceedings 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW): New Orleans, Louisiana, 19–24 June 2022, 4141–4152, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW56347.2022.00459
Wolf, S.; Beyerer, J.
2022. CLEF 2022 Working Notes: Proceedings of the Working Notes of CLEF 2022 - Conference and Labs of the Evaluation Forum ; Bologna, Italy, September 5th to 8th, 2022. Ed.: G. Faggioli, 2219–2226, CEUR-WS.org
Specker, A.; Schumann, A.; Beyerer, J.
2020. 2020 IEEE International Conference on Image Processing (ICIP), 2331–2335, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP40778.2020.9191264
Specker, A.; Florin, L.; Cormier, M.; Beyerer, J.
2022. 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 3198–3208, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW56347.2022.00361
Schieber, H.; Duerr, F.; Schoen, T.; Beyerer, J.
2022. doi:10.48550/arXiv.2205.13629
Schieber, H.; Duerr, F.; Schoen, T.; Beyerer, J.
2022. 2022 IEEE Intelligent Vehicles Symposium (IV): 4–9 June 2022, Aachen, Germany, 375–381, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV51971.2022.9827113
Zhou, J.; Beyerer, J.
2022. 2022 IEEE Intelligent Vehicles Symposium (IV): 4–9 June 2022, Aachen, Germany, 997–1004, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV51971.2022.9827262
Wagner, P. G.; Beyerer, J.
2022. Proceedings of the 19th International Conference on Security and Cryptography - SECRYPT. Vol. 1. Ed.: S. De Capitani di Vimercati, 586–591, SciTePress. doi:10.5220/0011289000003283
Philipp, P.; Hempel, L.; Hempel, D.; Beyerer, J.
2021. 2021 International Conference on Computational Science and Computational Intelligence (CSCI): 15–17 December 2021, Las Vegas, NV, USA, 1163–1168, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI54926.2021.00244
Appenzeller, A.; Terzer, N.; Krempel, E.; Beyerer, J.
2022. The15th International Conference on PErvasive Technologies Related to Assistive Environments, 446–454, Association for Computing Machinery (ACM). doi:10.1145/3529190.3534768
Heizmann, M.; Beyerer, J.
2022. tm - Technisches Messen, 89 (2), 83–84. doi:10.1515/teme-2021-0138
Beyerer, J.; Bretthauer, G.; Hofmann, C.; Lanza, G.
2022. at - Automatisierungstechnik, 70 (6), 501–503. doi:10.1515/auto-2022-0063
Wu, C.; Zhou, K.; Kaiser, J.-P.; Mitschke, N.; Klein, J.-F.; Pfrommer, J.; Beyerer, J.; Lanza, G.; Heizmann, M.; Furmans, K.
2022. Procedia CIRP, 106, 138–143. doi:10.1016/j.procir.2022.02.168
Lanza, G.; Asfour, T.; Beyerer, J.; Deml, B.; Fleischer, J.; Heizmann, M.; Furmans, K.; Hofmann, C.; Cebulla, A.; Dreher, C.; Kaiser, J.-P.; Klein, J.-F.; Leven, F.; Mangold, S.; Mitschke, N.; Stricker, N.; Pfrommer, J.; Wu, C.; Wurster, M.; Zaremski, M.
2022. at - Automatisierungstechnik, 70 (6), 504–516. doi:10.1515/auto-2021-0158
Wagner, P. G.; Beyerer, J.
2022. Proceedings of the 2022 ACM Workshop on Secure and Trustworthy Cyber-Physical Systems (Sat-CPS’22), 67–76, Association for Computing Machinery (ACM). doi:10.1145/3510547.3517930
Appenzeller, A.; Hornung, M.; Kadow, T.; Krempel, E.; Beyerer, J.
2022. Technologies, 10 (1), Article no: 35. doi:10.3390/technologies10010035
Fraunhofer IOSB; Golda, T.; Cormier, M.; Beyerer, J.
2022. Handbuch Polizeimanagement – Polizeipolitik – Polizeiwissenschaft – Polizeipraxis. Ed.: D. Wehe, 1–21, Springer Fachmedien Wiesbaden. doi:10.1007/978-3-658-34394-1_87-1
Stadler, D.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 133–142, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00019
Chen, C.-W.; Zhou, B.; Längle, T.; Beyerer, J.
2021. International Optical Design Conference: in Proceedings OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT) ; 27 June–1 July 2021, Washington, DC, United States, Art.-Nr.: 120781B, Optica Publishing Group (OSA). doi:10.1117/12.2603658
Cormier, M.; Clepe, A.; Specker, A.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 591–601, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00065
Specker, A.; Moritz, L.; Cormier, M.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 570–580, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00063
Kimmig, A.; Schöck, M.; Mühlbeier, E.; Oexle, F.; Fleischer, J.; Bönsch, J.; Ovtcharova, J.; Hahn, J.; Grunwald, A.; Albers, A.; Rapp, S.; Hagenmeyer, V.; Scholz, S. G.; Schmidt, A.; Müller, T.; Becker, J.; Schade, F.; Beyerer, J.; Rehak, J.; Zwick, T.; Pauli, M.; Nuß, B.; Lanza, G.; Schild, L.; Overbeck, L.
