Prof. Dr.-Ing. Jürgen Beyerer
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- juergen beyerer ∂ iosb fraunhofer de
Karlsruher Institut für Technologie – KIT
Institut für Anthropomatik und Robotik (IAR)
Lehrstuhl für Interaktive Echtzeitsysteme (IES)
Prof. Dr.- Ing. Jürgen Beyerer
Vincenz-Prießnitz-Straße 3
76131 Karlsruhe
Lebenslauf
Prof. Dr.-Ing. Jürgen Beyerer ist Inhaber des 2004 eingerichteten Lehrstuhls für Interaktive Echtzeitsysteme an der Fakultät für Informatik. Gleichzeitig ist er Leiter des Fraunhofer-Instituts für Optronik, Systemtechnik und Bildauswertung (IOSB) in Karlsruhe (bis 2009: Fraunhofer IITB).
Prof. Beyerer studierte von 1984 bis 1989 Elektrotechnik an der Universität Karlsruhe und promovierte 1994 am Institut für Mess- und Regelungstechnik (MRT) bei Prof. Franz Mesch mit einer Arbeit zur Texturanalyse, die 1995 mit dem Messtechnikpreis des AHMT (Arbeitskreis der Hochschullehrer für Messtechnik e.V.) ausgezeichnet wurde. Anschließend baute er eine Forschungsgruppe zum Thema Automatische Sichtprüfung und Bildverarbeitung am gleichen Institut auf. 1999 habilitierte er sich für das Fach Messtechnik mit einer Arbeit zum Thema der Nutzung von Vorwissen in der Messtechnik. Von 1999 bis 2004 leitete er das Mannheimer Mittelstands-Unternehmen Hottinger Systems GmbH (heute: inspectomation GmbH ) und war stellvertretender Geschäftsführer des Schwesterunternehmens Hottinger Maschinenbau GmbH.
Lehrstuhl und Fraunhofer IOSB arbeiten inhaltlich eng zusammen. Damit lassen sich Synergieeffekte, die in der eher grundlagenorientierten Herangehensweise am Lehrstuhl und der anwendungsorientierten Ausrichtung des IOSB liegen, optimal erschließen. Daneben fördert eine enge Kooperation die Gewinnung erstklassiger Nachwuchswissenschaftler für das Fraunhofer IOSB.
Veröffentlichungen
Wu, C.; Wang, K.; Zhong, Z.; Fu, H.; Zheng, J.; Zhang, J.; Pfrommer, J.; Beyerer, J.
2024. Pattern Recognition – 27th International Conference, ICPR 2024, Kolkata, India, December 1–5, 2024, Proceedings, Part XXVI. Ed.: A. Antonacopoulos, 249–267, Springer Nature Switzerland. doi:10.1007/978-3-031-78395-1_17
Hagmanns, R.; Ruf, B.; Bockmühl, R.; Weißer, M.; Beyerer, J.
2024. IEEE International Symposium on Safety Security Rescue Robotics (SSRR 2024), 267–272, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SSRR62954.2024.10770050
Zhou, J.; Zhang, C.; Beyerer, J.
2024. 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 3553 – 3563, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW63382.2024.00359
Hofmann, C.; Staab, S.; Selzer, M.; Neumann, G.; Furmans, K.; Heizmann, M.; Beyerer, J.; Lanza, G.; Pfrommer, J.; Düser, T.; Klein, J.-F.
2024. at - Automatisierungstechnik, 72 (9), 875–883. doi:10.1515/auto-2024-0006
Heizmann, M.; Beyerer, J.; Dietrich, S.; Hoffmann, L.; Kaiser, J.-P.; Lanza, G.; Roitberg, A.; Stiefelhagen, R.; Stricker, N.; Wexel, H.; Zanger, F.
2024. at - Automatisierungstechnik, 72 (9), 829–843. doi:10.1515/auto-2024-0009
Wolf, S.; Thelen, P.; Beyerer, J.
2024. CLEF 2024 - CLEF 2024 Working Notes : Working Notes of the Conference and Labs of the Evaluation Forum (CLEF 2024) Grenoble, France, 9-12 September, 2024. Ed. : G. Faggioli, N. Ferro, P. Galuščáková, A. García Seco de Herrera, 2260 – 2266, CEUR-WS
Sielemann, A.; Wolf, S.; Roschani, M.; Ziehn, J.; Beyerer, J.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), Yokohama, 13th-17th May 2024, 9146 – 9153, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10610650
Wagner, P. G.; Birnstill, P.; Beyerer, J.
2024. Proceedings of the 19th International Conference on Availability, Reliability and Security, Art.-Nr.: 159, Association for Computing Machinery (ACM). doi:10.1145/3664476.3670442
Fischer, B.; Gauweiler, P.; Gruna, R.; Beyerer, J.
2024. R. N. Youngworth, B. N. Sitarski & H. Münz (Hrsg.), Optical Instrument Science, Technology, and Applications III, 6, SPIE. doi:10.1117/12.3023597
Schneider, D.; Keller, M.; Zhong, Z.; Peng, K.; Roitberg, A.; Beyerer, J.; Stiefelhagen, R.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), 13038–13045, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10611486
Zander, T.; Wohnig, J.; Beyerer, J.
2024. 2024 IEEE International Conference on Advanced Robotics and Its Social Impacts (ARSO), 146 – 152, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ARSO60199.2024.10557807
Beyerer, J.; Hagmanns, R.; Stadler, D.
2024. De Gruyter. doi:10.1515/9783111339207
Rehak, J.; Falkenstein, A.; Doehner, F.; Beyerer, J.
2024. ML4CPS – Machine Learning for Cyber-Physical Systems, Berlin, March 21st-22nd 2024, UB HSU. doi:10.24405/15305
Neis, N.; Beyerer, J.
2024. 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC), Bilbao, 24th-28th September 2023, 1896 – 1903, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ITSC57777.2023.10421975
Becker, M.; Vishwesh, V.; Birnstill, P.; Schwall, F.; Wu, S.; Beyerer, J.
2024. 2023 IEEE International Conference on Data Mining Workshops (ICDMW), Shanghai, 1st-4th December 2023, 875–884, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00118
Neis, N.; Beyerer, J.
2024. 2024 10th International Conference on Automation, Robotics and Applications (ICARA), 472 – 478, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICARA60736.2024.10553024
Youssef, S.; Doehner, F.; Beyerer, J.
2024. ML4CPS - Machine learning for cyber physical systems, Berlin, 21st - 22nd March 2024, UB HSU. doi:10.24405/15315
Vishwesh, V.; Becker, M.; Birnstill, P.; Beyerer, J.
2024. Forum Bildverarbeitung 2024: Hrsg.: T. Längle, 171–182, Karlsruher Institut für Technologie (KIT)
Hagmanns, R.; Emter, T.; Garbe, L.; Beyerer, J.
2024. Intelligent Autonomous Systems 18Ed.: S.-G. Lee. Vol. 1, 95–107, Springer Nature Switzerland. doi:10.1007/978-3-031-44851-5_8
Walker, M.; Reith-Braun, M.; Bauer, A.; Pfaff, F.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.; Kruggel-Emden, H.; Hanebeck, U. D.
2024. IEEE Transactions on Control Systems Technology, 1. doi:10.1109/TCST.2024.3477294
Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.
2024. IEEE Access, 12, 6473–6493. doi:10.1109/ACCESS.2024.3350987
Wolf, S.; Loran, D.; Beyerer, J.
2024. 2024 IEEE/CVF Winter Conference on Applications of Computer Vision Workshops (WACVW), 330–340, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW60836.2024.00041
Neis, N.; Beyerer, J.
2024. IEEE Open Journal of Intelligent Transportation Systems, 5, 566–580. doi:10.1109/OJITS.2024.3435078
Wu, C.; Fu, H.; Kaiser, J.-P.; Barczak, E. T.; Pfrommer, J.; Lanza, G.; Heizmann, M.; Beyerer, J.
2024. Procedia CIRP, 122, 193 – 198. doi:10.1016/j.procir.2024.01.028
Cormier, M.; Specker, A.; Jacques, J. C. S. Junior; Moritz, L.; Metzler, J.; Moeslund, T. B.; Nasrollahi, K.; Escalera, S.; Beyerer, J.
2024. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 359–367, Institute of Electrical and Electronics Engineers (IEEE)
Friederich, N.; Specker, A.; Beyerer, J.
2024. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 310–319, Institute of Electrical and Electronics Engineers (IEEE)
Han, L.; Kefferpütz, K.; Elger, G.; Beyerer, J.
2024. 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC), Bilbao, 24th-28th September 2023, 3810 – 3816, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ITSC57777.2023.10422616
Zhou, J.; Wandelburg, N.; Beyerer, J.
2024. 2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC), Bilbao, 24th - 28th September 2023, 2501 – 2508, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ITSC57777.2023.10422562
Wu, C.; Pfrommer, J.; Zhou, M.; Beyerer, J.
2024. IEEE Transactions on Multimedia, 26, 8432–8441. doi:10.1109/TMM.2023.3338079
Becker, M.; Toprak, E.; Beyerer, J.
2023. 23rd IEEE International Conference on Data Mining Workshops : 1-4 December 2023, Shanghai, China : proceedings. Ed.: J. Wang, 885–893, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00119
Stadler, D.; Beyerer, J.
2023. 2023 IEEE International Conference on Image Processing (ICIP), Kuala Lumpur, Malaysia, 08-11 October 2023, 321–325, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP49359.2023.10223159
Haas, C.; Bretthauer, G.; Beyerer, J.
2023. at - Automatisierungstechnik, 71 (9), 723–725. doi:10.1515/auto-2023-0141
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA), Sinaia, Romania, 12-15 September 2023, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETFA54631.2023.10275358
Appenzeller, A.; Balduf, F.; Beyerer, J.
2023. Proceedings of the 16th International Conference on PErvasive Technologies Related to Assistive Environments, 206–214, Association for Computing Machinery (ACM). doi:10.1145/3594806.3594816
Maier, G.; Reith-Braun, M.; Bauer, A.; Gruna, R.; Pfaff, F.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Beyerer, J.
2023. tm - Technisches Messen, 90 (7-8), 489–499. doi:10.1515/teme-2023-0033
Zander, T.; Pan, Z.; Birnstill, P.; Beyerer, J.
2023. tm - Technisches Messen, 90 (7-8), 478–488. doi:10.1515/teme-2023-0010
Rehak, J.; Sommer, A.; Becker, M.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), Lemgo, Germany, 17-20 July 2023, 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/INDIN51400.2023.10218245
Borcherding, A.; Giraud, M.; Fitzgerald, I.; Beyerer, J.
2023. 2023 IEEE European Symposium on Security and Privacy Workshops (EuroS&PW), 345–350, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/EuroSPW59978.2023.00043
Specker, A.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 5442–5452, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW59228.2023.00575
Kalb, T. M.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, Kanada, 18-22 June 2023, 19508 – 19518, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPR52729.2023.01869
Appenzeller, A.; Terzer, N.; Philipp, P.; Beyerer, J.
2023. 2023 IEEE International Conference on Pervasive Computing and Communications Workshops and other Affiliated Events (PerCom Workshops), 608–613, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/PerComWorkshops56833.2023.10150373
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2023. Thin Solid Films, 769, Art.-Nr.: 139732. doi:10.1016/j.tsf.2023.139732
Bretthauer, G.; Beyerer, J.; Stiller, C.
2023. at - Automatisierungstechnik, 71 (2), 176–178. doi:10.1515/auto-2023-0006
Neis, N.; Beyerer, J.
2023. 2023 IEEE Intelligent Vehicles Symposium (IV), Anchorage, AK, USA, 04-07 June 2023, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV55152.2023.10186545
Burke, J.; Pak, A.; Höfer, S.; Ziebarth, M.; Roschani, M.; Beyerer, J.
2023. Advanced Optical Technologies, 12. doi:10.3389/aot.2023.1237687
Wu, C.; Zheng, J.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Vancouver, 17th-24th June 2023, 2717–2726, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW59228.2023.00272
Wu, C.; Zheng, J.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, 17th - 24th June 2023, 5333–5343, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPR52729.2023.00516
Reith-Braun, M.; Bauer, A.; Staab, M.; Pfaff, F.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.; Kruggel-Emden, H.; Hanebeck, U. D.
