M.Sc. Maximilian Becker
- Wissenschaftlicher Mitarbeiter
- maximilian becker ∂does-not-exist.kit edu
Karlsruher Institut für Technologie – KIT
Institut für Anthropomatik und Robotik (IAR)
Lehrstuhl für Interaktive Echtzeitsysteme (IES)
Prof. Dr.- Ing. Jürgen Beyerer
Vincenz-Prießnitz-Straße 3
76131 Karlsruhe
Lebenslauf
Maximilian Becker studierte von 2013 bis 2020 Informatik am Karlsruher Institut für Technologie (KIT). In seiner Masterarbeit beschäftigte er sich mit dem Thema der Erklärbarkeit von KI Systemen. Seit 2021 ist er als Doktorand am Lehrstuhl für Interaktive Echtzeitsysteme (IES) angestellt. Dort untersucht er in Zusammenarbeit mit dem Fraunhofer Institut für Optronik, Systemtechnik und Bildauswertung (IOSB) die Erklärbarkeit und Vertrauenswürdigkeit von KI Systemen unter Privacy-Gesichtspunkten.
Veröffentlichungen
2024
RIXA - Explaining Artificial Intelligence in Natural Language
Becker, M.; Vishwesh, V.; Birnstill, P.; Schwall, F.; Wu, S.; Beyerer, J.
2024. 2023 IEEE International Conference on Data Mining Workshops (ICDMW), Shanghai, 1st-4th December 2023, 875–884, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00118
Becker, M.; Vishwesh, V.; Birnstill, P.; Schwall, F.; Wu, S.; Beyerer, J.
2024. 2023 IEEE International Conference on Data Mining Workshops (ICDMW), Shanghai, 1st-4th December 2023, 875–884, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00118
2023
Explainable Artificial Intelligence for Interpretable Data Minimization
Becker, M.; Toprak, E.; Beyerer, J.
2023. 23rd IEEE International Conference on Data Mining Workshops : 1-4 December 2023, Shanghai, China : proceedings. Ed.: J. Wang, 885–893, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00119
Becker, M.; Toprak, E.; Beyerer, J.
2023. 23rd IEEE International Conference on Data Mining Workshops : 1-4 December 2023, Shanghai, China : proceedings. Ed.: J. Wang, 885–893, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICDMW60847.2023.00119
Counterfactual Root Cause Analysis via Anomaly Detection and Causal Graphs
Rehak, J.; Sommer, A.; Becker, M.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), Lemgo, Germany, 17-20 July 2023, 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/INDIN51400.2023.10218245
Rehak, J.; Sommer, A.; Becker, M.; Pfrommer, J.; Beyerer, J.
2023. 2023 IEEE 21st International Conference on Industrial Informatics (INDIN), Lemgo, Germany, 17-20 July 2023, 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/INDIN51400.2023.10218245
RIXA - Explaining Artificial Intelligence in Natural Language
Becker, M.; Schwall, F.; Vishwesh, V.; Wu, S.; Birnstill, P.; Beyerer, J.
2023. doi:10.5445/IR/1000167428
Becker, M.; Schwall, F.; Vishwesh, V.; Wu, S.; Birnstill, P.; Beyerer, J.
2023. doi:10.5445/IR/1000167428
Explainable Artificial Intelligence for Interpretable Data Minimization
Becker, M.; Toprak, E.; Beyerer, J.
2023. doi:10.5445/IR/1000167427
Becker, M.; Toprak, E.; Beyerer, J.
2023. doi:10.5445/IR/1000167427
Personalized Explanations
Becker, M.
2023. Proceedings of the 2022 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 1–10, KIT Scientific Publishing
Becker, M.
2023. Proceedings of the 2022 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 1–10, KIT Scientific Publishing
2022
Trustworthy Artificial Intelligence
Becker, M.
2022. Proceedings of the 2021 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, 21–32, Karlsruher Institut für Technologie (KIT)
Becker, M.
2022. Proceedings of the 2021 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, 21–32, Karlsruher Institut für Technologie (KIT)
2021
A Step Towards Global Counterfactual Explanations: Approximating the Feature Space Through Hierarchical Division and Graph Search
Becker, M.; Burkart, N.; Birnstill, P.; Beyerer, J.
2021. Advances in Artificial Intelligence and Machine Learning, 1 (2), 90–110. doi:10.54364/aaiml.2021.1107
Becker, M.; Burkart, N.; Birnstill, P.; Beyerer, J.
2021. Advances in Artificial Intelligence and Machine Learning, 1 (2), 90–110. doi:10.54364/aaiml.2021.1107
Secure and privacy-respecting documentation for interactive manufacturing and quality assurance
Wagner, P. G.; Lengenfelder, C.; Holzbach, G.; Becker, M.; Birnstill, P.; Voit, M.; Bejhad, A.; Samorei, T.; Beyerer, J.
2021. Applied Sciences (Switzerland), 11 (16), Art.-Nr.: 7339. doi:10.3390/app11167339
Wagner, P. G.; Lengenfelder, C.; Holzbach, G.; Becker, M.; Birnstill, P.; Voit, M.; Bejhad, A.; Samorei, T.; Beyerer, J.
2021. Applied Sciences (Switzerland), 11 (16), Art.-Nr.: 7339. doi:10.3390/app11167339