2021. Zeitschrift für wirtschaftlichen Fabrikbetrieb, 116 (12), 935–939. doi:10.1515/zwf-2021-0207
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2021. Technisches Messen, 88 (s1), s48–s52. doi:10.1515/teme-2021-0069
Stadler, D.; Beyerer, J.
2021. 2021 17th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–12, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS52988.2021.9663836
Stadler, D.; Beyerer, J.
2021. 17th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–10, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS52988.2021.9663829
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2021. Proceedings of the International Optical Design Conference 2021. Ed.: P.P. Clark, 126 – 131, SPIE. doi:10.1117/12.2603633
Wolf, S.; Meier, J.; Sommer, L.; Beyerer, J.
2021. IEEE/CVF International Conference on Computer Vision Workshops (ICCVW), Montreal, BC, Canada 11th -17th October 2021, 721–731, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICCVW54120.2021.00086
Beyerer, J.
2021. Automatisierungstechnik, 69 (10), 917–918. doi:10.1515/auto-2021-0130
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2022. Applied Optics, 61 (3), A37-A42. doi:10.1364/AO.442084
Florin, L.; Specker, A.; Schumann, A.; Beyerer, J.
2021. 2021 IEEE 4th International Conference on Multimedia Information Processing and Retrieval (MIPR), 418–424, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MIPR51284.2021.00077
Kalb, T.; Roschani, M.; Ruf, M.; Beyerer, J.
2021. 2021 IEEE Intelligent Vehicles Symposium (IV): 11-17 July 2021, online, 1345–1351, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV48863.2021.9575493
Cormier, M.; Moshkenan, H. M.; Lörch, F.; Metzler, J.; Beyerer, J.
2021. 2021 IEEE 4th International Conference on Multimedia Information Processing and Retrieval (MIPR), 84–90, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MIPR51284.2021.00020
Becker, M.; Burkart, N.; Birnstill, P.; Beyerer, J.
2021. Advances in Artificial Intelligence and Machine Learning, 1 (2), 90–110. doi:10.54364/aaiml.2021.1107
Cormier, M.; Ropke, F.; Golda, T.; Beyerer, J.
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2021. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, 4168–4177, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW53098.2021.00471
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2021. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 10958–10967, Institute of Electrical and Electronics Engineers (IEEE)
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2020. 5th International Conference on Robotics and Automation Engineering (ICRAE 2020) : November 20-22, 2020, Singapore, 197–205, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRAE50850.2020.9310898
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2020. Forum Bildverarbeitung 2018 : [29.-30. Novemver 2018 in Karlsruhe] / herausgegeben von T. Längle, F. Puente León und M. Heizmann, 25, KIT Scientific Publishing
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2020. 2020 IEEE 25th International Conference on Emerging Technologies and Factory Automation (ETFA) : Technical University of Vienna, Vienna, Austria, 08-011September 2020 : proceedings / organized by: IEEE Industrial Electronics Society (IES), 270–277. doi:10.1109/ETFA46521.2020.9211904
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2020. 52nd International Symposium on Robotics : 9-10 December 2020, Online-Event, Germany, 1–8, VDE Verlag
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2021. Technisches Messen, 88 (5), 319–325. doi:10.1515/teme-2020-0103
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2021. OCM 2021 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; T. Längle, 45–55, Karlsruher Institut für Technologie (KIT)
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2020. HCI International 2020 - Posters – 22nd International Conference, HCII 2020, Copenhagen, Denmark, July 19–24, 2020, Proceedings, Part I. Ed.: C. Stephanidis, 535–542, Springer International Publishing. doi:10.1007/978-3-030-50726-8_70
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2021. 2020 Joint 9th International Conference on Informatics, Electronics & Vision (ICIEV) and 2020 4th International Conference on Imaging, Vision & Pattern Recognition (icIVPR), Kitakyushu, Japan, 26-29 Aug. 2020, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIEVicIVPR48672.2020.9306522
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2020. Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies IV, 21-25 September 2020 (Teilkonferenz von SPIE Security + Defence Digital Forum 2020). Ed.: H. Bouma, Art.-Nr.: 1154207, SPIE. doi:10.1117/12.2570824
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2020. SECRYPT 2020 : proceedings of the 17th International Conference on Security and Cryptography : July 8-10, 2020 (SECRYPT is part of ICETE, the 17th International Joint Conference on e-Business and Telecommunications). Vol. 3. Ed.: P. Samarati, 27–38, SciTePress. doi:10.5220/0009517800270038
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2018. Proceedings of the 8th IEEE Conference on Cognitive and Computational Aspects of Situation Management (CogSIMA 2018), Boston, MA, June 11-14, 2018. Ed.: O.E. Gundersen, 15–21, IEEE Computer Society. doi:10.1109/COGSIMA.2018.8423989
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2018. HIMS ’18 : proceedings of the 2018 International Conference on Health Informatics & Medical Systems : publication of the 2018 World Congress in Computer Science, Computer Engineering, & Applied Computing (CSCE ’18), July 30-August 02, 2018, Las Vegas, Nevada, USA. Ed: H. R. Arabnia, 83–89, CSREA Press