2023. IFAC-PapersOnLine, 56 (2), 4620 – 4626. doi:10.1016/j.ifacol.2023.10.971
Wu, C.; Qiu, L.; Zhou, K.; Pfrommer, J.; Beyerer, J.
2023. Proceedings of the 18th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2023) - Volume 4, Lissabon, 19th-21st February 2023, 529 – 540, SciTePress. doi:10.5220/0011718400003417
Becker, M.; Schwall, F.; Vishwesh, V.; Wu, S.; Birnstill, P.; Beyerer, J.
2023. doi:10.5445/IR/1000167428
Becker, M.; Toprak, E.; Beyerer, J.
2023. doi:10.5445/IR/1000167427
Friederich, N.; Specker, A.; Beyerer, J.
2023. arxiv. doi:10.48550/arXiv.2311.12064
Wolf, S.; Beyerer, J.
2023. Working Notes of the Conference and Labs of the Evaluation Forum (CLEF 2023), 2159 – 2167, CEUR-WS
Wolf, S.; Koch, J.; Sommer, L.; Beyerer, J.
2023. 2023 IEEE 13th International Conference on Pattern Recognition Systems (ICPRS), 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPRS58416.2023.10179055
Specker, A.; Beyerer, J.
2023. 2023 IEEE 13th International Conference on Pattern Recognition Systems (ICPRS), 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPRS58416.2023.10178990
Stadler, D.; Beyerer, J.
2023. Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges. Part I. Ed.: J.-J. Rousseau, 79–94, Springer. doi:10.1007/978-3-031-37660-3_6
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. doi:10.48550/arXiv.2305.03175
Meshram, A.; Karch, M.; Haas, C.; Beyerer, J.
2023. Tools for Design, Implementation and Verification of Emerging Information Technologies – 17th EAI International Conference, TridentCom 2022, Melbourne, Australia, November 23-25, 2022, Proceedings. Ed.: S. Yu, 3 – 19, Springer Nature Switzerland. doi:10.1007/978-3-031-33458-0_1
Stadler, D.; Beyerer, J.
2023. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops
Kronenwett, F.; Klingenberg, P.; Maier, G.; Längle, T.; Metzsch-Zilligen, E.; Beyerer, J.
2023. OCM 2023 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; T. Längle; M. Heizmann, 51 – 63, KIT Scientific Publishing
Bäcker, P.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.
2023. OCM 2023 - Optical Characterization of Materials : Conference Proceedings. Ed.: J. Beyerer; T. Längle; M. Heizmann, 11 – 21, KIT Scientific Publishing
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2023. OCM 2023, Optical Characterization of Materials. Conference Proceedings, 119 – 128, KIT Scientific Publishing
Ziehn, J. R.; Baumann, M. V.; Beyerer, J.; Buck, H. S.; Deml, B.; Ehrhardt, S.; Frese, C.; Kleiser, D.; Lauer, M.; Roschani, M.; Ruf, M.; Stiller, C.; Vortisch, P.
2023. 35th IEEE Intelligent Vehicles Symposium (IV 2023), Anchorage, AK, USA, June 4-7, 2023
Kalb, T. M.; Beyerer, J.
2023. Computer Vision – ACCV 2022 – 16th Asian Conference on Computer Vision, Macao, China, December 4–8, 2022, Proceedings, Part VII. Ed.: L. Wang, 361–377, Springer Nature Switzerland. doi:10.1007/978-3-031-26293-7_22
Guirguis, K.; Abdelsamad, M.; Eskandar, G.; Hendawy, A.; Kayser, M.; Yang, B.; Beyerer, J.
2023. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), IEEE/CVF Winter Conference on Applications of Computer Vision (WACV 2023), Waikoloa, HI, USA, 03.01.2023–07.01.2023, 3749–3758, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV56688.2023.00375
Borcherding, A.; Penkov, N.; Giraud, M.; Beyerer, J.
2023. Proceedings of the 9th International Conference on Information Systems Security and Privacy - ICISSP, 430–441, SciTePress. doi:10.5220/0011652200003405
Meier, D.; Vogl, J.; Kohnhäuser, F.; Beyerer, J.
2023. 2022 IEEE 17th Conference on Industrial Electronics and Applications (ICIEA), 144–149, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIEA54703.2022.10005899
Zhong, Z.; Schneider, D.; Voit, M.; Stiefelhagen, R.; Beyerer, J.
2023. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 6068–6077, Institute of Electrical and Electronics Engineers (IEEE)
Philipp, P.; Veloso, J.; Appenzeller, A.; Hartz, T.; Beyerer, J.
2022. 2022 International Conference on Computational Science and Computational Intelligence (CSCI), 1604 – 1609, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI58124.2022.00287
Petereit, J.; Bretthauer, G.; Beyerer, J.
2022. at - Automatisierungstechnik, 70 (10), 823–825. doi:10.1515/auto-2022-0121
Woock, P.; Petereit, J.; Frey, C.; Beyerer, J.
2022. at - Automatisierungstechnik, 70 (10), 827–837. doi:10.1515/auto-2022-0072
Appenzeller, A.; Terzer, N.; Krempel, E.; Beyerer, J.
2022. The15th International Conference on PErvasive Technologies Related to Assistive Environments, 446–454, Association for Computing Machinery (ACM). doi:10.1145/3529190.3534768
Beyerer, J.; Bretthauer, G.; Hofmann, C.; Lanza, G.
2022. at - Automatisierungstechnik, 70 (6), 501–503. doi:10.1515/auto-2022-0063
Pfrommer, J.; Klein, J.-F.; Wurster, M.; Rapp, S.; Grauberger, P.; Lanza, G.; Albers, A.; Matthiesen, S.; Beyerer, J.
2022. at - Automatisierungstechnik, 70 (6), 534–541. doi:10.1515/auto-2021-0156
Lanza, G.; Asfour, T.; Beyerer, J.; Deml, B.; Fleischer, J.; Heizmann, M.; Furmans, K.; Hofmann, C.; Cebulla, A.; Dreher, C.; Kaiser, J.-P.; Klein, J.-F.; Leven, F.; Mangold, S.; Mitschke, N.; Stricker, N.; Pfrommer, J.; Wu, C.; Wurster, M.; Zaremski, M.
2022. at - Automatisierungstechnik, 70 (6), 504–516. doi:10.1515/auto-2021-0158
Zhou, J.; Beyerer, J.
2022. 2022 IEEE Intelligent Vehicles Symposium (IV): 4–9 June 2022, Aachen, Germany, 997–1004, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV51971.2022.9827262
Wiedemer, T.; Wolf, S.; Schumann, A.; Ma, K.; Beyerer, J.
2022. Proceedings 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW): New Orleans, Louisiana, 19–24 June 2022, 4141–4152, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW56347.2022.00459
Specker, A.; Florin, L.; Cormier, M.; Beyerer, J.
2022. 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), 3198–3208, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW56347.2022.00361
Heizmann, M.; Beyerer, J.
2022. tm - Technisches Messen, 89 (2), 83–84. doi:10.1515/teme-2021-0138
Hagmanns, R.; Emter, T.; Grosse-Besselmann, M.; Beyerer, J.
2022. arxiv. doi:10.48550/arXiv.2211.04067
Kalb, T. M.; Beyerer, J.
2022. doi:10.48550/arXiv.2209.08010
Maier, G.; Reith-Braun, M.; Bauer, A.; Gruna, R.; Pfaff, F.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Beyerer, J.
2022. Forum Bildverarbeitung 2022. Ed.: T. Längle, 115–126, KIT Scientific Publishing
Zander, T.; Ziyan, P.; Birnstill, P.; Beyerer, J.
2022. Forum Bildverarbeitung 2022. Ed.: T. Längle, 49–59, KIT Scientific Publishing
Appenzeller, A.; Leitner, M.; Philipp, P.; Krempel, E.; Beyerer, J.
2022. Applied Sciences, 12 (23), Article no: 12320. doi:10.3390/app122312320
Specker, A.; Beyerer, J.
2022. 30th European Signal Processing Conference (EUSIPCO), 533–537
Golda, T.; Thiemich, J.; Cormier, M.; Beyerer, J.
2022. 29th IEEE International Conference on Image Processing (ICIP), 16th -19th October, Bordeaux, France, 3983–3987, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP46576.2022.9897358
Wolf, S.; Beyerer, J.
2022. CLEF 2022 Working Notes: Proceedings of the Working Notes of CLEF 2022 - Conference and Labs of the Evaluation Forum ; Bologna, Italy, September 5th to 8th, 2022. Ed.: G. Faggioli, 2219–2226, CEUR-WS.org
Wagner, P. G.; Beyerer, J.
2022. Proceedings of the 19th International Conference on Security and Cryptography - SECRYPT. Vol. 1. Ed.: S. De Capitani di Vimercati, 586–591, SciTePress. doi:10.5220/0011289000003283
Borcherding, A.; Takacs, P.; Beyerer, J.
2022. Proceedings of the 8th International Conference on Information Systems Security and Privacy, 334–344, SciTePress. doi:10.5220/0010806300003120
Borcherding, A.; Feldmann, L.; Karch, M.; Meshram, A.; Beyerer, J.
2022. Proceedings of the 8th International Conference on Information Systems Security and Privacy - ICISSP, 314–325, SciTePress. doi:10.5220/0010795900003120
Wu, C.; Zhou, K.; Kaiser, J.-P.; Mitschke, N.; Klein, J.-F.; Pfrommer, J.; Beyerer, J.; Lanza, G.; Heizmann, M.; Furmans, K.
2022. Procedia CIRP, 106, 138–143. doi:10.1016/j.procir.2022.02.168
Wagner, P. G.; Beyerer, J.
2022. Proceedings of the 2022 ACM Workshop on Secure and Trustworthy Cyber-Physical Systems (Sat-CPS’22), 67–76, Association for Computing Machinery (ACM). doi:10.1145/3510547.3517930
Appenzeller, A.; Hornung, M.; Kadow, T.; Krempel, E.; Beyerer, J.
2022. Technologies, 10 (1), Article no: 35. doi:10.3390/technologies10010035
Fraunhofer IOSB; Golda, T.; Cormier, M.; Beyerer, J.
2022. Handbuch Polizeimanagement – Polizeipolitik – Polizeiwissenschaft – Polizeipraxis. Ed.: D. Wehe, 1–21, Springer Fachmedien Wiesbaden. doi:10.1007/978-3-658-34394-1_87-1
Stadler, D.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 133–142, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00019
Cormier, M.; Clepe, A.; Specker, A.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 591–601, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00065
Specker, A.; Moritz, L.; Cormier, M.; Beyerer, J.
2022. Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) Workshops, 570–580, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACVW54805.2022.00063
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2022. Applied Optics, 61 (3), A37-A42. doi:10.1364/AO.442084
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
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2019. 13th International Conference on Critical Information Infrastructures Security, CRITIS 2018; Kaunas; Lithuania; 24 September 2018 through 26 September 2018. Ed.: E. Luiijf, 45–56, Springer. doi:10.1007/978-3-030-05849-4_4
Schumann, A.; Specker, A.; Beyerer, J.
2018. 2018 15th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2018.8639114
Beyerer, J.; Ruf, M.; Herrmann, C.
2018. Autonomous Systems : Sensors, Vehicles, Security and the Internet of Everything, Orlando, FL, April 15-19, 2018. Ed.: M.C. Dudzik, Article No. 1064308, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2304400
Herrmann, C.; Metzler, J.; Willersinn, D.; Beyerer, J.
2018. Medical Imaging 2018 : Image-Guided Procedures, Robotic Interventions, and Modeling, Houston, TX, February 10–15, 2018. Ed.: B. Fei, Article No. 105762O, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2293623
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2018. Technisches Messen, 85 (3), 202–210. doi:10.1515/teme-2017-0063
Philipp, P.; Robert, S.; Beyerer, J.
2018. Proceedings of the 8th IEEE Conference on Cognitive and Computational Aspects of Situation Management (CogSIMA 2018), Boston, MA, June 11-14, 2018. Ed.: O.E. Gundersen, 15–21, IEEE Computer Society. doi:10.1109/COGSIMA.2018.8423989
Philipp, P.; Bommersheim, M.; Robert, S.; Hempel, D.; Beyerer, J.
