Mitarbeiter IES

Dr.-Ing. Johannes Meyer

Lebenslauf

Johannes Meyer completed his Master studies in computer science at the Karlsruhe Institute of Technology (KIT) in 2014. In 2018 he obtained the doctorate degree in engineering for his work Light Field Methods for the Visual Inspection of Transparent Objects, for which he has also been awarded the Young Professional Award 2019 by the European Machine Vision Association.

From 2019 until 2021 Johannes has been working as Lead Engineer for Computer Vision at the Bosch company ITK Engineering GmbH and has held several lectures in theoretical computer science at Baden-Württemberg Cooperative State University.

Since 2021 Johannes is head of the research group Variable Image Acquisition and Processing (VBV) at the Fraunhofer-Institute of Optronics, System Technologies and Image Exploitation IOSB.

He is especially interested in topics related to computational imaging like plenoptic imaging and compressed sensing.

Veröffentlichungen


2019
Light Field Methods for the Visual Inspection of Transparent Objects. PhD dissertation
Meyer, J.
2019. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000089292
2018
SNR-optimized image fusion for transparent object inspection
Meyer, J.; Melchert, W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2018. Unconventional Optical Imaging 2018; Strasbourg; France; 22 April 2018 through 26 April 2018, Art. Nr.: 106770A, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2307392
Towards light transport matrix processing for transparent object inspection
Meyer, J.; Längle, T.; Beyerer, J.
2018. Proceedings of the Computing Conference 2017, London, UK, 18th - 20th July 2017, 244–248, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SAI.2017.8252110
2017
Next on Stage : ‘MC ViSi’ - a Machine Vision Simulation Framework : An Introduction : Technical Report IES-2016-06
Meyer, J.
2017. Proceedings of the 2016 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision an Fusion Laboratory. Ed.: J. Beyerer, 71–83, KIT Scientific Publishing
General Cramér-von Mises, a Helpful Ally for Transparent Object Inspection Using Deflection Maps?
Meyer, J.; Längle, T.; Beyerer, J.
2017. Image Analysis : Proceedings of the 20th Scandinavian Conference (SCIA 2017) Part I, Tromso, Norway, 12-14 June 2017. Ed.: P. Sharma, 526–537, Springer. doi:10.1007/978-3-319-59126-1_44
2016
Acquiring and processing light deflection maps for transparent object inspection
Meyer, J.; Langle, T.; Beyerer, J.
2016. 2nd International Conference on Frontiers of Signal Processing (ICFSP), Warsaw, PL, October 15-17, 2016, 104–109, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICFSP.2016.7802965
About acquiring and processing light transport matrices for transparent object inspection
Meyer, J.; Längle, T.; Beyerer, J.
2016. Technisches Messen, 83 (12), 731–738. doi:10.1515/teme-2016-0042
Overview on Machine Vision Methods for Finding Defects in Transparent Objects : Technical Report IES-2015-08
Meyer, J.
2016. Proceedings of the 2015 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 103–112, KIT Scientific Publishing
2015
Visual Inspection of Transparent Objects Physical Basics, Existing Methods and Novel Ideas. Technical Report IES-2014-04
Meyer, J.
2015. Proceedings of the 2014 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 37–47, KIT Scientific Publishing
Utilization of spectral Signatures for daily use. Overview about the State of Affairs. Special Issue, OCM 2015, March 18th/19th, 2015 Karlsruhe, Germany
Schulte, H.; Brink, G.; Gruna, R.; Grüger, H.; Kopf, M.; Meyer, J.; Raidt, E.; Schaudel, S.; Thißen, E.; Walocha, J.
2015. Karlsruher Institut für Technologie (KIT)