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2017. CAOS 2017, 17th Annual Meeting of the International Society for Computer Assisted Orthopaedic Surgery. Papers. Online resource : June 14-17, 2017, Aachen, Germany 2017. Ed.: K. Radermacher, 288–294
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2015. HIMS 2015 : proceedings of the 2015 International Conference on Health Informatics and Medical Systems : WORLDCOMP’15, July 27-30, 2015, Las Vegas, Nevada, USA. Ed.: H. R. Arabnia, 3–9, CSREA Press
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2019. atp Magazin, 61 (3), 76–86. doi:10.17560/atp.v61i3.2378
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2019. 6th Annual International Conference on Computational Science and Computational Intelligence, CSCI 2019; Las Vegas, 5th December 2019 - 7th December 2019, 972–976, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI49370.2019.00184
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2019. 6th Intl. Conference on Soft Computing & Machine Intelligence : (ISCMI 2019) : November 19-20, 2019, Johannesburg, South Africa, 73–77, Institute of Electrical and Electronics Engineers (IEEE)
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2019. Proceedings of the 16th International Conference on Machine Vision Applications : May 27-31, 2019, National Olympics Memorial Youth Center, Tokyo, Japan, 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.23919/MVA.2019.8757894
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2019. Automatisiertes Fahren, Tagung, München, 21. – 22. November 2019
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2019. 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) : Paraninfo Building, University of Zaragoza, Zaragoza, Spain, 10-13 September, 2019 : proceedings, 420–427, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETFA.2019.8869059
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2018. Pattern Recognition and Tracking XXIX : 18-19 April 2018, Orlando, Florida, United States. Ed.: Mohammad S. Alam, Art.Nr.: 1064902, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2305062
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2018. 2018 IEEE Winter Conference on Applications of Computer Vision - WACV 2018: 12-15 March 2018, Lake Tahoe, Nevada / general chairs: Gérard Medioni, Anthony Hoogs, Scott McCloskey, 626–634, Institute of Electrical and Electronics Engineers (IEEE)
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2019. IEEE International Symposium on Safety, Security, and Rescue Robotics (SSRR 2019), Würzburg, September 2-4, 2019, 249–255, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SSRR.2019.8848969
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2019. Photonics and Education in Measurement Science 2019. Ed.: M. Rosenberger, Art.-Nr.: 1114411, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2531610
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2018. 18th European Conference on Composite Materials (ECCM 2018), Athen, GR, June 24-28, 2018
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2019. Proceedings of the International Radar Symposium, Ulm, June 26-28, 2019. Ed.: P. Knott, Article No.8768132, IEEE Computer Society. doi:10.23919/IRS.2019.8768132
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2019. Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications: 23rd Iberoamerican Congress, CIARP 2018, Madrid, Spain, November 19-22, 2018, Proceedings. Ed.: R. Vera-Rodriguez, 602–610, Springer. doi:10.1007/978-3-030-13469-3_70
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2018. Proceedings of the 11th PErvasive Technologies Related to Assistive Environments Conference, (PETRA), Corfu, Greece, June 26-29, 2018, 292–296, Association for Computing Machinery (ACM). doi:10.1145/3197768.3201563
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2018. Proceedings of the 23nd ACM on Symposium on Access Control Models and Technologies, SACMAT 2018, Indianapolis, IN, USA, June 13-15, 2018, 85–91, Association for Computing Machinery (ACM). doi:10.1145/3205977.3205990
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2019. 15th International Conference on Intelligent Autonomous Systems, IAS 2018; Baden-Baden; Germany; 11 June 2018 through 15 June 2018. Ed.: R. Dillmann, 585–596, Springer. doi:10.1007/978-3-030-01370-7_46
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2018. Powder technology, 340, 181–193. doi:10.1016/j.powtec.2018.09.003
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2018. 2018 Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2018; Brescia; Italy; 16 April 2018 through 18 April 2018, 52–57, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/METROI4.2018.8428313
Beyerer, J.; Ruf, M.; Herrmann, C.
2018. Autonomous Systems : Sensors, Vehicles, Security and the Internet of Everything, Orlando, FL, April 15-19, 2018. Ed.: M.C. Dudzik, Article No. 1064308, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2304400
Herrmann, C.; Metzler, J.; Willersinn, D.; Beyerer, J.
2018. Medical Imaging 2018 : Image-Guided Procedures, Robotic Interventions, and Modeling, Houston, TX, February 10–15, 2018. Ed.: B. Fei, Article No. 105762O, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2293623
Pfrommer, J.; Zimmerling, C.; Liu, J.; Kärger, L.; Henning, F.; Beyerer, J.
2018. 51st CIRP Conference on Manufacturing Systems, CIRP CMS 2018; Stockholm Waterfront Congress CentreStockholm; Sweden; 16 May 2018 through 18 May 2018. Ed.: T. Kjellberg, 426–431, Elsevier. doi:10.1016/j.procir.2018.03.046
Hild, J.; Kühnle, C.; Voit, M.; Beyerer, J.