2018. HIMS ’18 : proceedings of the 2018 International Conference on Health Informatics & Medical Systems : publication of the 2018 World Congress in Computer Science, Computer Engineering, & Applied Computing (CSCE ’18), July 30-August 02, 2018, Las Vegas, Nevada, USA. Ed: H. R. Arabnia, 83–89, CSREA Press
Maier, G.; Pfaff, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2018. 8th Sensor-Based Sorting & Control, SBSC 2018 : Aachen, 6-7 March 2018. Ed.: T. Pretz, 73–82, Shaker Verlag
Acatay, O.; Sommer, L.; Schumann, A.; Beyerer, J.
2018. 15th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2018.8639127
Schumann, A.; Sommer, L.; Vogler, M.; Beyerer, J.
2018. 2018 15th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–6, Institute of Electrical and Electronics Engineers (IEEE)
Sommer, L.; Acatay, O.; Schumann, A.; Beyerer, J.
2018. 15th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–6, Institute of Electrical and Electronics Engineers (IEEE)
Valev, K.; Schumann, A.; Sommer, L.; Beyerer, J.
2018. Pattern Recognition and Tracking XXIX : 18-19 April 2018, Orlando, Florida, United States. Ed.: Mohammad S. Alam, Art.Nr.: 1064902, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2305062
Nie, K.; Sommer, L.; Schumann, A.; Beyerer, J.
2018. 2018 IEEE Winter Conference on Applications of Computer Vision - WACV 2018: 12-15 March 2018, Lake Tahoe, Nevada / general chairs: Gérard Medioni, Anthony Hoogs, Scott McCloskey, 626–634, Institute of Electrical and Electronics Engineers (IEEE)
Sommer, L.; Schumann, A.; Schuchert, T.; Beyerer, J.
2018. 2018 IEEE Winter Conference on Applications of Computer Vision - WACV 2018 : proceedings : 12-15 March 2017, Lake Tahoe, Nevada, 635–642, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2018.00075
Zimmerling, C.; Pfrommer, J.; Liu, J.; Beyerer, J.; Henning, F.; Kärger, L.
2018. 18th European Conference on Composite Materials (ECCM 2018), Athen, GR, June 24-28, 2018
Sommer, L.; Schmidt, N.; Schumann, A.; Beyerer, J.
2018. 2018 IEEE International Conference on Image Processing: Proceedings, 3054–3058, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP.2018.8451189
Birnstill, P.; Krempel, E.; Wagner, P. G.; Beyerer, J.
2018. Technologies, 6 (4), 115/1–14. doi:10.3390/technologies6040115
Birnstill, P.; Beyerer, J.
2018. Proceedings of the 11th PErvasive Technologies Related to Assistive Environments Conference, (PETRA), Corfu, Greece, June 26-29, 2018, 292–296, Association for Computing Machinery (ACM). doi:10.1145/3197768.3201563
Wagner, P. G.; Birnstill, P.; Beyerer, J.
2018. Proceedings of the 23nd ACM on Symposium on Access Control Models and Technologies, SACMAT 2018, Indianapolis, IN, USA, June 13-15, 2018, 85–91, Association for Computing Machinery (ACM). doi:10.1145/3205977.3205990
Krempel, E.; Beyerer, J.
2018. Proceedings of the 11th PErvasive Technologies Related to Assistive Environments Conference, PETRA 2018, Corfu, Greece, June 26-29, 2018, 327–330, Association for Computing Machinery (ACM). doi:10.1145/3197768.3201567
Mohammadikaji, M.; Bergmann, S.; Burke, J.; Beyerer, J.; Dachsbacher, C.
2018. Technisches Messen, 85 (s1), S95-S102. doi:10.1515/teme-2018-0022
Pieper, C.; Pfaff, F.; Maier, G.; Kruggel-Emden, H.; Wirtz, S.; Noack, B.; Gruna, R.; Scherer, V.; Hanebeck, U. D.; Längle, T.; Beyerer, J.
2018. Powder technology, 340, 181–193. doi:10.1016/j.powtec.2018.09.003
Meyer, J.; Melchert, W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2018. Unconventional Optical Imaging 2018; Strasbourg; France; 22 April 2018 through 26 April 2018, Art. Nr.: 106770A, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2307392
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Worn, H.
2018. 2018 Workshop on Metrology for Industry 4.0 and IoT, MetroInd 4.0 and IoT 2018; Brescia; Italy; 16 April 2018 through 18 April 2018, 52–57, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/METROI4.2018.8428313
Hild, J.; Saur, G.; Petersen, P.; Voit, M.; Peinsipp-Byma, E.; Beyerer, J.
2018. 20th International Conference on Human Interface and the Management of Information, HIMI 2018 Held as Part of HCI International 2018; Las Vegas; United States; 15 July 2018 through 20 July 2018, 383–402, Springer. doi:10.1007/978-3-319-92046-7_33
Hild, J.; Klaus, E.; Hammer, J.-H.; Martin, M.; Voit, M.; Peinsipp-Byma, E.; Beyerer, J.
2018. 15th International Conference on Engineering Psychology and Cognitive Ergonomics, EPCE 2018 Held as Part of HCI International 2018; Las Vegas; United States; 15 July 2018 through 20 July 2018. Ed.: D. Harris, 419–428, Springer. doi:10.1007/978-3-319-91122-9_34
Pfrommer, J.; Zimmerling, C.; Liu, J.; Kärger, L.; Henning, F.; Beyerer, J.
2018. 51st CIRP Conference on Manufacturing Systems, CIRP CMS 2018; Stockholm Waterfront Congress CentreStockholm; Sweden; 16 May 2018 through 18 May 2018. Ed.: T. Kjellberg, 426–431, Elsevier. doi:10.1016/j.procir.2018.03.046
Hild, J.; Kühnle, C.; Voit, M.; Beyerer, J.
2018. 10th ACM Symposium on Eye Tracking Research and Applications, ETRA 2018; Warsaw; Poland; 14 June 2018 through 17 June 2018. Ed.: S.N. Spencer, Art.Nr. a58, Association for Computing Machinery (ACM). doi:10.1145/3204493.3204575
Sommer, L.; Steinmann, L.; Schumann, A.; Beyerer, J.
2018. Automatic Target Recognition XXVIII : 16-17 April 2018, Orlando, Florida, United States. Ed.: F. A. Sadjadi, 1064803, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2304768
Manger, D.; Willersinn, D.; Beyerer, J.
2018. 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2018; Funchal, Madeira; Portugal; 27 January 2018 through 29 January 2018. Ed.: J. Braz, 367–372, SciTePress
Tüzko, A.; Herrmann, C.; Manger, D.; Beyerer, J.
2018. 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2018; Funchal, Madeira; Portugal; 27 January 2018 through 29 January 2018. Ed.: J. Braz, 284–292, SciTePress
Meyer, J.; Längle, T.; Beyerer, J.
2018. Proceedings of the Computing Conference 2017, London, UK, 18th - 20th July 2017, 244–248, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SAI.2017.8252110
Günther, M.; Hu, P.; Herrmann, C.; Chan, C. H.; Jiang, M.; Yang, S.; Dhamija, A. R.; Ramanan, D.; Beyerer, J.; Kittler, J.; Jazaery, M. A.; Nouyed, M. I.; Guo, G.; Stankiewicz, C.; Boult, T. E.
2018. Proceedings of the IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, Colorado, 1st - 4th October 2017, 697–706, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/BTAS.2017.8272759
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikajii, M.; Beyerer, J.; Dachsbacher, C.
2018. 38th International Conference on Information Systems Architecture and Technology, ISAT 2017; Szklarska Poreba; Poland; 17 September 2017 through 19 September 2017. Ed.: L. Borzemski, 326–335, Springer. doi:10.1007/978-3-319-67220-5_30
Beyerer, J.; Bretthauer, G.
2017. Automatisierungstechnik, 65 (12), 888–889. doi:10.1515/auto-2017-0114
Patzer, F.; Sarkar, A.; Birnstill, P.; Schleipen, M.; Beyerer, J.
2017. 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Limassol, Cyprus, 12-15 Sept. 2017, 1–8, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETFA.2017.8247571
Teutsch, M.; Krüger, W.; Beyerer, J.
2017. Optical engineering, 56 (8), Art. Nr.: 083102. doi:10.1117/1.OE.56.8.083102
Beyerer, J.; Bonn, G.
2017. Automatisierungstechnik, 65 (7), 524–525. doi:10.1515/auto-2017-0063
Philipp, P.; Bleier, J.; Fischer, Y.; Beyerer, J.
2017. CAOS 2017, 17th Annual Meeting of the International Society for Computer Assisted Orthopaedic Surgery. Papers. Online resource : June 14-17, 2017, Aachen, Germany 2017. Ed.: K. Radermacher, 288–294
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2017. OCM 2017 - Optical Characterization of Materials - conference proceedings. Hrsg.: J. Beyerer; F. Puente León; T. Längle, 109–119, KIT Scientific Publishing. doi:10.5445/IR/1000082558
Pfaff, F.; Kurz, G.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Langle, T.; Beyerer, J.
2017. Proceedings of the International Conference on Multisensor Fusion and Integration for Intelligent Systems, MFI 2017, Daegu, South Korea, 16th - 18th November 2017, 553–558, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2017.8170379
Pieper, C.; Wirtz, S.; Scherer, V.; Maier, G.; Gruna, R.; Langle, T.; Beyerer, J.; Pfaff, F.; Noack, B.; Hanebeck, U. D.; Kruggel-Emden, H.
2017. 5th International Conference on Particle-Based Methods - Fundamentals and Applications, PARTICLES 2017, Hannover, Germany, 26th - 28th September 2017, 373–384, International Centre for Numerical Methods in Engineering (CIMNE)
Coluccia, A.; Ghenescu, M.; Piatrik, T.; Cubber, G. D.; Schumann, A.; Sommer, L.; Klatte, J.; Schuchert, T.; Beyerer, J.; Farhadi, M.; Amandi, R.; Aker, C.; Kalkan, S.; Saqib, M.; Daud, S.; Makkah, K.; Blumenstein, M.
2017. 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078464, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078464
Sommer, L.; Nie, K.; Schumann, A.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078510, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078510
Sommer, L.; Schumann, A.; Müller, T.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078557, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078557
Schumann, A.; Sommer, L.; Klatte, J.; Schuchert, T.; Beyerer, J.
2017. Proceedings of the 14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Lecce, Italy, 29th August - 1st September 2017, Art.Nr. 8078558, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2017.8078558
Bapp, F.; Becker, J.; Beyerer, J.; Doll, J.; Filsinger, M.; Frese, C.; Hubschneider, C.; Lauber, A.; Müller-Quade, J.; Pauli, M.; Roschani, M.; Salscheider, O.; Rosenhahn, B.; Ruf, M.; Stiller, C.; Willersinn, D.; Ziehn, J. R.
2017. TÜV-Tagung Fahrerassistenz, 2017, München, 8 S
Wagner, P. G.; Birnstill, P.; Krempel, E.; Bretthauer, S.; Beyerer, J.
2017. Data Privacy Management, Cryptocurrencies and Blockchain Technology : ESORICS 2017 International Workshops, DPM 2017 and CBT 2017, Oslo, Norway, 14th - 15th September 2017. Ed.: J. Garcia-Alfaro, 183–201, Springer. doi:10.1007/978-3-319-67816-0_11
Irgenfried, S.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2017. Automated Visual Inspection and Machine Vision II - SPIE Optical Metrology, Munich, Germany, 25 - 29 June 2017. Ed.: J. Beyerer, 1033406, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2269166
Sommer, L. W.; Schuchert, T.; Beyerer, J.
2017. Automatic Target Recognition XXVII 2017, Anaheim, United States, 10th - 11th April 2017, Art. Nr. 1020209, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2262083
Luo, D.; Längle, T.; Beyerer, J.
2017. Technisches Messen, 84 (7-8), 452–459. doi:10.1515/teme-2017-0007
Richter, M.; Längle, T.; Beyerer, J.
