Dr.-Ing. Masoud Roschani
- Wissenschaftlicher Mitarbeiter
- Phone: +49 721 608-45914
- Fax: +49 721 608-45926
- masoud roschani ∂does-not-exist.kit edu
Lebenslauf
Dipl.-Inform. Masoud Roschani studierte von 2005 bis 2007 Informatik (Grundstudium) an der Universität Koblenz-Landau und von 2007 bis 2010 Informatik (Hauptstudium) an der Universität Karlsruhe (TH). Seine Diplomarbeit zum Thema "Systemidentifikation durch Schätzung bedingter Dichten" fertigte er am Lehrstuhl für Intelligente Sensor-Aktor-Systeme an.
Herr Roschani beschäftigt sich mit der Nutzung von Methoden des maschinellen Lernens und der stochastischen Planung für die Lösung schwieriger Aufgaben der variablen Bildgewinnung und -verarbeitung, insbesondere der deflektometrischen Oberflächeninspektion. Er arbeitet u. a. in der Projektgruppe VBV mit.
Veröffentlichungen
2024
Synset Boulevard: A Synthetic Image Dataset for VMMR *
Sielemann, A.; Wolf, S.; Roschani, M.; Ziehn, J.; Beyerer, J.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), Yokohama, 13th-17th May 2024, 9146 – 9153, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10610650
Sielemann, A.; Wolf, S.; Roschani, M.; Ziehn, J.; Beyerer, J.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), Yokohama, 13th-17th May 2024, 9146 – 9153, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10610650
2023
Deflectometry for specular surfaces: an overview
Burke, J.; Pak, A.; Höfer, S.; Ziebarth, M.; Roschani, M.; Beyerer, J.
2023. Advanced Optical Technologies, 12. doi:10.3389/aot.2023.1237687
Burke, J.; Pak, A.; Höfer, S.; Ziebarth, M.; Roschani, M.; Beyerer, J.
2023. Advanced Optical Technologies, 12. doi:10.3389/aot.2023.1237687
Cooperative automated driving for bottleneck scenarios in mixed traffic
Ziehn, J. R.; Baumann, M. V.; Beyerer, J.; Buck, H. S.; Deml, B.; Ehrhardt, S.; Frese, C.; Kleiser, D.; Lauer, M.; Roschani, M.; Ruf, M.; Stiller, C.; Vortisch, P.
2023. 35th IEEE Intelligent Vehicles Symposium (IV 2023), Anchorage, AK, USA, June 4-7, 2023
Ziehn, J. R.; Baumann, M. V.; Beyerer, J.; Buck, H. S.; Deml, B.; Ehrhardt, S.; Frese, C.; Kleiser, D.; Lauer, M.; Roschani, M.; Ruf, M.; Stiller, C.; Vortisch, P.
2023. 35th IEEE Intelligent Vehicles Symposium (IV 2023), Anchorage, AK, USA, June 4-7, 2023
2021
Simulation-based traffic assessment of a connected automated driving function
Baumann, M. V.; Buck, H. S.; Ehrhardt, S.; Roschani, M.; Vortisch, P.
2021. ETC conference papers 2021 : online, Association for European Transport
Baumann, M. V.; Buck, H. S.; Ehrhardt, S.; Roschani, M.; Vortisch, P.
2021. ETC conference papers 2021 : online, Association for European Transport
2020
Imaging vehicle-to-vehicle communication using visible light
Ziehn, J. R.; Roschani, M.; Ruf, M.; Bruestle, D.; Beyerer, J.; Helmer, M.
2020. Advanced Optical Technologies, 9 (6), 339–348. doi:10.1515/aot-2020-0038
Ziehn, J. R.; Roschani, M.; Ruf, M.; Bruestle, D.; Beyerer, J.; Helmer, M.
2020. Advanced Optical Technologies, 9 (6), 339–348. doi:10.1515/aot-2020-0038
2019
Probabilistische Planungsverfahren für die deflektometrische Oberflächeninspektion. PhD dissertation
Roschani, M.
2019. KIT Scientific Publishing. doi:10.5445/KSP/1000091802
Roschani, M.
2019. KIT Scientific Publishing. doi:10.5445/KSP/1000091802
2015
Paper O. Bayesian Active Object Recognition via Gaussian Process Regression. Edited version of the paper: M. F. Huber, T. Dencker, M. Roschani, and J. Beyerer. Bayesian Active Object Recognition via Gaussian Process Regression. In Proceedings of the 15th International Conference on Information Fusion (Fusion), pages 1718-1725, Singapore, July 2012
Huber, M. F.; Dencker, T.; Roschani, M.; Beyerer, J.
2015. Nonlinear Gaussian Filtering : Theory, Algorithms, and Applications. Ed.: M. Huber, 530–551, Karlsruher Institut für Technologie (KIT)
Huber, M. F.; Dencker, T.; Roschani, M.; Beyerer, J.
2015. Nonlinear Gaussian Filtering : Theory, Algorithms, and Applications. Ed.: M. Huber, 530–551, Karlsruher Institut für Technologie (KIT)
2014
Optimizing Deflectometric Measurements for Visibility. Technical Report IES-2012-09
Roschani, M.
2014. Proceedings of the 2013 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 101–111, KIT Scientific Publishing
Roschani, M.
2014. Proceedings of the 2013 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 101–111, KIT Scientific Publishing
2013
Probabilistic Greedy Planning of Deflectometric Measurements. Technical Report IES-2012-04
Roschani, M.
2013. Proceedings of the 2012 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 39–50, KIT Scientific Publishing
Roschani, M.
2013. Proceedings of the 2012 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 39–50, KIT Scientific Publishing
2012
Effziente probabilistische B-Spline-Oberflächenrekonstruktion durch Verwendung eines Informationslters
Negara, C.; Roschani, M.
2012. Forum Bildverarbeitung 2012. Hrsg. F. Puente León, 131–142, KIT Scientific Publishing
Negara, C.; Roschani, M.
2012. Forum Bildverarbeitung 2012. Hrsg. F. Puente León, 131–142, KIT Scientific Publishing
Towards Automated Planning of Deflectometric Inspection. Technical Report IES-2011-14
Roschani, M.
2012. Proceedings of the 2011 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 195–213, KIT Scientific Publishing
Roschani, M.
2012. Proceedings of the 2011 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 195–213, KIT Scientific Publishing
2011
Incorporating Prior Knowledge into Nonparametric Conditional Density Estimation
Krauthausen, P.; Roschani, M.; Hanebeck, U. D.
2011. Proceedings of the 2011 American Control Conference (ACC 2011), San Francisco, California, USA, June 29 2011-July 1 2011, 2450–2455, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/acc.2011.5991394
Krauthausen, P.; Roschani, M.; Hanebeck, U. D.
2011. Proceedings of the 2011 American Control Conference (ACC 2011), San Francisco, California, USA, June 29 2011-July 1 2011, 2450–2455, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/acc.2011.5991394