2018. 10th ACM Symposium on Eye Tracking Research and Applications, ETRA 2018; Warsaw; Poland; 14 June 2018 through 17 June 2018. Ed.: S.N. Spencer, Art.Nr. a58, Association for Computing Machinery (ACM). doi:10.1145/3204493.3204575
Sommer, L.; Steinmann, L.; Schumann, A.; Beyerer, J.
2018. Automatic Target Recognition XXVIII : 16-17 April 2018, Orlando, Florida, United States. Ed.: F. A. Sadjadi, 1064803, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2304768
Manger, D.; Willersinn, D.; Beyerer, J.
2018. 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2018; Funchal, Madeira; Portugal; 27 January 2018 through 29 January 2018. Ed.: J. Braz, 367–372, SciTePress
Tüzko, A.; Herrmann, C.; Manger, D.; Beyerer, J.
2018. 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2018; Funchal, Madeira; Portugal; 27 January 2018 through 29 January 2018. Ed.: J. Braz, 284–292, SciTePress
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2018. Technisches Messen, 85 (3), 202–210. doi:10.1515/teme-2017-0063
Meyer, J.; Längle, T.; Beyerer, J.
2018. Proceedings of the Computing Conference 2017, London, UK, 18th - 20th July 2017, 244–248, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SAI.2017.8252110
Günther, M.; Hu, P.; Herrmann, C.; Chan, C. H.; Jiang, M.; Yang, S.; Dhamija, A. R.; Ramanan, D.; Beyerer, J.; Kittler, J.; Jazaery, M. A.; Nouyed, M. I.; Guo, G.; Stankiewicz, C.; Boult, T. E.
2018. Proceedings of the IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, Colorado, 1st - 4th October 2017, 697–706, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/BTAS.2017.8272759
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2017. OCM 2017 - Optical Characterization of Materials - conference proceedings. Hrsg.: J. Beyerer; F. Puente León; T. Längle, 109–119, KIT Scientific Publishing. doi:10.5445/IR/1000082558
Richter, M.; Beyerer, J.
2015. OCM 2015 - Optical Characterization of Materials - conference proceedings. Hrsg.: J. Beyerer, F. Puente León, T. Längle, 103–112, KIT Scientific Publishing. doi:10.5445/IR/1000082544
Pfaff, F.; Kurz, G.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Langle, T.; Beyerer, J.
2017. Proceedings of the International Conference on Multisensor Fusion and Integration for Intelligent Systems, MFI 2017, Daegu, South Korea, 16th - 18th November 2017, 553–558, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2017.8170379
Pieper, C.; Wirtz, S.; Scherer, V.; Maier, G.; Gruna, R.; Langle, T.; Beyerer, J.; Pfaff, F.; Noack, B.; Hanebeck, U. D.; Kruggel-Emden, H.
2017. 5th International Conference on Particle-Based Methods - Fundamentals and Applications, PARTICLES 2017, Hannover, Germany, 26th - 28th September 2017, 373–384, International Centre for Numerical Methods in Engineering (CIMNE)
Beyerer, J.; Bonn, G.
2017. Automatisierungstechnik, 65 (7), 524–525. doi:10.1515/auto-2017-0063
Teutsch, M.; Krüger, W.; Beyerer, J.
2017. Optical engineering, 56 (8), Art. Nr.: 083102. doi:10.1117/1.OE.56.8.083102
Schreiter, L.; Philipp, P.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Beyerer, J.; Wörn, H.
2016. International journal of computer assisted radiology and surgery, 11 (Supplement 1), 115–116
Philipp, P.; Schreiter, L.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Wörn, H.; Beyerer, J.
2016. Proceedings of the 6th Joint Workshop On New Technologies for Computer/Robot Assisted Surgery, CRAS 2016, Pisa, Italy, 12th - 14th September 2016
Coluccia, A.; Ghenescu, M.; Piatrik, T.; Cubber, G. D.; Schumann, A.; Sommer, L.; Klatte, J.; Schuchert, T.; Beyerer, J.; Farhadi, M.; Amandi, R.; Aker, C.; Kalkan, S.; Saqib, M.; Daud, S.; Makkah, K.; Blumenstein, M.
2017. 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078464, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078464
Sommer, L.; Nie, K.; Schumann, A.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078510, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078510
Sommer, L.; Schumann, A.; Müller, T.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078557, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078557
Schumann, A.; Sommer, L.; Klatte, J.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078558, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078558
Bapp, F.; Becker, J.; Beyerer, J.; Doll, J.; Filsinger, M.; Frese, C.; Hubschneider, C.; Lauber, A.; Müller-Quade, J.; Pauli, M.; Roschani, M.; Salscheider, O.; Rosenhahn, B.; Ruf, M.; Stiller, C.; Willersinn, D.; Ziehn, J. R.
2017. TÜV-Tagung Fahrerassistenz, 2017, München, 8 S
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikajii, M.; Beyerer, J.; Dachsbacher, C.
2018. 38th International Conference on Information Systems Architecture and Technology, ISAT 2017; Szklarska Poreba; Poland; 17 September 2017 through 19 September 2017. Ed.: L. Borzemski, 326–335, Springer. doi:10.1007/978-3-319-67220-5_30
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2016. XXX. Messtechnisches Symposium, Hannover, 15. - 16. September 2016, 141–150, Oldenbourg Verlag. doi:10.1515/9783110494297-019
Irgenfried, S.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2017. Automated Visual Inspection and Machine Vision II - SPIE Optical Metrology, Munich, Germany, 25 - 29 June 2017. Ed.: J. Beyerer, 1033406, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2269166
Luo, D.; Längle, T.; Beyerer, J.