2017. ICIAR 2017 : Image Analysis and Recognition : Proceedings of the 14th International Conference, Montreal, Canada, 5th - 7th July 2017. Ed.: F. Karray, 341–351, Springer. doi:10.1007/978-3-319-59876-5_38
Hild, J.; Krüger, W.; Brüstle, S.; Trantelle, P.; Unmüßig, G.; Voit, M.; Heinze, N.; Peinsipp-Byma, E.; Beyerer, J.
2017. Geospatial Informatics, Fusion, and Motion Video Analytics VII 2017, Anaheim, United States, 9th April 2017, Art.Nr.: 1019903, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2262477
Philipp, P.; Beyerer, J.; Fischer, Y.
2017. 2017 IEEE Conference on Cognitive and Computational Aspects of Situation Management (CogSIMA), Savannah, Georgia, USA, 27-31 March 2017, Art. Nr. 7929589, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/COGSIMA.2017.7929589
Pfaff, F.; Maier, G.; Aristov, M.; Noack, B.; Gruna, R.; Hanebeck, U. D.; Längle, T.; Beyerer, J.; Pieper, C.; Kruggel-Emden, H.; Wirtz, S.; Scherer, V.
2017. Automatisierungstechnik, 65 (6), 369–380. doi:10.1515/auto-2017-0009
Beyerer, J.; Heizmann, M.; Längle, T.
2017. Automatisierungstechnik, 65 (6), 367–368. doi:10.1515/auto-2017-0049
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.
2017. Automatisierungstechnik, 65 (6), 426–439. doi:10.1515/auto-2017-0044
Krempel, E.; Birnstill, P.; Beyerer, J.
2017. European Journal for Security Research. doi:10.1007/s41125-017-0016-6
Herrmann, C.; Willersinn, D.; Beyerer, J.
2017. Image Analysis : Proceedings of the 20th Scandinavian Conference, SCIA 2017, Part II, Tromso, Norway, 12th - 14th June 2017, 377–388, Springer. doi:10.1007/978-3-319-59129-2_32
Meyer, J.; Längle, T.; Beyerer, J.
2017. Image Analysis : Proceedings of the 20th Scandinavian Conference (SCIA 2017) Part I, Tromso, Norway, 12-14 June 2017. Ed.: P. Sharma, 526–537, Springer. doi:10.1007/978-3-319-59126-1_44
Sommer, L. W.; Schuchert, T.; Beyerer, J.
2017. 17th IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, United States, 24. - 31. March, 2017, 311–319, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.41
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2017. 17th IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, United States, 24. - 31. March, 2017, 1008–1016, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.117
Qu, C.; Herrmann, C.; Monari, E.; Schuchert, T.; Beyerer, J.
2017. WACV : Proceedings of the 2017 IEEE Winter Conference on Applications of Computer Vision, Santa Rosa, USA, 24-31 March 2017, 1105–1114, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2017.128
Richter, M.; Langle, T.; Beyerer, J.
2017. 23rd International Conference on Pattern Recognition, ICPR 2016, Cancun, Mexico, 4th - 8th December 2016, 3079–3084, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICPR.2016.7900107
Retzlaff, M.-G.; Hanika, J.; Beyerer, J.; Dachsbacher, C.
2017. Journal of sensors and sensor systems, 6 (1), 171–184. doi:10.5194/jsss-6-171-2017
Sommer, L. W.; Schuchert, T.; Beyerer, J.
2017. 9th IAPR Workshop on Pattern Recogniton in Remote Sensing, PRRS 2016; Cancun; Mexico; 4 December 2016 through, Art.Nr.: 7867018, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/PRRS.2016.7867018
Luo, D.; Taphanel, M.; Längle, T.; Beyerer, J.
2017. Applied optics, 56 (8), 2359–2367. doi:10.1364/AO.56.002359
Ruf, M.; Ziehn, J. R.; German, L.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.
2017. Proceedings of the 2016 International Conference on Instrumentation, Control and Automation, Bandung, West Java, RI, August 29-31, 2016, 189–196, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICA.2016.7811499
Pieper, C.; Kruggel-Emden, H.; Wirtz, S.; Scherer, V.; Pfaff, F.; Noack, B.; Hanebeck, U. D.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.
2017. 7th International Conference on Discrete Element Methods, DEM7 2016, Dalian, China, 2016, 1 - 4 August, 1105–1113, Springer. doi:10.1007/978-981-10-1926-5_115
Schreiter, L.; Philipp, P.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Beyerer, J.; Wörn, H.
2016. International journal of computer assisted radiology and surgery, 11 (Supplement 1), 115–116
Philipp, P.; Schreiter, L.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Wörn, H.; Beyerer, J.
2016. Proceedings of the 6th Joint Workshop On New Technologies for Computer/Robot Assisted Surgery, CRAS 2016, Pisa, Italy, 12th - 14th September 2016
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.
2016. XXX. Messtechnisches Symposium, Hannover, 15. - 16. September 2016, 141–150, Oldenbourg Verlag. doi:10.1515/9783110494297-019
Beyerer, J.; Geisler, J.
2016. European Journal for Security Research, 1 (2), 135–150. doi:10.1007/s41125-016-0008-y
Beyerer, J.; Puente León, F.; Frese, C.
2016. Springer-Verlag. doi:10.1007/978-3-662-47786-1
Beyerer, J.; Puente León, F.; Frese, C.
2016. Springer-Verlag. doi:10.1007/978-3-662-47794-6
Bauer, S.; Krippner, W.; Luo, D.; Taphanel, M.; Abdo, M.; Badilita, V.; Längle, T.; Beyerer, J.; Korvink, J.; Puente León, F.
2016. XXX. Messtechnisches Symposium, Hannover, 15. – 16. September 2016, Hrsg.: S. Zimmermann, 69–76, Oldenbourg Verlag
Bergmann, S.; Mohammadikaji, M.; Irgenfried, S.; Wörn, H.; Beyerer, J.; Dachsbacher, C.
2016. VMV 2016 : 21th International Symposium on Vision, Modeling and Visualization, Bayreuth, Germany, 10-12 October 2016. Ed.: M. Hullin, 179–186, Eurographics Association. doi:10.2312/vmv.20161357
Wagner, P.; Birnstill, P.; Krempel, E.; Bretthauer, S.; Beyerer, J.
2016. Informatik 2016 - Tagung vom 26.-30. September 2016 in Klagenfurt. Hrsg.: H. C. Mayr, 427–440, Gesellschaft für Informatik (GI)
Birnstill, P.; Bier, C.; Wagner, P.; Beyerer, J.
2016. SAM 2016 : proceedings of the 2016 International Conference on Security & Management : WORLDCOMP ’16, July 25-28, 2016, Las Vegas, Nevada, USA. Ed.: Kevin Daimi, 185–191, CSREA Press
Bier, C.; Beyerer, J.; Kühne, K.
2016. Privacy Technologies and Policy : 4th Annual Privacy Forum, APF 2016, Frankfurt/Main, Germany, September 7-8, 2016 ; Proceedings. Ed.: Stefan, Schiffner, 135–152, Springer. doi:10.1007/978-3-319-44760-5_9
Bier, C.; Beyerer, J.
2016. Security Research Conference - 11th Future Security : Berlin, September 13-14, 2016 : proceedings / Fraunhofer VVS. Ed.: Oliver Ambacher, 293–298, Fraunhofer Verlag
Krempel, E.; Birnstill, P.; Beyerer, J.
2016. Security Research Conference - 11th Future Security : Berlin, September 13 - 14, 2016 : proceedings / Fraunhofer VVS Hrsg.: Oliver Ambacher, Rüdiger Quay, Joachim Wagner, 315–322, Fraunhofer Verlag
Bier, C.; Kömpf, S.; Beyerer, J.
2016. Data protection and privacy : (in)visibilities and infrastructures. Ed.: Ronald Leenes, 271–289, Springer. doi:10.1007/978-3-319-50796-5_10
Krempel, E.; Birnstill, P.; Beyerer, J.
2016. CPDP 2016, 9th International Conference "Computers, Privacy and Data Protection" (CPDP), Brussels, 27-29 January 2016
Putze, F.; Popp, J.; Hild, J.; Beyerer, J.; Schultz, T.
2016. 18th ACM International Conference on Multimodal Interaction, ICMI 2016; Tokyo; Japan; 12 November 2016 through 16 November 2016, 153–160, Association for Computing Machinery (ACM). doi:10.1145/2993148.2993199
Luo, D.; Bauer, S.; Taphanel, M.; Längle, T.; Puente León, F.; Beyerer, J.
2016. Next-Generation Spectroscopic Technologies IX; Baltimore; United States; 18 April 2016 through 19 April 2016, Art. Nr.: 98550P, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2228303
Maier, G.; Pfaff, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Langle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.
2016. 2016 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI), Baden-Baden, Germany, 19–21 September 2016, 505–510, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2016.7849538
Pfaff, F.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Langle, T.; Beyerer, J.
2016. 2016 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI), Baden-Baden, Germany, 19–21 September 2016, 511–516, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2016.7849539
Herrmann, C.; Qu, C.; Beyerer, J.
2016. 4th IEEE International Conference on Signal and Image Processing Applications, ICSIPA 2015; Pullman BangsarKuala Lumpur; Malaysia; 19 October 2015 through 21 October 2015, 89–94, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICSIPA.2015.7412169
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.
2016. Proceedings - 2015 International Conference on Computational Science and Computational Intelligence, CSCI 2015; Las Vegas; United States; 7 December 2015 through 9 December 2015, 732–737, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CSCI.2015.110
Sommer, L. W.; Teutsch, M.; Schuchert, T.; Beyerer, J.
2016. IEEE Winter Conference on Applications of Computer Vision, WACV 2016; Lake Placid; United States; 7 March 2016 through 10 March 2016, Art. Nr.: 7477573, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2016.7477573
Van De Camp, F.; Gill, D.; Hild, J.; Beyerer, J.
2016. 18th International Conference on Posters’ Extended Abstracts, HCI International 2016, Toronto, Canada, 17 - 22 July, 2016, 149–154, Springer. doi:10.1007/978-3-319-40542-1_24
Ziehn, J. R.; Ruf, M.; Willersinn, D.; Rosenhahn, B.; Beyerer, J.; Gotzig, H.
2016. 2016 IEEE 19th International Conference on Intelligent Transportation Systems (ITSC), Windsor Oceanico Hotel, Rio de Janeiro, Brazil, 1. -4. November, 2016, 1410–1417, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ITSC.2016.7795742
Herrmann, C.; Müller, T.; Willersinn, D.; Beyerer, J.
2016. Electro-Optical and Infrared Systems: Technology and Applications XIII. Ed.: D.A. Huckridge, 99870I, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2240940
Sommer, L. W.; Schuchert, T.; Beyerer, J.
2016. Electro-Optical Remote Sensing X, Edingburgh, UK, September 26,2016. Ed.: G. Kamerman, Article: 99880N, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2241527
Herrmann, C.; Willersinn, D.; Beyerer, J.
2016. International Conference on Digital Image Computing: Techniques and Applications (DICTA), November 30 - December 2, 2016, 7797061, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/DICTA.2016.7797061
Meyer, J.; Langle, T.; Beyerer, J.
2016. 2nd International Conference on Frontiers of Signal Processing (ICFSP), Warsaw, PL, October 15-17, 2016, 104–109, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICFSP.2016.7802965
Meyer, J.; Längle, T.; Beyerer, J.
2016. Technisches Messen, 83 (12), 731–738. doi:10.1515/teme-2016-0042
Qu, C.; Luo, D.; Monari, E.; Schuchert, T.; Beyerer, J.
2016. IEEE International Conference on Image Processing (ICIP), Phoenix, AZ, USA, 25–28 September 2016, 2812–2816, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP.2016.7532872
Pfaff, F.; Pieper, C.; Maier, G.; Noack, B.; Kruggel-Emden, H.; Gruna, R.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Längle, T.; Beyerer, J.
2016. Technisches Messen, 83 (2), 77–84. doi:10.1515/teme-2015-0108
Herrmann, C.; Willersinn, D.; Beyerer, J.
2016. 13th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), Colorado Springs, CO, USA, 23–26 August 2016, 221–227, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2016.7738017
Luo, D.; Längle, T.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 185–195, KIT Scientific Publishing
Stephan, T.; Dürrwang, J.; Burke, J.; Werling, S.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, KIT Scientific Publishing
Meyer, J.; Längle, T.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 75–86, KIT Scientific Publishing
Retzlaff, M.-G.; Richter, M.; Thomas Längle; Beyerer, J.; Dachsbacher, C.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 49–61, KIT Scientific Publishing
Anneken, M.; Fischer, Y.; Beyerer, J.