2017. Technisches Messen, 84 (7-8), 452–459. doi:10.1515/teme-2017-0007
Philipp, P.; Beyerer, J.; Fischer, Y.
2017. 2017 IEEE Conference on Cognitive and Computational Aspects of Situation Management (CogSIMA), Savannah, Georgia, USA, 27-31 March 2017, Art. Nr. 7929589, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/COGSIMA.2017.7929589
Pfaff, F.; Maier, G.; Aristov, M.; Noack, B.; Gruna, R.; Hanebeck, U. D.; Längle, T.; Beyerer, J.; Pieper, C.; Kruggel-Emden, H.; Wirtz, S.; Scherer, V.
2017. Automatisierungstechnik, 65 (6), 369–380. doi:10.1515/auto-2017-0009
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.
2017. Automatisierungstechnik, 65 (6), 426–439. doi:10.1515/auto-2017-0044
Beyerer, J.; Geisler, J.
2015. Proceedings of the 10th Future Security - Security Research Conference "Future Security", Berlin, 10, 2015, 317–324, Fraunhofer Verlag
Beyerer, J.; Geisler, J.
2016. European Journal for Security Research, 1 (2), 135–150. doi:10.1007/s41125-016-0008-y
Herrmann, C.; Willersinn, D.; Beyerer, J.
2017. Image Analysis : Proceedings of the 20th Scandinavian Conference, SCIA 2017, Part II, Tromso, Norway, 12th - 14th June 2017, 377–388, Springer. doi:10.1007/978-3-319-59129-2_32
Meyer, J.; Längle, T.; Beyerer, J.
2017. Image Analysis : Proceedings of the 20th Scandinavian Conference (SCIA 2017) Part I, Tromso, Norway, 12-14 June 2017. Ed.: P. Sharma, 526–537, Springer. doi:10.1007/978-3-319-59126-1_44
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2017. 17th IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, United States, 24. - 31. March, 2017, 1008–1016, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.117
Qu, C.; Herrmann, C.; Monari, E.; Schuchert, T.; Beyerer, J.
2017. WACV : Proceedings of the 2017 IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, USA, 24-31 March 2017, 1105–1114, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.128
Beyerer, J.; Puente León, F.; Frese, C.
2016. Springer-Verlag. doi:10.1007/978-3-662-47786-1
Beyerer, J.; Puente León, F.; Frese, C.
2016. Springer-Verlag. doi:10.1007/978-3-662-47794-6
Bauer, S.; Krippner, W.; Luo, D.; Taphanel, M.; Abdo, M.; Badilita, V.; Längle, T.; Beyerer, J.; Korvink, J.; Puente León, F.
2016. XXX. Messtechnisches Symposium, Hannover, 15. – 16. September 2016, Hrsg.: S. Zimmermann, 69–76, Oldenbourg Verlag
Bergmann, S.; Mohammadikaji, M.; Irgenfried, S.; Wörn, H.; Beyerer, J.; Dachsbacher, C.
2016. VMV 2016 : 21th International Symposium on Vision, Modeling and Visualization, Bayreuth, Germany, 10-12 October 2016. Ed.: M. Hullin, 179–186, Eurographics Association. doi:10.2312/vmv.20161357
Wagner, P.; Birnstill, P.; Krempel, E.; Bretthauer, S.; Beyerer, J.
2016. Informatik 2016 - Tagung vom 26.-30. September 2016 in Klagenfurt. Hrsg.: H. C. Mayr, 427–440, Gesellschaft für Informatik (GI)
Richter, M.; Langle, T.; Beyerer, J.
2017. 23rd International Conference on Pattern Recognition, ICPR 2016, Cancun, Mexico, 4th - 8th December 2016, 3079–3084, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPR.2016.7900107
Bier, C.; Birnstill, P.; Krempel, E.; Vagts, H.; Beyerer, J.
2012. Future Security : 7th Security Research Conference, Bonn, Germany, September 4-6, 2012. Ed.: N. Aschenbruck, 265–268, Springer-Verlag. doi:10.1007/978-3-642-33161-9_39
Bier, C.; Birnstill, P.; Krempel, E.; Vagts, H.; Beyerer, J.
2014. Privacy technologies and policy : revised selected papers - First Annual Privacy Forum (APF), Limassol, Cyprus, October 10 - 11, 2012. Ed.: B. Preneel, 73–85, Springer-Verlag
Luo, D.; Taphanel, M.; Längle, T.; Beyerer, J.
2017. Applied optics, 56 (8), 2359–2367. doi:10.1364/AO.56.002359
Luo, D.; Bauer, S.; Taphanel, M.; Längle, T.; Puente León, F.; Beyerer, J.
2016. Next-Generation Spectroscopic Technologies IX; Baltimore; United States; 18 April 2016 through 19 April 2016, Art. Nr.: 98550P, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2228303
Maier, G.; Pfaff, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Langle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2016. 2016 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI), Baden-Baden, Germany, 19–21 September 2016, 505–510, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2016.7849538
Pfaff, F.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Langle, T.; Beyerer, J.
2016. 2016 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI), Baden-Baden, Germany, 19–21 September 2016, 511–516, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2016.7849539
Herrmann, C.; Qu, C.; Beyerer, J.
2016. 4th IEEE International Conference on Signal and Image Processing Applications, ICSIPA 2015; Pullman BangsarKuala Lumpur; Malaysia; 19 October 2015 through 21 October 2015, 89–94, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICSIPA.2015.7412169
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.
2016. Proceedings - 2015 International Conference on Computational Science and Computational Intelligence, CSCI 2015; Las Vegas; United States; 7 December 2015 through 9 December 2015, 732–737, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI.2015.110
Sommer, L. W.; Teutsch, M.; Schuchert, T.; Beyerer, J.
2016. IEEE Winter Conference on Applications of Computer Vision, WACV 2016; Lake Placid; United States; 7 March 2016 through 10 March 2016, Art. Nr.: 7477573, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2016.7477573
Ruf, M.; Ziehn, J. R.; German, L.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.
2017. Proceedings of the 2016 International Conference on Instrumentation, Control and Automation, Bandung, West Java, RI, August 29-31, 2016, 189–196, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICA.2016.7811499
Ziehn, J. R.; Ruf, M.; Willersinn, D.; Rosenhahn, B.; Beyerer, J.; Gotzig, H.
2016. 2016 IEEE 19th International Conference on Intelligent Transportation Systems (ITSC), Windsor Oceanico Hotel, Rio de Janeiro, Brazil, 1. -4. November, 2016, 1410–1417, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ITSC.2016.7795742
Herrmann, C.; Müller, T.; Willersinn, D.; Beyerer, J.
2016. Electro-Optical and Infrared Systems: Technology and Applications XIII. Ed.: D.A. Huckridge, 99870I, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2240940
Sommer, L. W.; Schuchert, T.; Beyerer, J.
2016. Electro-Optical Remote Sensing X, Edingburgh, UK, September 26,2016. Ed.: G. Kamerman, Article: 99880N, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2241527
Herrmann, C.; Willersinn, D.; Beyerer, J.
2016. International Conference on Digital Image Computing: Techniques and Applications (DICTA), November 30 - December 2, 2016, 7797061, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/DICTA.2016.7797061
Meyer, J.; Langle, T.; Beyerer, J.
2016. 2nd International Conference on Frontiers of Signal Processing (ICFSP), Warsaw, PL, October 15-17, 2016, 104–109, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICFSP.2016.7802965
Meyer, J.; Längle, T.; Beyerer, J.
2016. Technisches Messen, 83 (12), 731–738. doi:10.1515/teme-2016-0042
Qu, C.; Luo, D.; Monari, E.; Schuchert, T.; Beyerer, J.
2016. IEEE International Conference on Image Processing (ICIP), Phoenix, AZ, USA, 25–28 September 2016, 2812–2816, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP.2016.7532872
Pieper, C.; Kruggel-Emden, H.; Wirtz, S.; Scherer, V.; Pfaff, F.; Noack, B.; Hanebeck, U. D.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.
2017. 7th International Conference on Discrete Element Methods, DEM7 2016, Dalian, China, 2016, 1 - 4 August, 1105–1113, Springer. doi:10.1007/978-981-10-1926-5_115
Pfaff, F.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Längle, T.; Beyerer, J.
2016. Technisches Messen, 83 (2), 77–84. doi:10.1515/teme-2015-0108
Herrmann, C.; Willersinn, D.; Beyerer, J.
2016. 13th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Colorado Springs, CO, USA, 23–26 August 2016, 221–227, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2016.7738017
Luo, D.; Längle, T.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 185–195, KIT Scientific Publishing
Stephan, T.; Dürrwang, J.; Burke, J.; Werling, S.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, KIT Scientific Publishing
Meyer, J.; Längle, T.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 75–86, KIT Scientific Publishing
Retzlaff, M.-G.; Richter, M.; Thomas Längle; Beyerer, J.; Dachsbacher, C.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 49–61, KIT Scientific Publishing
Anneken, M.; Fischer, Y.; Beyerer, J.
2016. Intelligent Systems and Applications. Extended and Selected Results from the SAI Intelligent Systems Conference (IntelliSys), London, UK, 10-11 November 2015. Ed.: Y. Bi, 89–107, Springer-Verlag. doi:10.1007/978-3-319-33386-1_5
Hammer, J. H.; Voit, M.; Beyerer, J.
2016. 19th International Conference on Information Fusion (FUSION), Heidelberg, Germany, 5-8 July 2016, 1743–1750, Institute of Electrical and Electronics Engineers (IEEE)
Dunau, P.; Beyerer, J.
2016. 19th International Conference on Information Fusion (FUSION), Heidelberg, Germany, 5-8 July 2016, 1735–1742, Institute of Electrical and Electronics Engineers (IEEE)
Hild, J.; Krüger, W.; Heinze, N.; Peinsipp-Byma, E.; Beyerer, J.