2016. Intelligent Systems and Applications. Extended and Selected Results from the SAI Intelligent Systems Conference (IntelliSys), London, UK, 10-11 November 2015. Ed.: Y. Bi, 89–107, Springer-Verlag. doi:10.1007/978-3-319-33386-1_5
Hammer, J. H.; Voit, M.; Beyerer, J.
2016. 19th International Conference on Information Fusion (FUSION), Heidelberg, Germany, 5-8 July 2016, 1743–1750, Institute of Electrical and Electronics Engineers (IEEE)
Dunau, P.; Beyerer, J.
2016. 19th International Conference on Information Fusion (FUSION), Heidelberg, Germany, 5-8 July 2016, 1735–1742, Institute of Electrical and Electronics Engineers (IEEE)
Hild, J.; Krüger, W.; Heinze, N.; Peinsipp-Byma, E.; Beyerer, J.
2016. Geospatial Informatics, Fusion, and Motion Video Analytics VI, Baltimore, MD, April 19-21, 2016. Ed.: M.F. Pellechia, 98410K/1–9, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2223726
Broadnax, B.; Birnstill, P.; Müller-Quade, J.; Beyerer, J.
2016. Security Research Conference : 11th Future Security, Berlin, September 13-14, 2016. Ed.: O. Ambacher, 323–329, Fraunhofer Verlag
Broadnax, B.; Birnstill, P.; Müller-Quade, J.; Beyerer, J.
2016. 11th Future Security, Berlin, September 13-14, 2016
Pieper, C.; Maier, G.; Pfaff, F.; Kruggel-Emden, H.; Wirtz, S.; Gruna, R.; Noack, B.; Scherer, V.; Längle, T.; Beyerer, J.; Hanebeck, U. D.
2016. Powder technology, 301, 805–814. doi:10.1016/j.powtec.2016.07.018
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Worn, H.
2016. 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016, Taipei; Taiwan, 23 May 2016 through 26 May 2016, Art.Nr.: 7520324, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/I2MTC.2016.7520324
Kuwertz, A.; Beyerer, J.
2016. Journal of applied logic, 19 (2), 102–127. doi:10.1016/j.jal.2016.05.005
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.
2016. Emerging Trends in Applications and Infrastructures for Computational Biology, Bioinformatics, and Systems Biology: Systems and Applications. Ed.: Q.-N. Tran, 371–390, Morgan Kaufmann Publishers. doi:10.1016/B978-0-12-804203-8.00026-2
Hild, J.; Petersen, P.; Beyerer, J.
2016. Ninth Biennial ACM Symposium on Eye Tracking Research & Applications (ETRA ’16), 257–260, Association for Computing Machinery (ACM). doi:10.1145/2857491.2857535
Hild, J.; Kühnle, C.; Beyerer, J.
2016. Ninth Biennial ACM Symposium on Eye Tracking Research & Applications, ETRA 2016; Charleston; United States; 14 - 17 March 2016. Vol. 14, 241–244, Association for Computing Machinery (ACM). doi:10.1145/2857491.2857525
Höfer, S.; Beyerer, J.
2016. tm - Technisches Messen, 83 (6), 374–385. doi:10.1515/teme-2016-0004
Anneken, M.; Fischer, Y.; Beyerer, J.
2016. ICAART 2016 - Proceedings of the 8th International Conference on Agents and Artificial Intelligence, Rome; Italy; 24 February 2016 through 26 February 2016, Vol.2. Ed.: J.Filipe, 250–257, SciTePress. doi:10.5220/0005655302500257
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2015. 2015 12th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS), 1–4, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2015.7301719
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.
2015. HIMS 2015 : proceedings of the 2015 International Conference on Health Informatics and Medical Systems : WORLDCOMP’15, July 27-30, 2015, Las Vegas, Nevada, USA. Ed.: H. R. Arabnia, 3–9, CSREA Press
Richter, M.; Beyerer, J.
2015. OCM 2015 - Optical Characterization of Materials - conference proceedings. Hrsg.: J. Beyerer, F. Puente León, T. Längle, 103–112, KIT Scientific Publishing. doi:10.5445/IR/1000082544
Beyerer, J.; Geisler, J.
2015. Proceedings of the 10th Future Security - Security Research Conference "Future Security", Berlin, 10, 2015, 317–324, Fraunhofer Verlag
Krempel, E.; Beyerer, J.
2015. Security Research Conference: 10th Future Security, Berlin, September 15-17, 2015, proceedings. Hrsg.: Jürgen Beyerer, 65–72, Fraunhofer Verlag
Birnstill, P.; Burkert, C.; Beyerer, J.
2015. Security Research Conference: 10th Future Security, Berlin, September 15-17, 2015, proceedings. Ed.: Jürgen Beyerer, 81–811, Fraunhofer Verlag
Birnstill, P.; Ren, D.; Beyerer, J.
2015. 12th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS 2015) : Karlsruhe, Germany, 25 - 28 August 2015 : [including workshop papers], 1–6, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2015.7301805
Taphanel, M.; Beyerer, J.
2015. Technisches Messen, 82 (2), 94–101. doi:10.1515/teme-2014-0006
Beyerer, J.; Jasperneite, J.; Sauer, O.
2015. Automatisierungstechnik, 63 (10), 751–752. doi:10.1515/auto-2015-0068
Richter, M.; Laengle, T.; Beyerer, J.
2015. Technisches Messen, 82 (12), 663–671. doi:10.1515/teme-2015-0040
Dunau, P.; Fitz, D.; Beyerer, J.
2015. Technisches Messen, 82 (5), 262–272. doi:10.1515/teme-2014-0040
Retzlaff, M.-G.; Stabenow, J.; Beyerer, J.; Dachsbacher, C.
2015. Technisches Messen, 82 (5), 251–261. doi:10.1515/teme-2014-0041
Pfaff, F.; Baum, M.; Noack, B.; Hanebeck, U. D.; Gruna, R.; Längle, T.; Beyerer, J.
2015. Proceedings of the 2015 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI 2015), 14-16 Sept. 2015, San Diego, CA, USA, 7–12, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2015.7295737
Herrmann, C.; Beyerer, J.
2015. Image Processing: Machine Vision Applications VIII; 10 February 2015 through 11 February 2015, San Francisco, California, United States. Ed.: E. Y. Lam, Art.Nr. 940507, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2078988
Kuwertz, A.; Goldbeck, C.; Hug, R.; Beyerer, J.
2015. Proceedings of the UKSIM-AMSS; 17th International Conference on Modelling and Simulation (UKSim2015) 2015, 25 - 27 March 2015, Cambridge, UK. Ed.: D. Al-Dabass, 165–170, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/UKSim.2015.66
Woock, P.; Stephan, T.; Beyerer, J.
2015. at - Automatisierungstechnik, 63 (5), 334–343
Richter, M.; Längle, T.; Beyerer, J.
2015. Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015, 18-22 May 2015, Tokyo, Japan, 210–213, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MVA.2015.7153169
Herrmann, C.; Beyerer, J.
2015. 12th Conference on Computer and Robot Vision (CRV), 2015, 3 June 2015 through 5 June 2015, Halifax, Canada, 192–199, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CRV.2015.32
Taphanel, M.; Zink, R.; Längle, T.; Beyerer, J.
2015. Optical Measurement Systems for Industrial Inspection IX, 22 - 25 June 2015, Munich, Germany. Ed.: P. Lehmann, 95250Y, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2184560
Woock, P.; Beyerer, J.
2015. Proceedings of the 3rd Underwater Acoustics Conference and Exhibition, UACE 2015: 21-26 June 2015, Platanias, Crete, Greece, 717–725
Frühberger, P.; Stephan, T.; Beyerer, J.
2015. 2nd International Multidisciplinary Microscopy and Microanalysis Congress : Proceedings of InterM, October 16-19, 2014. Ed.: E.K. Polychroniadis, 57–64, Springer International Publishing. doi:10.1007/978-3-319-16919-4_8
Pfrommer, J.; Stogl, D.; Aleksandrov, K.; Escaida Navarro, S.; Hein, B.; Beyerer, J.
2015. at - Automatisierungstechnik, 63 (10), 790–800. doi:10.1515/auto-2014-1157
Richter, M.; Längle, T.; Beyerer, J.
2015. tm -Technisches Messen, 82 (3), 135–144. doi:10.1515/teme-2014-0042
Huber, M. F.; Dencker, T.; Roschani, M.; Beyerer, J.
2015. Nonlinear Gaussian Filtering : Theory, Algorithms, and Applications. Ed.: M. Huber, 530–551, Karlsruher Institut für Technologie (KIT)
Bier, C.; Birnstill, P.; Krempel, E.; Vagts, H.; Beyerer, J.
2014. Privacy technologies and policy : revised selected papers - First Annual Privacy Forum (APF), Limassol, Cyprus, October 10 - 11, 2012. Ed.: B. Preneel, 73–85, Springer-Verlag
Ziebarth, M.; Heizmann, M.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 153–165, KIT Scientific Publishing
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 129–140, KIT Scientific Publishing
Richter, M.; Beyerer, J.
2014. Forum Bildverarbeitung 2014. Hrsg.: F. Puente León, 107–118, KIT Scientific Publishing
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.
2014. tm - Technisches Messen, 81 (12), 644–651. doi:10.1515/teme-2014-1055
Kühnert, C.; Beyerer, J.
2014. Machines, 2 (4), 255–274. doi:10.3390/machines2040255
Schleipen, M.; Pfrommer, J.; Stogl, D.; Hein, B.; Aleksandrov, K.; Escaida Navarro, S.; Beyerer, J.
2014. 3rd AutomationML User Conference, Blumberg, October 7-8, 2014
Pfrommer, J.; Schleipen, M.; Usländer, T.; Epple, U.; Heidel, R.; Urbas, L.; Sauer, O.; Beyerer, J.
2014. 13. Fachtagung Entwurf komplexer Automatisierungssysteme (EKA’14), Magdeburg, 14.-15. Mai 2014. Hrsg.: U. Jumar, CD-ROM, Universität Magdeburg
Krempel, E.; Beyerer, J.
2014. Privacy Technologies and Policy - 2nd Annual Privacy Forum (APF’14), Athens, Greece, May 20-21, 2014. Ed.: B. Preneel, 86–100, Springer US. doi:10.1007/978-3-319-06749-0_6
Hild, J.; Gill, D.; Beyerer, J.
2014. 8th ACM Symposium on Eye Tracking Research & Applications (ETRA’14), Safety Harbor, Florida/USA, March 26-28, 2014, 131–134, Association for Computing Machinery (ACM). doi:10.1145/2578153.2578172
Fischer, Y.; Krempel, E.; Birnstill, P.; Unmüßig, G.; Monari, E.; Moßgraber, J.; Schenk, M.; Beyerer, J.
2014. 9th Security Research Conference ’Future Security’, Berlin, September 16-18, 2014. Ed.: K. Thoma, 91–99, Fraunhofer Verlag
Fischer, Y.; Reiswich, A.; Beyerer, J.
2014. IEEE International Inter-Disciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support (CogSIMA’14), San Antonio, Texas/USA, March 3-6, 2014, 209–215, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CogSIMA.2014.6816564
Bauernhansl, T.; Beyerer, J.; Ten Hompel, M.
2014. Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung e.V. - Jahresbericht 2013, 58–69, Fraunhofer Verlag
Herrmann, C.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 181–186, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918665
Kuwertz, A.; Beyerer, J.
2014. IEEE International Interdisciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support (CogSIMA’14), San Antonio, Texas/USA, March 3-6, 2014, 83–89, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CogSIMA.2014.6816545
Richter, M.; Beyerer, J.
2014. IEEE Winter Conference on Applications of Computer Vision (WACV’14), Steamboat Springs, Colorado/USA, March 24-26, 2014, 123–128, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WACV.2014.6836110
Ruf, M.; Ziehn, J. R.; Rosenhahn, B.; Beyerer, J.; Willersinn, D.; Gotzig, H.