2016. Geospatial Informatics, Fusion, and Motion Video Analytics VI, Baltimore, MD, April 19-21, 2016. Ed.: M.F. Pellechia, 98410K/1–9, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2223726
Taphanel, M.; Beyerer, J.
2015. Technisches Messen, 82 (2), 94–101. doi:10.1515/teme-2014-0006
Pieper, C.; Maier, G.; Pfaff, F.; Kruggel-Emden, H.; Wirtz, S.; Gruna, R.; Noack, B.; Scherer, V.; Längle, T.; Beyerer, J.; Hanebeck, U. D.
2016. Powder technology, 301, 805–814. doi:10.1016/j.powtec.2016.07.018
Kuwertz, A.; Beyerer, J.
2016. Journal of applied logic, 19 (2), 102–127. doi:10.1016/j.jal.2016.05.005
Beyerer, J.; Jasperneite, J.; Sauer, O.
2015. Automatisierungstechnik, 63 (10), 751–752. doi:10.1515/auto-2015-0068
Richter, M.; Laengle, T.; Beyerer, J.
2015. Technisches Messen, 82 (12), 663–671. doi:10.1515/teme-2015-0040
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.
2016. Emerging Trends in Applications and Infrastructures for Computational Biology, Bioinformatics, and Systems Biology: Systems and Applications. Ed.: Q.-N. Tran, 371–390, Morgan Kaufmann Publishers. doi:10.1016/B978-0-12-804203-8.00026-2
Hild, J.; Petersen, P.; Beyerer, J.
2016. Ninth Biennial ACM Symposium on Eye Tracking Research & Applications (ETRA ’16), 257–260, Association for Computing Machinery (ACM). doi:10.1145/2857491.2857535
Hild, J.; Kühnle, C.; Beyerer, J.
2016. Ninth Biennial ACM Symposium on Eye Tracking Research & Applications, ETRA 2016; Charleston; United States; 14 - 17 March 2016. Vol. 14, 241–244, Association for Computing Machinery (ACM). doi:10.1145/2857491.2857525
Höfer, S.; Beyerer, J.
2016. tm - Technisches Messen, 83 (6), 374–385. doi:10.1515/teme-2016-0004
Anneken, M.; Fischer, Y.; Beyerer, J.
2016. ICAART 2016 - Proceedings of the 8th International Conference on Agents and Artificial Intelligence, Rome; Italy; 24 February 2016 through 26 February 2016, Vol.2. Ed.: J.Filipe, 250–257, SciTePress. doi:10.5220/0005655302500257
Pfaff, F.; Baum, M.; Noack, B.; Hanebeck, U. D.; Gruna, R.; Längle, T.; Beyerer, J.
2015. Proceedings of the 2015 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI 2015), 14-16 Sept. 2015, San Diego, CA, USA, 7–12, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2015.7295737
Ziebarth, M.; Heizmann, M.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 153–165, KIT Scientific Publishing
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 129–140, KIT Scientific Publishing
Richter, M.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 107–118, KIT Scientific Publishing
Beyerer, J.; Peinsipp-Byma, E.; Stiefelhagen, R.
2013. at-Automatisierungstechnik, 61 (11), 727–728. doi:10.1524/auto.2013.9011
Herrmann, C.; Beyerer, J.
2015. Image Processing: Machine Vision Applications VIII; 10 February 2015 through 11 February 2015, San Francisco, California, United States. Ed.: E. Y. Lam, Art.Nr. 940507, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2078988
Kuwertz, A.; Goldbeck, C.; Hug, R.; Beyerer, J.
2015. Proceedings of the UKSIM-AMSS; 17th International Conference on Modelling and Simulation (UKSim2015) 2015, 25 - 27 March 2015, Cambridge, UK. Ed.: D. Al-Dabass, 165–170, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/UKSim.2015.66
Woock, P.; Stephan, T.; Beyerer, J.
2015. at - Automatisierungstechnik, 63 (5), 334–343
Richter, M.; Längle, T.; Beyerer, J.
2015. Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015, 18-22 May 2015, Tokyo, Japan, 210–213, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MVA.2015.7153169
Herrmann, C.; Beyerer, J.
2015. 12th Conference on Computer and Robot Vision (CRV), 2015, 3 June 2015 through 5 June 2015, Halifax, Canada, 192–199, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CRV.2015.32
Taphanel, M.; Zink, R.; Längle, T.; Beyerer, J.
2015. Optical Measurement Systems for Industrial Inspection IX, 22 - 25 June 2015, Munich, Germany. Ed.: P. Lehmann, 95250Y, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2184560
Woock, P.; Beyerer, J.
2015. Proceedings of the 3rd Underwater Acoustics Conference and Exhibition, UACE 2015: 21-26 June 2015, Platanias, Crete, Greece, 717–725
Frühberger, P.; Stephan, T.; Beyerer, J.
2015. 2nd International Multidisciplinary Microscopy and Microanalysis Congress : Proceedings of InterM, October 16-19, 2014. Ed.: E.K. Polychroniadis, 57–64, Springer International Publishing. doi:10.1007/978-3-319-16919-4_8
Pfrommer, J.; Stogl, D.; Aleksandrov, K.; Escaida Navarro, S.; Hein, B.; Beyerer, J.
2015. at - Automatisierungstechnik, 63 (10), 790–800. doi:10.1515/auto-2014-1157
Fischer, Y.; Beyerer, J.
2013. International Journal on Advances in Systems and Measurement, 8 (3-4), 245–259
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.
2014. tm - Technisches Messen, 81 (12), 644–651. doi:10.1515/teme-2014-1055
Kühnert, C.; Beyerer, J.
2014. Machines, 2 (4), 255–274. doi:10.3390/machines2040255
Richter, M.; Längle, T.; Beyerer, J.
2015. tm -Technisches Messen, 82 (3), 135–144. doi:10.1515/teme-2014-0042
Huber, M. F.; Dencker, T.; Roschani, M.; Beyerer, J.
2015. Nonlinear Gaussian Filtering : Theory, Algorithms, and Applications. Ed.: M. Huber, 530–551, Karlsruher Institut für Technologie (KIT)
Schleipen, M.; Pfrommer, J.; Stogl, D.; Hein, B.; Aleksandrov, K.; Escaida Navarro, S.; Beyerer, J.
2014. 3rd AutomationML User Conference, Blumberg, October 7-8, 2014
Pfrommer, J.; Schleipen, M.; Usländer, T.; Epple, U.; Heidel, R.; Urbas, L.; Sauer, O.; Beyerer, J.
2014. 13. Fachtagung Entwurf komplexer Automatisierungssysteme (EKA’14), Magdeburg, 14.-15. Mai 2014. Hrsg.: U. Jumar, CD-ROM, Universität Magdeburg
Krempel, E.; Beyerer, J.
2014. Privacy Technologies and Policy - 2nd Annual Privacy Forum (APF’14), Athens, Greece, May 20-21, 2014. Ed.: B. Preneel, 86–100, Springer US. doi:10.1007/978-3-319-06749-0_6
Hild, J.; Gill, D.; Beyerer, J.
2014. 8th ACM Symposium on Eye Tracking Research & Applications (ETRA’14), Safety Harbor, Florida/USA, March 26-28, 2014, 131–134, Association for Computing Machinery (ACM). doi:10.1145/2578153.2578172
Fischer, Y.; Krempel, E.; Birnstill, P.; Unmüßig, G.; Monari, E.; Moßgraber, J.; Schenk, M.; Beyerer, J.
2014. 9th Security Research Conference ’Future Security’, Berlin, September 16-18, 2014. Ed.: K. Thoma, 91–99, Fraunhofer Verlag
Fischer, Y.; Reiswich, A.; Beyerer, J.
2014. IEEE International Inter-Disciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support (CogSIMA’14), San Antonio, Texas/USA, March 3-6, 2014, 209–215, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CogSIMA.2014.6816564
Bauernhansl, T.; Beyerer, J.; Ten Hompel, M.
2014. Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung e.V. - Jahresbericht 2013, 58–69, Fraunhofer Verlag
Herrmann, C.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 181–186, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918665
Kuwertz, A.; Beyerer, J.
2014. IEEE International Interdisciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support (CogSIMA’14), San Antonio, Texas/USA, March 3-6, 2014, 83–89, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CogSIMA.2014.6816545
Richter, M.; Beyerer, J.
2014. IEEE Winter Conference on Applications of Computer Vision (WACV’14), Steamboat Springs, Colorado/USA, March 24-26, 2014, 123–128, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2014.6836110
Ruf, M.; Ziehn, J. R.; Rosenhahn, B.; Beyerer, J.; Willersinn, D.; Gotzig, H.
2014. 9. Workshop Fahrerassistenzsysteme (FAS’14), Walting im Altmühltal, 26.-28. März 2014, 55–66, Fraunhofer Verlag
Maurus, M.; Hammer, J. H.; Beyerer, J.
2014. Conference on Eye Tracking Research and Applications (ETRA’14), Safety Harbor, Florida/USA, March 26-28, 2014, 295–298, Association for Computing Machinery (ACM). doi:10.1145/2578153.2578204
Teutsch, M.; Mueller, T.; Huber, M.; Beyerer, J.
2014. IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW’14), Columbus, Ohio/USA, June 23-28, 2014, 209–216, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW.2014.40
Ruf, M.; Ziehn, J. R.; Rosenhahn, B.; Beyerer, J.; Willersinn, D.; Grotzig, H.
2014. International Conference on Mechatronics and Control (ICMC’14), Jinzhou, China, July 3-5, 2014
Teutsch, M.; Kruger, W.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 265–270, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918679
Stephan, T.; Richter, M.; Beyerer, J.
2014. 9. Sicherheitsforschungskonferenz ’Future Security’, Berlin, 16.-18. September 2014
Frühberger, P.; Klaus, E.; Beyerer, J.
2014. International Multidisciplinary Microscopy Congress - Proceedings of InterM, Antalya, Turkey, October 1013, 2013. Ed.: E.K. Polychroniadis, 195–200, Springer-Verlag. doi:10.1007/978-3-319-04639-6_27
Chengchao, Q.; Monari, E.; Schuchert, T.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 113–118, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918653