2014. 9. Workshop Fahrerassistenzsysteme (FAS’14), Walting im Altmühltal, 26.-28. März 2014, 55–66, Fraunhofer Verlag
Maurus, M.; Hammer, J. H.; Beyerer, J.
2014. Conference on Eye Tracking Research and Applications (ETRA’14), Safety Harbor, Florida/USA, March 26-28, 2014, 295–298, Association for Computing Machinery (ACM). doi:10.1145/2578153.2578204
Teutsch, M.; Mueller, T.; Huber, M.; Beyerer, J.
2014. IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW’14), Columbus, Ohio/USA, June 23-28, 2014, 209–216, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW.2014.40
Ruf, M.; Ziehn, J. R.; Rosenhahn, B.; Beyerer, J.; Willersinn, D.; Grotzig, H.
2014. International Conference on Mechatronics and Control (ICMC’14), Jinzhou, China, July 3-5, 2014
Teutsch, M.; Kruger, W.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 265–270, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918679
Stephan, T.; Richter, M.; Beyerer, J.
2014. 9. Sicherheitsforschungskonferenz ’Future Security’, Berlin, 16.-18. September 2014
Frühberger, P.; Klaus, E.; Beyerer, J.
2014. International Multidisciplinary Microscopy Congress - Proceedings of InterM, Antalya, Turkey, October 1013, 2013. Ed.: E.K. Polychroniadis, 195–200, Springer-Verlag. doi:10.1007/978-3-319-04639-6_27
Chengchao, Q.; Monari, E.; Schuchert, T.; Beyerer, J.
2014. 11th IEEE International Conference on Advanced Video and Signal based Surveillance (AVSS’14), Seoul, Korea, August 26-29, 2014, 113–118, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/AVSS.2014.6918653
Fuchs, S.; Beyerer, J.; Comes, T.
2013. doi:10.5445/DIVA/2013-391
Beyerer, J.; Peinsipp-Byma, E.; Stiefelhagen, R.
2013. at-Automatisierungstechnik, 61 (11), 727–728. doi:10.1524/auto.2013.9011
Fischer, Y.; Beyerer, J.
2013. International Journal on Advances in Systems and Measurement, 8 (3-4), 245–259
Putze, F.; Hild, J.; Kärgel, R.; Herff, C.; Redmann, A.; Beyerer, J.; Schultz, T.
2013. 18th International Conference on Intelligent User Interfaces, Santa Monica, California/USA, March 19-22, 2013, 129–136, Association for Computing Machinery (ACM). doi:10.1145/2449396.2449415
Hild, J.; Müller, E.; Klaus, E.; Peinsipp-Byma, E.; Beyerer, J.
2013. ACHI 2013 - Sixth International Conference on Advances in Computer-Human Interactions, Nice, France, February 24 - March 1, 2013. Ed.: L. Miller, 454–459, IARIA
Kuwertz, A.; Beyerer, J.
2013. IEEE International Multi-Disciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support (CogSIMA’13), San Diego, California/USA, February 25-28, 2013, 102–105, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CogSIMA.2013.6523830
Taphanel, M.; Hovestreydt, B.; Beyerer, J.
2013. Optical Measurement Systems for Industrial Inspection VIII. Ed.: P. H. Lehmann, 8788OS/1–10, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2020387
Höfer, S.; Werling, S.; Beyerer, J.
2013. AMA Conferences 2013 - Nürnberg Exhibition Centre, May 14-16, 2013 - SENSOR, OPTO and IRS², 785–790, AMA. doi:10.5162/sensor2013/P5.4
Hammer, J. H.; Beyerer, J.
2013. Human-Computer Interaction - Interaction Modalities and Techniques - 15th International Conference, HCI International 2013, Las Vegas, Nevada/USA, July 21-26, 2013 - Proceedings, Part IV. Ed.: M. Kurosu, 252–261, Springer-Verlag. doi:10.1007/978-3-642-39330-3_27
Grafmüller, M.; Beyerer, J.
2013. Expert Systems with Applications, 40 (17), 6955–6963. doi:10.1016/j.eswa.2013.06.004
Hammer, J. H.; Maurus, M.; Beyerer, J.
2013. Conference on Eye Tracking (ETSA’13), Cape Town, South Africa, August 29-31, 2013, 75–78, Association for Computing Machinery (ACM). doi:10.1145/2509315.2509333
Pfrommer, J.; Schleipen, M.; Beyerer, J.
2013. IEEE 18th Conference on Emerging Technologies & Factory Automation (ETFA’13), Cagliari, Sardinia, September 10-13, 2013, 1–4, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETFA.2013.6648114
Teutsch, M.; Trantelle, P.; Beyerer, J.
2013. 20th IEEE International Conference on Image Processing (ICIP’13), Melbourne, Australia, September 15-18, 2013, 1120–1124, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP.2013.6738231
Greiner, S.; Birnstill, P.; Krempel, E.; Beckert, B.; Beyerer, J.
2013. 8th Future Security - Security Research Conference, Berlin, September 17-19, 2013 - Proceedings. Ed.: M. Lauster, 296–302, Fraunhofer Verlag
Jarvis, J.; Fuchs, F.; Hugger, S.; Blattmann, V.; Yang, K. Q.; Ostendorf, R.; Bronner, W.; Driad, R.; Aidam, R.; Wagner, J.; Beyerer, J.
2013. 8th Future Security - Security Research Conference, Berlin, September 17-19, 2013 - Proceedings. Ed.: M. Lauster, 205–214, Fraunhofer Verlag
Hild, J.; Fischer, Y.; Peinsipp-Byma, E.; Beyerer, J.
2013. 8th Future Security - Security Research Conference, Berlin, September 17-19, 2013 - Proceedings. Ed.: M. Lauster, 63–72, Fraunhofer Verlag
Pfrommer, J.; Schleipen, M.; Beyerer, J.
2013. Atp-Edition, 2013 (11), 42–49
Beyerer, J.; Puente León, F.
2013. (T. Längle, Hrsg.), KIT Scientific Publishing. doi:10.5445/KSP/1000032143
Belkin, A.; Kuwertz, A.; Fischer, Y.; Beyerer, J.
2012. Innovative Information Systems Modelling Techniques. Ed.: C. Kalloniatis, 137–158, InTech. doi:10.5772/38190
Vagts, H.; Krempel, E.; Beyerer, J.
2012. 7th Security Research Conference, Future Security 2012, Bonn, Germany, September 4 - 6, 2012, 237–248, Springer-Verlag. doi:10.1007/978-3-642-33161-9_36
Bier, C.; Birnstill, P.; Krempel, E.; Vagts, H.; Beyerer, J.
2012. Future Security : 7th Security Research Conference, Bonn, Germany, September 4-6, 2012. Ed.: N. Aschenbruck, 265–268, Springer-Verlag. doi:10.1007/978-3-642-33161-9_39
Taphanel, M.; Beyerer, J.
2012. 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings (I2MTC 2012), 1072–1077, IEEE Computer Society
Huber, M.; Dencker, T.; Roschani, M.; Beyerer, J.
2012. 2012 15th International Conference on Information Fusion (FUSION), 1718–1725, IEEE Computer Society
Puente León, F.; Beyerer, J.
2012. Technisches Messen, 79 (4), 187–188. doi:10.1515/teme-2014-9004
Gruna, R.; Beyerer, J.; Bingham, P. R.; Lam, E. Y.
2012. Image processing: Machine vision applications V : SPIE Electronic Imaging 2012; 25 January 2012, Burlingame, California, USA, 830004, Fraunhofer-Publica
Fischer, Y.; Beyerer, J.
2012. IEEE International Multi-Disciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support (CogSIMA), 2012 : 6 - 8 March 2012, New Orleans, LA, USA, 324–331, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CogSIMA.2012.6188404
Fischer, Y.; Baum, M.; Flohr, F.; Hanebeck, U. D.; Beyerer, J.
2012. Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.: Signal processing, sensor fusion, and target recognition XXI : 23 - 25 April 2012, Baltimore, Maryland, United States Bellingham, WA: SPIE, 2012. Ed.: I. Kadar, 1–11, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.919234
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2012. XXVI. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V. 20.-22. September 2012 in Aachen. Hrsg.: R. Schmitt, Sharker
Höfer, S.; Werling, S.; Beyerer, J.
2012. XXVI. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V. 20.-22. September 2012 in Aachen. Hrsg. R. Schmitt, Shaker Verlag
Fischer, Y.; Beyerer, J.
2012. ICONS 2012 : The Seventh International Conference on Systems, 43–48
Belkin, A.; Beyerer, J.
2012. IEEE International Multi-Disciplinary Conference on Cognitive Methods in Situation Awareness and Decision Support, CogSIMA 2012 : March 6-8, 2012 in New Orleans, LA, USA, 111–116, Institute of Electrical and Electronics Engineers (IEEE)
Taphanel, M.; Gruna, R.; Beyerer, J.
2012. tm - Technisches Messen, 79 (4), 202–209. doi:10.1524/teme.2012.0223
Gruna, R.; Beyerer, J.
2012. IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 360–365, IEEE Computer Society
Fischer, Y.; Beyerer, J.
2012. Proceedings of the 15th International Conference on Information Fusion, 888–895, IEEE Computer Society
Belkin, A.; Beyerer, J.
2012. Intelligent Robotics and Applications 5th International Conference, ICIRA 2012 Montreal, QC, Canada, October 3-5, 2012 Proceedings, Part III. Ed.: C.-Y. Su, 171–180, Springer-Verlag
Beyerer, J.; Puente Leon, F.; Frese, C.
2012. Springer-Verlag
Fischer, Y.; Bauer, A.; Beyerer, J.
2011. Proceedings of the Conference on Cognitive Methods in Situation Awareness and Decision Support, 234–239, IEEE Computer Society
Gruna, R.; Beyerer, J.
2011. Proc. IEEE Instrumentation and Measurement Technology Conference, 192–197, IEEE Computer Society
Frese, C.; Beyerer, J.
2011. Proceedings of IEEE Intelligent Vehicles Symposium, 1154–1160, IEEE Computer Society
Balzer, J.; Höfer, S.; Beyerer, J.
2011. Proceeding CVPR ’11 Proceedings of the 2011 IEEE Conference on Computer Vision and Pattern Recognition, 2537–2544, IEEE Computer Society
Höfer, S.; Roschani, M.; Werling, S.; Beyerer, J.; Puente León, F.; Beyerer, J.
2011. Arbeitskreis der Hochschullehrer für Messtechnik e.V. -AHMT-: XXV. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V. 2011 : 22. - 24. September 2011 in Karlsruhe; Tagungsband, 127–138, Shaker Verlag
Sander, J.; Beyerer, J.; Heiß, H. U.; Pepper, P.; Schlinghoff, H.; Schneider, J.
2011. Informatik 2011 : Informatik schafft Communities; Beiträge der 41. Jahrestagung der Gesellschaft für Informatik e.V. (GI); 4. - 7.10.2011 in Berlin. Hrsg.: H.-U. Heiß, 478–478, Gesellschaft für Informatik (GI)
Heizmann, M.; Puente León, F.; Beyerer, J.
2011. Fertigungsmesstechnik 2020 : Technologie-Roadmap für die Messtechnik in der industriellen Produktion, 85–89, VDI Verlag
Balzer, J.; Werling, S.; Beyerer, J.
2011. tm - Technisches Messen, 78 (1), 43–50. doi:10.1524/teme.2011.0078
Beyerer, J.; Sauer, O.
2011. at - Automatisierungstechnik, 59 (7), 395–396. doi:10.1524/auto.2011.9089
Gheta, I.; Höfer, S.; Heizmann, M.; Beyerer, J.
2011. tm - Technisches Messen, 78 (9), 391–397. doi:10.1524/teme.2011.0152
Werling, S.; Beyerer, J.
2011. tm - Technisches Messen, 78 (9), 398–404. doi:10.1524/teme.2011.0157
Puente León, F.; Beyerer, J.
2011. Information Fusion, 12 (4), 242–243. doi:10.1016/j.inffus.2011.04.001
Frese, C.; Beyerer, J.
2011. ATZ-Elektronik, 6 (5), 70–75
Frese, C.; Beyerer, J.
2011. ATZ-Elektronik, 6 (5), 48–52
Gheta, I.; Heizmann, M.; Beyerer, J.
2011. Image Fusion and Its Applications. Ed.: Y. Zheng, 73–92, InTech. doi:10.5772/17788
Baum, M.; Gheta, I.; Belkin, A.; Beyerer, J.; Hanebeck, U. D.
2010. Proceedings of the 2010 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI 2010), Salt Lake City, Utah, USA, 5-7 Sept. 2010, 187–92, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/MFI.2010.5604454
Gheta, I.; Baum, M.; Belkin, A.; Beyerer, J.; Hanebeck, U. D.
2010. Proceedings of the 2010 IEEE International Conference on Virtual Environments, Human-Computer Interfaces and Measurement Systems (VECIMS 2010), Taranto, Italy, 6-8 Sept. 2010, 12–17, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/VECIMS.2010.5609350
Grinberg, M.; Ohr, F.; Beyerer, J.; Hall, E.
2010. Intelligent Robots and Computer Vision XXVII: Algorithms and Techniques, Proceedings of SPIE, 1–8, IEEE Computer Society
Bader, T.; Beyerer, J.
2010. IUI Workshop on Eye Gaze in Intelligent Human Machine Interaction, 20–27, Association for Computing Machinery (ACM)
Gruna, R.; Beyerer, J.
2010. Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE, 498–503, IEEE Computer Society
Bader, T.; Heck, A.; Beyerer, J.
2010. Proceedings of the Working Conference on Advanced Visual Interfaces, 139–146, Association for Computing Machinery (ACM)
Kühn, B.; Belkin, A.; Swerdlow, A.; Machmer, T.; Beyerer, J.; Kroschel, K.
2010. Proceedings of the 41st International Symposium on Robotics and the 6th German Conference on Robotics, 1296–1303, IEEE Computer Society
Gheta, I.; Heizmann, M.; Belkin, A.; Beyerer, J.
2010. 33rd Annual German Conference on AI, Karlsruhe, Germany, September 21-24, 2010. Proceedings, 176–183, Springer-Verlag
Frese, C.; Beyerer, J.
2010. 33rd Annual German Conference on AI, Karlsruhe, Germany, September 21-24, 2010. Proceedings, 91–98, Springer-Verlag
Sander, J.; Krieger, J.; Beyerer, J.
2010. 33rd Annual German Conference on AI, Karlsruhe, Germany, September 21-24, 2010. Proceedings, 299–308, Springer-Verlag
Balzer, J.; Höfer, S.; Werling, S.; Beyerer, J.
2010. 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings, 41–50, Springer-Verlag
Notheis, S.; Milighetti, G.; Hein, B.; Wörn, H.; Beyerer, J.
2010. Intelligent Robots and Systems (IROS), 2010 IEEE/RSJ International Conference on; 18-22 Oct. 2010, 5258–5263, IEEE Computer Society
Beyerer, J.; Tacke, M.
2010. Strategie & Technik, 52 (2), 70–71
Heizmann, M.; Gheta, I.; Puente León, F.; Beyerer, J.
2010. tm - Technisches Messen, 77 (10), 558–567. doi:10.1524/teme.2010.0098
Beyerer, J.; Werling, S.
2010. Forum Bildverarbeitung. Hrsg.: F. Puente León, 349–364, KIT Scientific Publishing
Gruna, R.; Beyerer, J.
2010. Forum Bildverarbeitung. Hrsg.: F. Puente León, 313–324, KIT Scientific Publishing
Gheta, I.; Höfer, S.; Beyerer, J.; Heizmann, M.
2010. Forum Bildverarbeitung. Hrsg.: F. Puente León, 289–300, KIT Scientific Publishing
Grafmüller, M.; Beyerer, J.
2010. Forum Bildverarbeitung. Hrsg.: F. Puente León, 253–264, KIT Scientific Publishing
Höfer, S.; Beyerer, J.; Werling, S.
2010. Forum Bildverarbeitung. Hrsg.: F. Puente León, 25–34, KIT Scientific Publishing
Gheta, I.; Puente León, F.; Beyerer, J.; Heizmann, M.
2010. Reports on industrial information technology. Vol. 12. Ed.: F. Puente León, 147–166, KIT Scientific Publishing
Beyerer, J.
2010. Mensch-Maschine-Systeme. Wissenschaftliches Kolloquium 5. März 2009, Fraunhofer IITB. Hrgs.: J. Geisler, 58–69, KIT Scientific Publishing
Vagts, H.; Beyerer, J.
2010. Verteilte Messsysteme. Hrsg.: F. Puente León, 207–218, KIT Scientific Publishing
Gheta, I.; Puente León, F.; Beyerer, J.; Heizmann, M.
2010. Verteilte Messsysteme. Hrsg.: F. Puente León, 133–152, KIT Scientific Publishing
Geisler, J.; Beyerer, J.
2010. KIT Scientific Publishing. doi:10.5445/KSP/1000014541
Frese, C.; Batz, T.; Beyerer, J.
2009. Autonome mobile Systeme 2009. 21. Fachgespräch, Karlsruhe, 3./4. Dezember 2009. Hrsg.: R. Dillmann, 193–200, Springer-Verlag
Dillmann, R.; Beyerer, J.
2009. (T. Gindele, Hrsg.), Springer-Verlag. doi:10.1007/978-3-642-10284-4
Werling, S.; Mai, M.; Heizmann, M.; Beyerer, J.
2009. Metrology and Measurement Systems, 16 (3), 415–431
Grinberg, M.; Ohr, F.; Beyerer, J.
2009. Autonome mobile Systeme 2009. 21. Fachgespräch, Karlsruhe, 3./4. Dezember 2009. Hrsg.: R. Dillmann, 9–16, Springer-Verlag
Beyerer, J.; Räpple, R.; Bader, T.
2009. Proceedings / Computer Analysis of Images and Patterns - 13th International Conference (CAIP 2009), September 2 - 4, 2009, Münster, Germany. Ed.: X. Jiang, 689–696, Springer-Verlag
Beyerer, J.; Grinberg, M.; Ohr, F.
2009. ITSC 2009 - 12th International IEEE Conference on Intelligent Transportation Systems, 4 - 7 October 2009, St. Louis, Missouri, USA, 291–298, Institute of Electrical and Electronics Engineers (IEEE)
Beyerer, J.; Geisler, J.; Dahlem, A.; Winzer, P.
2009. Sicherheitsforschung - Chancen und Perspektiven. Hrsg.: P. Winzer, 39–72, Springer-Verlag
Beyerer, J.; Vagts, H.
2009. Fraunhofer Symposium Future Security - 4th Security Research Conference, September 29th - October 1st 2009, Karlsruhe. Ed.: P. Elsner, 94–116, Fraunhofer Verlag
Beyerer, J.; Vagts, H.; Emter, T.; Bauer, A.
2009. Fraunhofer Symposium Future Security - 4th Security Research Conference, September 29th - October 1st 2009, Karlsruhe. Ed.: P. Elsner, 339–345, Fraunhofer Verlag
Beyerer, J.; Vagts, H.; Emter, T.; Bauer, A.
2009. Fraunhofer Symposium Future Security - 4th Security Research Conference, September 29th - October 1st 2009, Karlsruhe. Ed.: P. Elsner, 375–382, Fraunhofer Verlag
Beyerer, J.; Sander, J.; Heizmann, M.; Goussev, I.
2009. Multisensor, Multisource Information Fusion: Architectures, Algorithms, and Applications, 16 - 17 April 2009, Orlando, FL, United States. Ed.: B. V. Dasarathy, 73450N/1–12, Society of Photo-optical Instrumentation Engineers (SPIE)
Beyerer, J.; Sander, J.
2009. Robotics and Autonomous Systems, 57 (3), 259–267
Beyerer, J.; Heizmann, M.; Puente León, F.
2009. QZ Qualität und Zuverlässigkeit, 54 (6), 35–39
Beyerer, J.; Batz, T.; Watson, K.
2009. 2009 IEEE Intelligent Vehicles Symposium IV, 3 - 5 June 2009, Xi’an, China, 907–912, Institute of Electrical and Electronics Engineers (IEEE)
Beyerer, J.; Heizmann, M.
2009. Technology Guide: Principles - Applications - Trends. Ed.: H.-J. Bullinger, 150–155, Springer-Verlag
Beyerer, J.
2009. Sicherheitsgewerbe und Sicherheitstechnik. Hrsg.: R. Stober, 1–10, Carl Heymanns Verlag GmbH
Beyerer, J.; Lellmann, J.; Balzer, J.; Rieder, A.
2008. International Journal of Computer Vision, 80 (2), 226–241
Beyerer, J.; Puente León, F.
2008. Reports on Distributed Measurement Systems. Ed.: F. Puente León, 19–30, Shaker Verlag
Beyerer, J.; Geisler, J.
2008. Fraunhofer Symposium Future Security - 3rd Security Research Conference, 10.- 11.09.2008, Karlsruhe. Ed.: K. Thoma, 155–160, Fraunhofer IRB Verlag
Beyerer, J.; Gheta, I.; Emter, T.
2008. Fraunhofer Symposium Future Security- 3rd Security Research Conference, 10.- 11.09.2008, Karlsruhe. Ed.: K. Thoma, 315–320, Fraunhofer IRB Verlag
Beyerer, J.; Gheta, I.; Heizmann, M.; Mathias, M.
2008. Tagungsband / XXII. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V. , 11.- 13. September 2008, Dresden. Ed.: J. Czarske, 157–168, Shaker Verlag
Beyerer, J.; Gheta, I.; Heizmann, M.
2008. SWIFT 2008 / Proceedings of the 2nd Skövde Workshop on Information Fusion Topics, November 4 - 6, 2008, Skövde, Sweden. Ed.: H. Boström, 9–12, Högskolan i Skövde
Beyerer, J.; Frese, C.; Batz, T.
2008. at - Automatisierungstechnik, 56 (12), 644–652
Beyerer, J.; Heizmann, M.; Gheta, I.
2008. tm - Technisches Messen, 75 (7-8), 445–454
Beyerer, J.; Sander, J.; Heizmann, M.; Gheta, I.
2008. Image Fusion: Algorithms and Applications. Ed.: T. Stathaki, 157–192, Elsevier
Beyerer, J.; Sander, J.
2008. Proceedings / 11th International Conference on Information Fusion, June 30 - July 03, 2008, Cologne, Germany, 1–8, IEEE Operations Center
Beyerer, J.; Heizmann, M.; Gheta, I.
2008. Proceedings / 11th International Conference on Information Fusion, June 30 - July 03, 2008, Cologne, Germany, 1–7, IEEE Operations Center
Beyerer, J.; Puente-León, F.
2008. Reports on distributed measurement systems. Ed.: F. Puente-León, 87–106, Shaker Verlag
Beyerer, J.; Frese, C.; Batz, T.; Wieser, M.
2008. 2008 IEEE Intelligent Vehicles Symposium, 4 - 6 June 2008, Eindhoven, Netherlands, 1125–1130, IEEE Service Center
Beyerer, J.; Heizmann, M.; Gheta, I.; Mathias, M.
2008. Multisensor, multisource information fusion: Architectures, algorithms, and applications 2008, 18 - 20 March 2008, Orlando, FL, USA. Ed.: B. V. Dasarathy, 697406/1–10, Society of Photo-optical Instrumentation Engineers (SPIE)
Rieder, A.; Lellman, J.; Balzer J.; Beyerer, J.
2008. International Journal of Computer Vision, 80 (2), 226–241
Werling, S.; Balzer, J.; Beyerer, J.
2007. Informatik 2007 - Informatik trifft Logistik. Bd.1. Hrsg.: R. Koschke, 44–48, Gesellschaft für Informatik (GI)
Beyerer, J.
2007. Technology Review, (12), 72–73
Beyerer, J.; Heizmann, M.; Frese, C.; Gheta, I.
2007. Informatik 2007 - Informatik trifft Logistik. Bd.1. Hrsg.: R. Koschke, 26–31, Gesellschaft für Informatik (GI)
Beyerer, J.; Frese, C.
2007. Autonome Mobile Systeme 2007 - 20. Fachgespräch, Kaiserslautern, 18./19. Oktober 2007. Hrsg.: K. Berns, 177–183, Springer-Verlag
Beyerer, J.; Heizmann, M.; Gheta, I.
2007. Bildverarbeitung in der Mess- und Automatisierungstechnik. Hrsg.: F. Puente-Léon, 79–90, VDI Verlag
Beyerer, J.; Werling, S.
2007. Bildverarbeitung in der Mess- und Automatisierungstechnik. Hrsg.: F. Puente-Léon, 237–246, VDI Verlag
Beyerer, J.; Balzer, J.; Dibbelt, J.
2007. Bildverarbeitung in der Mess- und Automatisierungstechnik. Hrsg.: F. Puente-Léon, 125–136, VDI Verlag
Beyerer, J.; Sander, J.
2007. Informatik 2007 - Informatik trifft Logistik. 37. Jahrestagung der Gesellschaft für Informatik e.V., 24. bis 27. September 2007, Bremen. Bd. 2. Hrsg.: R. Koschke, 95–99, Ges. für Informatik
Beyerer, J.; Längle, T.
2007. Handbuch zur industriellen Bildverarbeitung. Hrsg.: N. Bauer, 82–84, Fraunhofer IRB Verlag
Beyerer, J.
2007. Vortrag bei der Fachinformationstagung "Forschung und Technologie für Verteidigung und Sicherheit", 22.- 23.10.2007, Bonn, Report Verl
Beyerer, J.; Syrbe, M.
2007. Hütte - Das Ingenieurwissen. Hrsg.: H. Czichos, K80 - K99, Springer-Verlag
Beyerer, J.; Balzer, J.; Werling, S.
2007. tm - Technisches Messen, 74 (11), 545–552
Beyerer, J.; Werling, S.; Balzer, J.
2007. Optical 3-D Measurement Techniques VIII, Vol. 2. Hrsg.: A. Grün, 386–392, ETH Zürich Inst. f. Geodäsie u. Photogrammetrie
Beyerer, J.; Werling, S.
2007. tm - Technisches Messen, 74 (4), 217–223
Beyerer, J.; Sander, J.; Werling, S.
2007. tm - Technisches Messen, 74 (3), 103–111
Beyerer, J.; Frese, C.; Gheta, I.; Krüger, W.; Saur, G.; Heinze, N.; Heizmann, M.
2007. Optical 3-D Measurement Techniques VIII, Vol. 2. Hrsg.: A. Grün, 119–125, ETH Zürich Inst. f. Geodäsie u. Photogrammetrie
Beyerer, J.; Frese, C.; Zimmer, P.
2007. Proceedings of the 2007 IEEE Intelligent Vehicles Symposium IV, June 13 - 15 2007, Istanbul, Turkey, 227–232, IEEE Service Center
Beyerer, J.; Geisler, J.
2007. Strategie und Technik, (2), 10–12
Beyerer, J.
2007. Informationstechnik : Sicherheit - Zukunftstechnologien - Human Factors, Kompendium des Forums, 14.- 15. November 2006, Bad Godesberg; 1 CD-Rom, Koges Verl
Lellmann, J.; Balzer, J.; Rieder, A.; Beyerer, J.
2007. doi:10.5445/IR/1000007856
Beyerer, J.
2006. Fachinformationstagung Forschung und Technologie für die Bundeswehr, 12.- 13.10.2006, Bonn; 1 CD-Rom, Report-Verl
Beyerer, J.; Sander, J.; Werling, S.
2006. Informationsfusion in der Mess- und Sensortechnik. Hrsg.: J. Beyerer, 21–37, Universitätsverlag Karlsruhe
Beyerer, J.; Werling, S.; Balzer, J.
2006. Optics East 2006 - Regularization of the deflectometry problem using shading data, 1.- 4. October 2006, Boston, Massachusetts, USA; 1 CD-Rom, Society of Photo-optical Instrumentation Engineers (SPIE)
Beyerer, J.; Werling, S.
2006. XX. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V., 5. Oktober bis 7. Oktober 2006, Bayreuth. Hrsg.: G. Fischerauer, 105–116, Shaker Verlag
Beyerer, J.; Heizmann, M.
2006. Technologieführer. Grundlagen, Anwendungen, Trends. Hrsg.: H.-J. Bullinger, 156–161, Springer-Verlag
Beyerer, J.; Sander, J.
2006. Proceedings of the International Conference on Multisensor Fusion and Integration for Intelligent Systems, 3 - 6 September 2006, Heidelberg, Germany. Ed.: U. D. Hanebeck, 249–254, IEEE Service Center
Beyerer, J.; Heizmann, M.; Sander, J.
2006. Multisensor, multisource information fusion - architectures, algorithms, and applications, 19 - 20 April 2006, Kissimmee, Florida, USA. Ed.: B. V. Dasarathy, 235–243, Society of Photo-optical Instrumentation Engineers (SPIE)
Beyerer, J.; Puente León, F.; Sommer, K.-D.
2006. Universitätsverlag Karlsruhe. doi:10.5445/KSP/1000004875
Beyerer, J.
2005. Vernetzte Operationsführung am Beispiel des Wirkverbundes Land-Luft-See, GREL als Basis für NetOpFü; 1 CD-Rom, 92, 3–4, Studienges. der DWT
Beyerer, J.
2005. Giesserei - Die Zeitschrift für Technik, Innovation und Management, 92 (12), 54–55
Beyerer, J.; Puente León, F.
2005. tm - Technisches Messen, 72 (12), 663–670
Beyerer, J.; Puente León, F.
2005. at - Automatisierungstechnik, 53 (10), 493–502
Beyerer, J.; Grosche, J.
2005. Informatik 2005 - Informatik live! Beiträge der 35. Jahrestagung der Gesellschaft für Informatik e.V. (GI), 19.- 22. September 2005 in Bonn. Bd. 1. Hrsg.: A. B. Cremers, 464–465, Ges. für Informatik
Beyerer, J.
2005. 28. Heidelberger Bildverarbeitungsforum "Automatische visuelle Inspektion komplizierter Oberflächen", 12. Juli 2005, Weinheim; 1 CD-Rom, AEON Verl
Beyerer, J.
2005. InnoVisions - Das Zukunftsmagazin des Fraunhofer-IuK-Verbunds, (3), 3–4
Beyerer, J.; Heizmann, M.
2005. Image Processing - Algorithms and Systems IV, 17.- 18. January 2005, San Jose, CA, USA . Ed.: E. R. Dougherty, 23–33, Society of Photo-optical Instrumentation Engineers (SPIE)
Beyerer, J.; Herzog, R.; Geisler, J.
2004. Proceedings Modeling and Simulation, Koblenz, 07./08.10.2004, *, Koblenz
Beyerer, J.; Stein, D. vom; Bierweiler, T.; Klawitter, T.
2003. Casting Plant and Technology International, (4)
Beyerer, J.; Stein, D. vom
2003. Foundry trade journal international, 177 (3610), 12–14
Beyerer, J.; Bierweiler, T.; Stein, D. vom; Klawitter, T.
2003. Giesserei, 90 (7), 26–31
Beyerer, J.
2003. Tagungsband / WFO technical forum "Information technology for foundries", 16 - 17 June 2003, Düsseldorf, Germany; 1 CD-Rom, 6.2, Düsseldorf
Beyerer, J.; Stein, D. vom; Klawitter, T.
2003. Giesserei Erfahrungsaustausch, 47 (7), 283–286
Beyerer, J.; Stein, D. vom; Klawitter, T.
2003. Cast metal times, 5 (4), 58–60
Beyerer, J.; Stein, D. vom
2003. Hommes et Fonderie, (333), 30–34
Beyerer, J.; Puente Leon, F.
2002. at - Automatisierungstechnik, 50 (10), 472–480
Beyerer, J.; Krahe, D.; Puente Leon, F.
2001. Metrology and properties of engineering surfaces. Ed.: E. Mainsah, 243–281, Kluwer Academic Publishers
Beyerer, J.
1999. VDI Verlag
Puente Leon, F.; Beyerer, J.
1999. Intelligent robots and computer vision XVIII - algorithms, techniques, and active vision. Ed.: D. P. Casasent, 266–277, Society of Photo-optical Instrumentation Engineers (SPIE)
Krahe, D.; Beyerer, J.
1999. Proceedings / WTA ’98, Workshop on Texture Analysis 1998. Ed.: H. Burkhardt, 93–107, Albert-Ludwigs-Universität Freiburg
Beyerer, J.; Mesch, F.
1999. Proceedings and program / International Workshop on Advances of Measurement Science, June 20 - 21, 1999, 209–227, Ritsumeikan Univ
Beyerer, J.
1999. Measurement, 25 (1), 1–7
Krahe, D.; Beyerer, J.
1998. Sensoren und Meßtechnik - Vorträge der ITG-Fachtagung, 9. bis 11. März 1998, 639–645, VDE Verlag
Beyerer, J.; Puente Leon, F.
1998. Optical Engineering, 37 (10), 2733–2741
Puente Leon, F.; Beyerer, J.
1997. BKA-Symposium der AG Schußwaffen/Ballistik, 26.-27. Mai 1997, Wennigsen, Germany, Wenningsen
Krahe, D.; Beyerer, J.
1997. Architectures, networks, and intelligent systems for manufacturing integration, 15-16 October 1997. Ed.: B. Gopalakrishnan, 192–201, Society of Photo-optical Instrumentation Engineers (SPIE)
Beyerer, J.; Traechtler, A.
1997. tm - Technisches Messen, 64 (10), 401–407
Beyerer, J.; Puente Leon, F.
1997. at - Automatisierungstechnik, 45 (10), 480–489
Beyerer, J.; Puente Leon, F.
1997. International Journal of Machine Tools and Manufacture, 37 (3), 371–389
Beyerer, J.; Krahe, D.
1997. Proceedings of the 7th International Conference on Metrology and Properties of Engineering Surfaces, 2nd - 4th April 1997. Bd. 2. Ed.: B.-G. Rosén, 396–403, Univ. of Technology
Beyerer, J.
1997. New measurements - challenges and visions; XIV IMEKO World Congress, 1 - 6 June 1997; 1 CD-Rom, 95–100, MEKO
Perard, D.; Beyerer, J.
1997. tm - Technisches Messen, 64 (10), 394–400
Perard, D.; Beyerer, J.
1997. Three-dimensional imaging and laser-based systems for metrology and inspection III, 14-15 October 1997. Ed.: K. G. Harding, 74–80, Society of Photo-optical Instrumentation Engineers (SPIE)
Puente Leon, F.; Beyerer, J.
1997. Intelligent robots and computer vision XVI, 15 - 17 October 1997. Ed.: D. P. Casasent, 394–405, Society of Photo-optical Instrumentation Engineers (SPIE)
Beyerer, J.; Puente Leon, F.
1997. IPK-Workshop und Ausstellung "Bildauswertung für Handel, Banken und Behörden", 19. und 20. Februar 1997, Berlin
Beyerer, J.; Puente Leon, F.
1997. Optical Engineering, 36 (1), 85–93
Beyerer, J.
1996. European Symposium on Laser, Optics and Vision for Productivity in Manufacturing II, 10.-14. Juni 1996, Besancon, France, Besancon
Beyerer, J.
1996. Measurement, 18 (4), 225–235
Beyerer, J.
1996. tm - Technisches Messen, 63 (5), 182–190
Beyerer, J.; Puente Leon, F.
1995. BKA-Symposium der AG Schußwaffen/ Ballistik, 18. - 20. September, 1995, Ludwigshafen, Ludwigsburg
Beyerer, J.; Greiner, T.
1995. Meßsignalverarbeitung und Diagnose - Mittel zur Prozeß- und Qualitätssicherung. Hrsg.: R. Bachmann, 165–174, GMA
Beyerer, J.
1995. Honen in Forschung und industrieller Anwendung. Leitung: E. Westkämper, 9/1–17, Vulkan-Verlag
Beyerer, J.
1995. Measurement, 15 (3), 189–199
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1993. tm - Technisches Messen, 60 (11), 419–424
Beyerer, J.
1993. Proceedings of IMEKO Colloquium TC1 & TC7 - State and advances in measurement and instrumentation education. Ed.: L. Finkelstein, 360–369, City Univ
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1992. Tech. Messen 59 (1992) S. 389-397
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1991. In: 36. Internationales Wissenschaftliches Kolloquium, Ilmenau 1991. Tagungsband. S. 433-438